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    • 9. 发明授权
    • Apparatus and method of recognizing presence of objects
    • 识别物体存在的装置和方法
    • US08724094B2
    • 2014-05-13
    • US13083735
    • 2011-04-11
    • Takayuki MiyaharaTakashi Ogawa
    • Takayuki MiyaharaTakashi Ogawa
    • G01C3/08
    • G01S7/4802G01S7/4817G01S17/42G01S17/936
    • An apparatus and method for recognizing presence of an object is provided, the apparatus and method are mounted on or implemented a vehicle. In the apparatus and method, by scanning a beam-shaped electromagnetic wave, data showing reflection intensities of reflected waves and distances between the vehicle and objects outside the vehicle are obtained. Based on the detected data, characteristics presented by frequency distributions of the distances and intensity frequency distributions of the refection intensities obtained in multiple rows in a field of view in the height direction of the vehicle. The characteristics depend on an angle of the electromagnetic wave to a road on which the vehicle travels. It is determined that the characteristics are obtained from the road when the characteristics meet predetermined requirements.
    • 提供了用于识别物体存在的装置和方法,该装置和方法安装在车辆上或实施车辆。 在该装置和方法中,通过扫描波束形电磁波,获得表示反射波的反射强度和车辆与车辆外的物体之间的距离的数据。 基于检测到的数据,通过车辆的高度方向上的视场中的多行获得的反射强度的距离和强度频率分布的频率分布呈现的特性。 特征取决于电磁波对车辆行进的道路的角度。 当特征满足预定要求时,确定了从道路获得的特征。
    • 10. 发明授权
    • Charged particle beam apparatus and method of adjusting charged particle optics
    • 带电粒子束装置和调整带电粒子光学的方法
    • US08698105B2
    • 2014-04-15
    • US12449633
    • 2008-02-04
    • Takashi OgawaYo YamamotoHiroshi Matsumura
    • Takashi OgawaYo YamamotoHiroshi Matsumura
    • G21G5/00
    • H01J37/28H01J37/3056H01J2237/1501H01J2237/216
    • A charged particle beam apparatus which is able to adjust charged particle optics easily in a short time with a high degree of accuracy and a method of adjusting charged particle optics are provided. A charged particle beam apparatus 1 includes a charged particle source 9, charged particle optics 12, 16 configured to set the ion beam I to a bean characteristic value corresponding to an input value to cause a sample to be irradiated therewith, scanning means 17 configured to be able to move the irradiation point of the charged particle beam I relatively with each other, observing means 32 being capable of obtaining an image, and a control unit 30, and the control unit 30 includes spot pattern forming means 33 configured to set the input value to different values and cause the sample to be irradiated with the charged particle beam I by a plurality of times at different positions to form a plurality of spot patterns and spot pattern analyzing means 34 configured to select a spot pattern having a smallest characteristic value, and sets the input values of the charged particle optics 12, 16 to a value equal to the input value corresponding to the selected spot pattern.
    • 提供一种能够以高精度容易地在短时间内调节带电粒子光学的带电粒子束装置和调节带电粒子光学的方法。 带电粒子束装置1包括带电粒子源9,带电粒子光学器件12,16,被配置为将离子束I设置为对应于输入值的豆特征值以使样品照射;扫描装置17,被配置为 能够相对地移动带电粒子束I的照射点,观察装置32能够获得图像,以及控制单元30,并且控制单元30包括斑点图案形成装置33,其被配置为设置输入 值到不同的值,并且使得样品在不同位置被多次照射带电粒子束I以形成多个斑点图案和​​斑点图案分析装置34,其被配置为选择具有最小特征值的斑点图案, 并将带电粒子光学器件12,16的输入值设置为等于对应于所选择的斑点图案的输入值的值。