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1. 发明申请

US20100220338A1 MEASUREMENT APPARATUS AND METHOD FOR MEASURING SURFACE SHAPE AND ROUGHNESS 有权
标题翻译：测量装置和测量表面形状和粗糙度的方法
公开(公告)号：US20100220338A1
公开(公告)日：2010-09-02
申请号：US12669825
申请日：2008-08-14
申请人： Kazuyuki Ota , Hiroshi Yoshikawa , Yusuke Mitarai , Masafumi Takimoto , Kazunori Okudomi , Hiroyuki Shinbata , Kenji Saitoh , Masakazu Matsugu
发明人： Kazuyuki Ota , Hiroshi Yoshikawa , Yusuke Mitarai , Masafumi Takimoto , Kazunori Okudomi , Hiroyuki Shinbata , Kenji Saitoh , Masakazu Matsugu
IPC分类号： G01B11/24
CPC分类号： G01B11/24 , G01B11/30
摘要： A measurement apparatus includes an illumination light setting unit which sets illumination light having an optical characteristic corresponding to a microstructure which is formed on the surface of a measurement target and is to be measured, a measurement unit which measures reflected light when the measurement target is irradiated with the illumination light, and an extraction unit which extracts, from the measured reflected light, information about the surface shape of the measurement target and the microstructure formed on the surface.
摘要翻译：测量装置包括照明光设定单元，其设置具有对应于形成在测量对象物的表面上并要被测量的微结构的光学特性的照明光，测量单元，其在测量对象被照射时测量反射光以及从测量的反射光中提取关于测量对象的表面形状和形成在表面上的微结构的信息的提取单元。

2. 发明授权

US08497995B2 Measurement apparatus and method for measuring surface shape and roughness 有权
标题翻译：用于测量表面形状和粗糙度的测量装置和方法
公开(公告)号：US08497995B2
公开(公告)日：2013-07-30
申请号：US12669825
申请日：2008-08-14
申请人： Kazuyuki Ota , Hiroshi Yoshikawa , Yusuke Mitarai , Masafumi Takimoto , Kazunori Okudomi , Hiroyuki Shinbata , Kenji Saitoh , Masakazu Matsugu
发明人： Kazuyuki Ota , Hiroshi Yoshikawa , Yusuke Mitarai , Masafumi Takimoto , Kazunori Okudomi , Hiroyuki Shinbata , Kenji Saitoh , Masakazu Matsugu
IPC分类号： G01B11/24
CPC分类号： G01B11/24 , G01B11/30
摘要： A measurement apparatus includes an illumination light setting unit which sets illumination light having an optical characteristic corresponding to a microstructure which is formed on the surface of a measurement target and is to be measured, and a measurement unit which measures reflected light when the measurement target is irradiated with the illumination light. In addition, an extraction unit extracts, from the measured reflected light, information about the surface shape of the measurement target and the microstructure formed on the surface.
摘要翻译：测量装置包括照明光设定单元，其设置具有对应于形成在测量对象物的表面上并要被测量的微结构的光学特性的照明光，以及测量单元，其在测量对象为用照明光照射。此外，提取单元从测量的反射光中提取关于测量目标的表面形状和形成在表面上的微结构的信息。

3. 发明授权

US08437003B2 Information processing apparatus and method 有权
标题翻译：信息处理装置和方法
公开(公告)号：US08437003B2
公开(公告)日：2013-05-07
申请号：US12812008
申请日：2009-01-28
申请人： Hiroshi Yoshikawa , Yusuke Mitarai , Masafumi Takimoto , Kazuyuki Ota , Kenji Saitoh , Masakazu Matsugu
发明人： Hiroshi Yoshikawa , Yusuke Mitarai , Masafumi Takimoto , Kazuyuki Ota , Kenji Saitoh , Masakazu Matsugu
IPC分类号： G01N21/55
CPC分类号： G01N21/57 , G01N21/4738 , G01N2021/4735
摘要： An information processing apparatus includes an obtaining unit configured to obtain first information regarding a distribution of reflected light from a target to be measured and second information regarding geometrical-optics components of the reflected light, a calculating unit configured to calculate third information on the basis of the first information and the second information, the third information indicating an approximation of the distribution of reflected light, and an output unit configured to output information regarding wave-optics components of the reflected light on the basis of the third information.
摘要翻译：一种信息处理设备，包括：获取单元，被配置为获得关于来自待测目标的反射光的分布的第一信息和关于反射光的几何光学分量的第二信息;计算单元，被配置为基于所述第一信息和所述第二信息，所述第三信息指示反射光的分布的近似值;以及输出单元，被配置为基于所述第三信息输出关于所述反射光的波长成分的信息。

