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    • 1. 发明授权
    • Semiconductor laser device having a low reflection film of stable reflectance
    • 具有稳定反射率的低反射膜的半导体激光器件
    • US07577173B2
    • 2009-08-18
    • US11938845
    • 2007-11-13
    • Kazushige KawasakiYasuyuki NakagawaHiromasu Matsuoka
    • Kazushige KawasakiYasuyuki NakagawaHiromasu Matsuoka
    • H01S5/00
    • H01S5/028H01S5/0287H01S5/32341
    • A semiconductor laser device comprises a GaN substrate having a refractive index of 3.5 or below, a semiconductor layer laminated on the substrate, and a pair of facets forming a resonator and in face-to-face-relation to each other in a direction perpendicular to the direction of the laminated layer. One of the facets of the resonator includes a low reflection film, of a first dielectric film, a second dielectric film, a third dielectric film, and a fourth dielectric film. When the refractive indexes of these films are taken as n1, n2, n3, and n4, n1=n3 and n2=n4. The following relationship between the first dielectric film and the third dielectric film, and between the second dielectric film and the fourth dielectric film is established, nd+n′d′=pλ/4, where p is an integer, and λ is oscillation wavelength of a laser beam generated by the semiconductor laser device.
    • 半导体激光装置包括折射率为3.5以下的GaN衬底,层叠在衬底上的半导体层和形成谐振器的一对面,并且在垂直于该衬底的方向上彼此面对面 层压层的方向。 谐振器的一个面包括第一电介质膜,第二电介质膜,第三电介质膜和第四电介质膜的低反射膜。 当这些膜的折射率取为n1,n2,n3和n4时,n1 = n3,n2 = n4。 建立第一电介质膜和第三电介质膜之间以及第二电介质膜和第四介电膜之间的以下关系,nd + n'd'=λ/ 4,其中p是整数,λ是振荡波长 由半导体激光装置产生的激光束。
    • 2. 发明申请
    • SEMICONDUCTOR LASER DEVICE HAVING A LOW REFLECTION FILM OF STABLE REFLECTANCE
    • 具有稳定反射的低反射膜的半导体激光器件
    • US20080205468A1
    • 2008-08-28
    • US11938845
    • 2007-11-13
    • Kazushige KawasakiYasuyuki NakagawaHiromasu Matsuoka
    • Kazushige KawasakiYasuyuki NakagawaHiromasu Matsuoka
    • H01S5/028
    • H01S5/028H01S5/0287H01S5/32341
    • A semiconductor laser device comprises a GaN substrate having a refractive index of 3.5 or below, a semiconductor layer laminated on the substrate, and a pair of facets forming a resonator and in face-to-face-relation to each other in a direction perpendicular to the direction of the laminated layer. One of the facets of the resonator includes a low reflection film, of a first dielectric film, a second dielectric film, a third dielectric film, and a fourth dielectric film. When the refractive indexes of these films are taken as n1, n2, n3, and n4, n1=n3 and n2=n4. The following relationship between the first dielectric film and the third dielectric film, and between the second dielectric film and the fourth dielectric film is established, nd+n′d′=pλ/4, where p is an integer, and λ is oscillation wavelength of a laser beam generated by the semiconductor laser device.
    • 半导体激光装置包括折射率为3.5以下的GaN衬底,层叠在衬底上的半导体层和形成谐振器的一对面,并且在垂直于该衬底的方向上彼此面对面 层压层的方向。 谐振器的一个面包括第一电介质膜,第二电介质膜,第三电介质膜和第四电介质膜的低反射膜。 当这些膜的折射率取为n 1,n 2,n 3和n 4时, ,n 1 = n 3和n 2 = n 4。 建立第一电介质膜和第三电介质膜之间以及第二电介质膜和第四介电膜之间的以下关系,nd + n'd'=λ/ 4,其中p是整数,λ是振荡波长 由半导体激光装置产生的激光束。
    • 7. 发明授权
    • Semiconductor laser device
    • 半导体激光器件
    • US07616673B2
    • 2009-11-10
    • US11439276
    • 2006-05-24
    • Hiromasu MatsuokaYasuyuki NakagawaToshihiko Shiga
    • Hiromasu MatsuokaYasuyuki NakagawaToshihiko Shiga
    • H01S5/00
    • H01S5/028H01S5/0287
    • A semiconductor laser device includes a semiconductor laser body including a resonator and having a front end face and a rear end face facing each other, the resonator being located between the front end face and the rear end face. The front end face emits principal laser light. A reflectance control film is disposed on the front end face or the rear end face of the semiconductor laser body and is made up of either an aluminum oxide film or a five-layer film including the aluminum oxide film disposed such that it is the layer in the five-layer film farthest from the front end face or the rear end face. A silicon oxide film is disposed on the aluminum oxide film of the reflectance control film and has a thickness of 20 nm or less.
    • 半导体激光装置包括:包括谐振器的半导体激光器体,其前端面和后端面彼此面对,所述谐振器位于前端面和后端面之间。 前端面发射主激光。 反射控制膜设置在半导体激光体的前端面或后端面上,由氧化铝膜或包含氧化铝膜的五层膜构成,使其成为 五层薄膜离前端面或后端面最远。 氧化硅膜设置在反射控制膜的氧化铝膜上,厚度为20nm以下。
    • 10. 发明申请
    • Semiconductor laser device
    • 半导体激光器件
    • US20070053398A1
    • 2007-03-08
    • US11439276
    • 2006-05-24
    • Hiromasu MatsuokaYasuyuki NakagawaToshihiko Shiga
    • Hiromasu MatsuokaYasuyuki NakagawaToshihiko Shiga
    • H01S5/00
    • H01S5/028H01S5/0287
    • A semiconductor laser device includes a semiconductor laser body including a resonator and having a front end face and a rear end face facing each other, the resonator being located between the front end face and the rear end face. The front end face emits principal laser light. A reflectance control film is disposed on the front end face or the rear end face of the semiconductor laser body and is made up of either an aluminum oxide film or a five-layer film including the aluminum oxide film disposed such that it is the layer in the five-layer film farthest from the front end face or the rear end face. A silicon oxide film is disposed on the aluminum oxide film of the reflectance control film and has a thickness of 20 nm or less.
    • 半导体激光装置包括:包括谐振器的半导体激光器体,其前端面和后端面彼此面对,所述谐振器位于前端面和后端面之间。 前端面发射主激光。 反射控制膜设置在半导体激光体的前端面或后端面上,由氧化铝膜或包含氧化铝膜的五层膜构成,使其成为 五层薄膜离前端面或后端面最远。 氧化硅膜设置在反射控制膜的氧化铝膜上,厚度为20nm以下。