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    • 9. 发明授权
    • Method for inspecting optical information recording medium, inspection apparatus, optical information recording medium and recording method
    • 检查光信息记录介质的方法,检查装置,光信息记录介质和记录方法
    • US08335143B2
    • 2012-12-18
    • US13204384
    • 2011-08-05
    • Atsushi NakamuraKenji FujiuneYasumori Hino
    • Atsushi NakamuraKenji FujiuneYasumori Hino
    • G11B7/00
    • G11B20/10009G11B20/10046G11B20/1816G11B2220/218G11B2220/2541
    • A method for inspecting an optical information storage medium includes the steps of: irradiating the storage medium with a laser beam and rotating the medium by a constant linear velocity control technique by reference to the radial location at which the laser beam forms a spot on the medium; changing the rotational velocities according to the radial location on the medium between at least two linear velocities that include a first linear velocity Lv1 and a second linear velocity Lv2 higher than the first linear velocity Lv1; generating a focus error signal and/or a tracking error signal based on the light reflected from the medium; performing a focus control and/or a tracking control on the laser beam that irradiates the medium based on the focus and/or tracking error signal(s); and passing the branched outputs of control loops for the focus and/or tracking error signal(s) through predetermined types of frequency band-elimination filters for the focus and/or tracking error signal(s) to obtain residual errors of the focus and/or tracking error signal(s) and comparing the residual errors to predetermined reference values.
    • 一种用于检查光学信息存储介质的方法包括以下步骤:通过参考激光束在介质上形成点的径向位置,通过恒定的线速度控制技术照射存储介质和激光介质 ; 根据包括第一线速度Lv1和高于第一线速度Lv1的第二线速度Lv2的至少两个线性速度,根据介质上的径向位置改变旋转速度; 基于从介质反射的光产生聚焦误差信号和/或跟踪误差信号; 对基于焦点和/或跟踪误差信号照射介质的激光束进行聚焦控制和/或跟踪控制; 以及通过用于焦点和/或跟踪误差信号的预定类型的频带滤波器使用于聚焦和/或跟踪误差信号的控制回路的分支输出通过,以获得焦点和/ 或跟踪误差信号,并将剩余误差与预定参考值进行比较。
    • 10. 发明申请
    • LIGHT IRRADIATION APPARATUS, PSEUDO-SUNLIGHT IRRADIATION APPARATUS AND SOLAR PANEL INSPECTION APPARATUS
    • 光照射装置,阳光照射装置和太阳能面板检查装置
    • US20120287599A1
    • 2012-11-15
    • US13392031
    • 2011-08-29
    • Atsushi Nakamura
    • Atsushi Nakamura
    • F21V9/02
    • F21S8/006H02S50/10
    • Precise, uniform illuminance is obtained for an irradiation surface without adjustment time of illuminance of the irradiation surface being time-intensive, even for an expansive area. At least one light source (xenon light source 2 or halogen light source 7, or the like) and an optical filter (air mass filter 5, 10, or the like) functioning as an optical element are matched with a respective light guiding member 14 or 14A. Since an irradiation region of the light guiding member 14 or 14A for surface irradiation is directly matched with a respective part of the irradiation surface (small irradiation surface) of an irradiation subject, illuminance on part of the irradiation surface (small irradiation surface) of the irradiation subject can be adjusted with precision by changing the amount of light entering the inside of the light guiding member 14 or 14A for surface irradiation.
    • 对于照射面而言,即使对于膨胀区域,即使照射面的照度的调整时间也是时间密集的,也获得了精确均匀的照度。 用作光学元件的至少一个光源(氙光源2或卤素光源7等)和滤光器(空气质量过滤器5,10等)与各自的导光部件14 或14A。 由于用于表面照射的导光构件14或14A的照射区域与照射对象的照射面(小照射面)的各部分直接匹配,所以照射面的一部分(小照射面)的照度 可以通过改变进入用于表面照射的导光构件14或14A的内部的光量来精确地调节照射对象。