4. 发明申请

US20110037984A1 INFORMATION PROCESSING APPARATUS AND METHOD 有权
标题翻译：信息处理装置和方法
公开(公告)号：US20110037984A1
公开(公告)日：2011-02-17
申请号：US12812008
申请日：2009-01-28
申请人： Hiroshi Yoshikawa , Yusuke Mitarai , Masafumi Takimoto , Kazuyuki Ota , Kenji Saitoh , Masakazu Matsugu
发明人： Hiroshi Yoshikawa , Yusuke Mitarai , Masafumi Takimoto , Kazuyuki Ota , Kenji Saitoh , Masakazu Matsugu
IPC分类号： G01N21/55
CPC分类号： G01N21/57 , G01N21/4738 , G01N2021/4735
摘要： An information processing apparatus includes an obtaining unit configured to obtain first information regarding a distribution of reflected light from a target to be measured and second information regarding geometrical-optics components of the reflected light, a calculating unit configured to calculate third information on the basis of the first information and the second information, the third information indicating an approximation of the distribution of reflected light, and an output unit configured to output information regarding wave-optics components of the reflected light on the basis of the third information.
摘要翻译：一种信息处理设备，包括：获取单元，被配置为获得关于来自待测目标的反射光的分布的第一信息和关于反射光的几何光学分量的第二信息;计算单元，被配置为基于所述第一信息和所述第二信息，所述第三信息指示反射光的分布的近似值;以及输出单元，被配置为基于所述第三信息输出关于所述反射光的波长成分的信息。

5. 发明授权

US08861881B2 Image processing apparatus, method thereof, program, and image capturing apparatus 有权
标题翻译：图像处理装置及其方法，程序和图像捕获装置
公开(公告)号：US08861881B2
公开(公告)日：2014-10-14
申请号：US13207544
申请日：2011-08-11
申请人： Shunta Tate , Masafumi Takimoto , Yusuke Mitarai , Katsuhiko Mori , Masakazu Matsugu
发明人： Shunta Tate , Masafumi Takimoto , Yusuke Mitarai , Katsuhiko Mori , Masakazu Matsugu
IPC分类号： G06K9/40 , G06T5/00 , G06T7/00
CPC分类号： G06T5/003 , G06T5/005 , G06T7/75 , G06T2207/10016 , G06T2207/10024 , G06T2207/20016 , G06T2207/20064 , G06T2207/20076
摘要： An image processing apparatus stores model information representing a subject model belonging to a specific category, detects the subject from an input image by referring to the model information, determines a region for which an image correction is to be performed within a region occupied by the detected subject in the input image, stores, for a local region of the image, a plurality of correction data sets representing correspondence between a feature vector representing a feature before correction and a feature vector representing a feature after correction, selects at least one of the correction data sets to be used to correct a local region included in the region determined to undergo the image correction, and corrects the region determined to undergo the image correction using the selected correction data sets.
摘要翻译：图像处理装置存储表示属于特定类别的对象模型的模型信息，通过参考模型信息从输入图像检测对象，确定在被检测到的区域内进行图像校正的区域在输入图像中，对于图像的局部区域存储表示表示校正前的特征的特征矢量与表示校正后的特征的特征矢量之间的对应关系的多个校正数据集，选择校正中的至少一个，用于校正被确定为进行图像校正的区域中包括的局部区域的数据组，并且使用所选择的校正数据集校正确定为进行图像校正的区域。

