会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 2. 发明授权
    • Semiconductor laser manufacturing method
    • 半导体激光制造方法
    • US07442628B2
    • 2008-10-28
    • US11706343
    • 2007-02-15
    • Keiji YamaneTetsuo UedaIsao KidoguchiToshiya Kawata
    • Keiji YamaneTetsuo UedaIsao KidoguchiToshiya Kawata
    • H01L21/00
    • B82Y20/00H01S5/0202H01S5/028H01S5/0287H01S5/168H01S5/2206H01S5/2214H01S5/2231H01S5/34333
    • A method for manufacturing a semiconductor laser. As a preparative step for coating an end face of a resonator with a dielectric film, a cleavage plane of a semiconductor laminated structure that is to be the end face is subjected to a plasma cleaning to prevent a conductive film, which absorbs laser light, from attaching to the cleavage plane. During the plasma cleaning, a first process gas containing argon gas and nitrogen gas is introduced into a vacuumed ECR sputtering apparatus. After the cleavage plane is exposed to the first process gas in the plasma state for a certain time period without application of a voltage, a second process gas containing argon gas and oxygen gas is introduced, and the cleavage plane is exposed to the second process gas in the plasma state while a voltage is applied to the silicon target.
    • 一种半导体激光器的制造方法。 作为用电介质膜涂覆谐振器的端面的制备步骤,将作为端面的半导体层叠结构的解理面进行等离子体清洗,以防止吸收激光的导电膜 附着于解理面。 在等离子体清洗期间,将含有氩气和氮气的第一工艺气体引入真空的ECR溅射装置中。 在不施加电压的情况下,在等离子体状态下将解理面暴露于等离子体状态的第一工艺气体一定时间后,引入含有氩气和氧气的第二工艺气体,并将解理面暴露于第二工艺气体 处于等离子体状态,同时向硅靶施加电压。
    • 5. 发明授权
    • Semiconductor laser manufacturing method
    • 半导体激光制造方法
    • US07192851B2
    • 2007-03-20
    • US10931206
    • 2004-09-01
    • Keiji YamaneTetsuo UedaIsao KidoguchiToshiya Kawata
    • Keiji YamaneTetsuo UedaIsao KidoguchiToshiya Kawata
    • H01L21/00
    • B82Y20/00H01S5/0202H01S5/028H01S5/0287H01S5/168H01S5/2206H01S5/2214H01S5/2231H01S5/34333
    • A method for manufacturing a semiconductor laser. As a preparative step for coating an end face of a resonator with a dielectric film, a cleavage plane of a semiconductor laminated structure that is to be the end face is subjected to a plasma cleaning to prevent a conductive film, which absorbs laser light, from attaching to the cleavage plane. During the plasma cleaning, a first process gas containing argon gas and nitrogen gas is introduced into a vacuumed ECR sputtering apparatus. After the cleavage plane is exposed to the first process gas in the plasma state for a certain time period without application of a voltage, a second process gas containing argon gas and oxygen gas is introduced, and the cleavage plane is exposed to the second process gas in the plasma state while a voltage is applied to the silicon target.
    • 一种半导体激光器的制造方法。 作为用电介质膜涂覆谐振器的端面的制备步骤,将作为端面的半导体层叠结构的解理面进行等离子体清洗,以防止吸收激光的导电膜 附着于解理面。 在等离子体清洗期间,将含有氩气和氮气的第一工艺气体引入真空的ECR溅射装置中。 在不施加电压的情况下,在等离子体状态下将解理面暴露于等离子体状态的第一工艺气体一定时间后,引入含有氩气和氧气的第二工艺气体,并将解理面暴露于第二工艺气体 处于等离子体状态,同时向硅靶施加电压。
    • 8. 发明授权
    • Semiconductor laser
    • 半导体激光器
    • US07197055B2
    • 2007-03-27
    • US11070267
    • 2005-03-03
    • Tetsuo UedaMasahiro KumeToshiya KawataIsao Kidoguchi
    • Tetsuo UedaMasahiro KumeToshiya KawataIsao Kidoguchi
    • H01S5/00
    • B82Y20/00H01S5/1039H01S5/162H01S5/168H01S5/2214H01S5/2231H01S5/34333H01S5/4031H01S5/4087H01S2301/18
    • In a semiconductor laser 1, a current blocking layer 19 covers a p-type 2nd cladding layer 17 and a p-type cap layer 18 that extend in a lengthwise direction of an optical resonator, at both a light-emission end and an end opposite the light-emission end, to thus form non-current injection regions in an optical waveguide. By making current blocking layer 19 at the light-emission end large enough that carriers flowing from a current injection region do not reach the light-emission end surface, the light intensity distribution in the near field at the light-emission end surface is strongly concentrated, allowing the horizontal divergence angle of an emerging laser beam to be enlarged. This structure makes it possible to enlarge the horizontal divergence angle independently after having optimized the thickness of cladding layers and the size of the current injection region.
    • 在半导体激光器1中,电流阻挡层19覆盖在光谐振器的长度方向上延伸的p型2层包层17和p型覆盖层18, 发光端和与发光端相对的端部,从而在光波导中形成非电流注入区域。 通过使发光端处的电流阻挡层19足够大,使得从电流注入区域流动的载流子未到达发光端面,发光端面处的近场中的光强度分布被强烈集中 允许出现的激光束的水平发散角被扩大。 这种结构使得可以在优化包覆层的厚度和电流注入区域的尺寸之后独立地扩大水平发散角。
    • 10. 发明授权
    • Semiconductor laser
    • 半导体激光器
    • US07142576B2
    • 2006-11-28
    • US11198089
    • 2005-08-05
    • Tetsuo UedaKeiji YamaneIsao KidoguchiShoji Fujimori
    • Tetsuo UedaKeiji YamaneIsao KidoguchiShoji Fujimori
    • H01S5/00
    • H01S5/028
    • A semiconductor laser includes an active layer formed on a substrate and a pair of cladding layers sandwiching the active layer. On at least one of resonator end faces of the semiconductor laser, a first dielectric film with hydrogen added therein is provided. Between the first dielectric film and the resonator end face, a second dielectric film for suppressing the diffusion of hydrogen is provided. Even when a semiconductor laser with an end face coating film including a hydrogen-added film is exposed to high temperatures, peeling of the end face coating film and deterioration of the end face coating film can be suppressed.
    • 半导体激光器包括形成在基板上的有源层和夹着有源层的一对包覆层。 在半导体激光器的至少一个谐振器端面上,提供了其中添加有氢的第一电介质膜。 在第一电介质膜和谐振器端面之间,提供了用于抑制氢的扩散的第二电介质膜。 即使当具有包含加氢膜的端面涂膜的半导体激光器暴露于高温时,也可以抑制端面涂膜的剥离和端面涂膜的劣化。