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    • 4. 发明申请
    • ELECTRONIC DEVICE AND PROCESS FOR MANUFACTURING ELECTRONIC DEVICE
    • 电子设备和制造电子设备的方法
    • US20100096717A1
    • 2010-04-22
    • US12580388
    • 2009-10-16
    • Kenji UCHIDAKoki HIRASAWA
    • Kenji UCHIDAKoki HIRASAWA
    • H01L23/02
    • H01L27/14618H01L23/3135H01L24/97H01L27/14683H01L2224/48091H01L2224/48247H01L2224/97H01L2924/1815H01L2924/00014H01L2224/85
    • To reduce cracks in a functional unit of a semiconductor element in a process for manufacturing an electronic device, a frame member surrounds a functional unit and an optically-transparent layer is formed on a wafer. A resin layer is formed by injecting resin into a cavity of an encapsulating metallic mold while a molding surface of the encapsulating metallic mold segment contacts an upper surface of the frame member. After forming the resin layer, an optically-transparent layer is formed inside the frame member. The resin layer is formed by injecting resin while the frame member contacts the molding surface of the encapsulating metallic mold segment. Therefore, pressure applied in the encapsulation is exerted over the frame member around the functional unit. Further, the optically-transparent layer is formed after encapsulation. This avoids pressure applied to the functional unit from the contact of the encapsulating metallic mold segment with the optically-transparent layer.
    • 为了减少制造电子器件的工艺中的半导体元件的功能单元中的裂纹,框架构件围绕功能单元,并且在晶片上形成光透明层。 通过将树脂注入到密封金属模具的空腔中,同时密封金属模具段的模制表面接触框架构件的上表面而形成树脂层。 在形成树脂层之后,在框架构件内部形成光透明层。 树脂层通过注射树脂而形成,同时框架构件接触密封金属模具段的模制表面。 因此,封装中施加的压力施加在功能单元周围的框架构件上。 此外,光学透明层在封装之后形成。 这避免了从封装的金属模具段与光学透明层的接触施加到功能单元的压力。
    • 9. 发明申请
    • SYSTEM CONTROLLER, SEMICONDUCTOR DEVICE, AND METHOD OF TESTING INTERFACE
    • 系统控制器,半导体器件和测试接口的方法
    • US20090285214A1
    • 2009-11-19
    • US12367060
    • 2009-02-06
    • Kenji UCHIDA
    • Kenji UCHIDA
    • H04L12/56
    • G06F21/85
    • A semiconductor device capable of connecting plurality of external devices. When an interface with a first external device that can be connected to the semiconductor device is tested, a packet to be transferred from the first external device to another second external device is artificially generated. The generated packet is transferred to the second external device, and a response is monitored. Thus, the interface for connection to the first external device is tested while avoiding an actual packet transfer between the semiconductor device and the first external device.
    • 一种能够连接多个外部设备的半导体器件。 当测试可以连接到半导体器件的具有第一外部设备的接口时,将从第一外部设备传送到另一第二外部设备的分组被人为地生成。 生成的数据包被传送到第二个外部设备,并且监视响应。 因此,用于连接到第一外部设备的接口被测试,同时避免半导体器件和第一外部设备之间的实际分组传送。