6. 发明申请

US20120045095A1 IMAGE PROCESSING APPARATUS, METHOD THEREOF, PROGRAM, AND IMAGE CAPTURING APPARATUS 有权
标题翻译：图像处理设备，其方法，程序和图像捕获设备
公开(公告)号：US20120045095A1
公开(公告)日：2012-02-23
申请号：US13207544
申请日：2011-08-11
申请人： Shunta Tate , Masafumi Takimoto , Yusuke Mitarai , Katsuhiko Mori , Masakazu Matsugu
发明人： Shunta Tate , Masafumi Takimoto , Yusuke Mitarai , Katsuhiko Mori , Masakazu Matsugu
IPC分类号： G06K9/00
CPC分类号： G06T5/003 , G06T5/005 , G06T7/75 , G06T2207/10016 , G06T2207/10024 , G06T2207/20016 , G06T2207/20064 , G06T2207/20076
摘要： An image processing apparatus stores model information representing a subject model belonging to a specific category, detects the subject from an input image by referring to the model information, determines a region for which an image correction is to be performed within a region occupied by the detected subject in the input image, stores, for a local region of the image, a plurality of correction data sets representing correspondence between a feature vector representing a feature before correction and a feature vector representing a feature after correction, selects at least one of the correction data sets to be used to correct a local region included in the region determined to undergo the image correction, and corrects the region determined to undergo the image correction using the selected correction data sets.
摘要翻译：图像处理装置存储表示属于特定类别的对象模型的模型信息，通过参考模型信息从输入图像检测对象，确定在被检测到的区域内进行图像校正的区域在输入图像中，对于图像的局部区域存储表示表示校正前的特征的特征矢量与表示校正后的特征的特征矢量之间的对应关系的多个校正数据集，选择校正中的至少一个，用于校正被确定为进行图像校正的区域中包括的局部区域的数据组，并且使用所选择的校正数据集校正确定为进行图像校正的区域。

7. 发明授权

US08456621B2 Measurement system and measurement processing method 有权
标题翻译：测量系统和测量处理方法
公开(公告)号：US08456621B2
公开(公告)日：2013-06-04
申请号：US13595013
申请日：2012-08-27
申请人： Kazuyuki Ota , Masakazu Matsugu , Kenji Saitoh
发明人： Kazuyuki Ota , Masakazu Matsugu , Kenji Saitoh
IPC分类号： G01N21/00
CPC分类号： G01B11/25
摘要： This invention is directed to extract the scattering characteristic of a measurement target together when measuring the surface shape in a measurement system, which measures the surface shape of a measurement target, by the pattern projection method. To accomplish this, the measurement system includes an illumination unit which irradiates a measurement target with dot pattern light, a reflected light measurement unit which receives the reflected light at a reflection angle almost equal to a incident angle, and a reflected light extraction unit which extracts the inclination of the surface of the measurement target, based on the shift amount between the light receiving position of the received reflected light and a predetermined reference position, and extracts the luminance value of the reflected light and the dot diameter of the dot pattern light as information about the scattering characteristic.
摘要翻译：本发明旨在通过图案投影法在测量测量对象的表面形状的测量系统中测量表面形状时，将测量对象的散射特性一起提取。为了实现这一点，测量系统包括用点阵图形光照射测量对象的照明单元，以几乎等于入射角的反射角接收反射光的反射光测量单元和提取出的反射光提取单元基于接收到的反射光的光接收位置与预定的基准位置之间的偏移量，测量对象的表面的倾斜度，并将点阵图案光的反射光的亮度值和点直径提取为关于散射特性的信息。

8. 发明授权

US08274646B2 Measurement system and measurement processing method 有权
标题翻译：测量系统和测量处理方法
公开(公告)号：US08274646B2
公开(公告)日：2012-09-25
申请号：US12816069
申请日：2010-06-15
申请人： Kazuyuki Ota , Masakazu Matsugu , Kenji Saitoh
发明人： Kazuyuki Ota , Masakazu Matsugu , Kenji Saitoh
IPC分类号： G01N21/00
CPC分类号： G01B11/25
摘要： This invention is directed to extract the scattering characteristic of a measurement target together when measuring the surface shape in a measurement system, which measures the surface shape of a measurement target, by the pattern projection method. To accomplish this, the measurement system includes an illumination unit which irradiates a measurement target with dot pattern light, a reflected light measurement unit which receives the reflected light at a reflection angle almost equal to a incident angle, and a reflected light extraction unit which extracts the inclination of the surface of the measurement target, based on the shift amount between the light receiving position of the received reflected light and a predetermined reference position, and extracts the luminance value of the reflected light and the dot diameter of the dot pattern light as information about the scattering characteristic.
摘要翻译：本发明旨在通过图案投影法在测量测量对象的表面形状的测量系统中测量表面形状时，将测量对象的散射特性一起提取。为了实现这一点，测量系统包括用点阵图形光照射测量对象的照明单元，以几乎等于入射角的反射角接收反射光的反射光测量单元和提取出的反射光提取单元基于接收到的反射光的光接收位置与预定的基准位置之间的偏移量，测量对象的表面的倾斜度，并将点阵图案光的反射光的亮度值和点直径提取为关于散射特性的信息。

