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    • 1. 发明授权
    • Semiconductor device
    • 半导体器件
    • US06465834B1
    • 2002-10-15
    • US09516773
    • 2000-03-01
    • Kazuo NakazatoKiyoo Ito
    • Kazuo NakazatoKiyoo Ito
    • H01L2972
    • H01L27/108H01L27/10876
    • In the case of a large capacity DRAM (Dynamic Random Access Memory) of a conventional type, since a signal voltage read out from a memory cell is low, the action thereof is apt to be unstable. If a gain is added to a memory cell to obtain a large output voltage, the area for a memory cell becomes large. Accordingly, a memory cell with RAM action being stable and which requires a small area is needed. A memory cell according to the present invention is provided with MOS transistors 2, 3, 4, 5 to read out storage information, transistors 8 and 11b to write storage information, and a capacitor 11a to control the voltage at the storage node. These component parts are assembled to form a 3-dimensional structure.
    • 在常规类型的大容量DRAM(动态随机存取存储器)的情况下,由于从存储单元读出的信号电压低,所以其作用容易不稳定。 如果将增益添加到存储器单元以获得大的输出电压,则存储器单元的面积变大。 因此,需要具有RAM动作的存储单元是稳定的并且需要小的面积。 根据本发明的存储单元设置有MOS晶体管2,3,4,5以读出存储信息,晶体管8和11b以写入存储信息,以及电容器11a以控制存储节点处的电压。 组装这些组分以形成3维结构。