9. 发明申请

US20120327400A1 MEASUREMENT SYSTEM AND MEASUREMENT PROCESSING METHOD 有权
标题翻译：测量系统和测量处理方法
公开(公告)号：US20120327400A1
公开(公告)日：2012-12-27
申请号：US13595013
申请日：2012-08-27
申请人： Kazuyuki Ota , Masakazu Matsugu , Kenji Saitoh
发明人： Kazuyuki Ota , Masakazu Matsugu , Kenji Saitoh
IPC分类号： G01B11/25 , G01N21/47
CPC分类号： G01B11/25
摘要： This invention is directed to extract the scattering characteristic of a measurement target together when measuring the surface shape in a measurement system, which measures the surface shape of a measurement target, by the pattern projection method. To accomplish this, the measurement system includes an illumination unit which irradiates a measurement target with dot pattern light, a reflected light measurement unit which receives the reflected light at a reflection angle almost equal to a incident angle, and a reflected light extraction unit which extracts the inclination of the surface of the measurement target, based on the shift amount between the light receiving position of the received reflected light and a predetermined reference position, and extracts the luminance value of the reflected light and the dot diameter of the dot pattern light as information about the scattering characteristic.
摘要翻译：本发明旨在通过图案投影法在测量测量对象的表面形状的测量系统中测量表面形状时，将测量对象的散射特性一起提取。为了实现这一点，测量系统包括用点阵图形光照射测量对象的照明单元，以几乎等于入射角的反射角接收反射光的反射光测量单元和提取出的反射光提取单元基于接收到的反射光的光接收位置与预定的基准位置之间的偏移量，测量对象的表面的倾斜度，并将点阵图案光的反射光的亮度值和点直径提取为关于散射特性的信息。

10. 发明申请

US20100328649A1 MEASUREMENT SYSTEM AND MEASUREMENT PROCESSING METHOD 有权
标题翻译：测量系统和测量处理方法
公开(公告)号：US20100328649A1
公开(公告)日：2010-12-30
申请号：US12816069
申请日：2010-06-15
申请人： Kazuyuki Ota , Masakazu Matsugu , Kenji Saitoh
发明人： Kazuyuki Ota , Masakazu Matsugu , Kenji Saitoh
IPC分类号： G01B11/24 , G01B11/30
CPC分类号： G01B11/25
摘要： This invention is directed to extract the scattering characteristic of a measurement target together when measuring the surface shape in a measurement system, which measures the surface shape of a measurement target, by the pattern projection method. To accomplish this, the measurement system includes an illumination unit which irradiates a measurement target with dot pattern light, a reflected light measurement unit which receives the reflected light at a reflection angle almost equal to a incident angle, and a reflected light extraction unit which extracts the inclination of the surface of the measurement target, based on the shift amount between the light receiving position of the received reflected light and a predetermined reference position, and extracts the luminance value of the reflected light and the dot diameter of the dot pattern light as information about the scattering characteristic.
摘要翻译：本发明旨在通过图案投影法在测量测量对象的表面形状的测量系统中测量表面形状时，将测量对象的散射特性一起提取。为了实现这一点，测量系统包括用点阵图形光照射测量对象的照明单元，以几乎等于入射角的反射角接收反射光的反射光测量单元和提取出的反射光提取单元基于接收到的反射光的光接收位置与预定的基准位置之间的偏移量，测量对象的表面的倾斜度，并将点阵图案光的反射光的亮度值和点直径提取为关于散射特性的信息。

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