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    • 2. 发明授权
    • Proofer
    • US07789222B2
    • 2010-09-07
    • US12030427
    • 2008-02-13
    • Kazuhide FujitaMasayuki KomaKoji KoikeSatoshi Goto
    • Kazuhide FujitaMasayuki KomaKoji KoikeSatoshi Goto
    • B65G17/16B65G17/18B65G17/32B65G43/00B65G23/44
    • A21C13/02
    • An endless dough conveyor 16 is provided with a resin endless toothed belt 18 instead of a metal chain. A toothed pulley 22 around which the endless toothed belt is wound is also made of resin. A rail 64 is disposed adjacent to a horizontal path of the belt, and a roller 46 attached to the belt is adapted to roll on the rail. At least two induction motors are provided for driving the endless toothed belt. The induction motors are supplied with electric power from a single inverter 35. At least a pulley is provided with a detecting unit 80. The detecting unit 80 detects a state in which teeth of the endless toothed belt climb onto that of the pulley, thereby predicting breakage of the belt. Thus, it is possible to prevent contamination of dough in a proofer.
    • 无端的面料输送机16设置有树脂无端带齿带18而不是金属链。 卷绕有环形齿形带的齿形带轮22也由树脂制成。 轨道64设置成邻近带的水平路径,并且附接到带的辊46适于在轨道上滚动。 提供至少两个感应电动机用于驱动环形带齿带。 感应电动机由单个逆变器35提供电力。至少一个滑轮设置有检测单元80.检测单元80检测环形带齿的齿爬上皮带轮的齿的状态,由此预测 皮带破损。 因此,可以防止制版机中面团的污染。
    • 3. 发明申请
    • PROOFER
    • US20080199286A1
    • 2008-08-21
    • US12030427
    • 2008-02-13
    • Kazuhide FujitaMasayuki KomaKoji KoikeSatoshi Goto
    • Kazuhide FujitaMasayuki KomaKoji KoikeSatoshi Goto
    • A21C13/02A21C13/00
    • A21C13/02
    • An endless dough conveyor 16 is provided with a resin endless toothed belt 18 instead of a metal chain. A toothed pulley 22 around which the endless toothed belt is wound is also made of resin. A rail 64 is disposed adjacent to a horizontal path of the belt, and a roller 46 attached to the belt is adapted to roll on the rail. At least two induction motors are provided for driving the endless toothed belt. The induction motors are supplied with electric power from a single inverter 35. At least a pulley is provided with a detecting unit 80. The detecting unit 80 detects a state in which teeth of the endless toothed belt climb onto that of the pulley, thereby predicting breakage of the belt. Thus, it is possible to prevent contamination of dough in a proofer.
    • 无端的面料输送机16设置有树脂无端带齿带18而不是金属链。 卷绕有环形齿形带的齿形带轮22也由树脂制成。 轨道64设置成邻近带的水平路径,并且附接到带的辊46适于在轨道上滚动。 提供至少两个感应电动机用于驱动环形带齿带。 感应电动机由单个逆变器35提供电力。至少一个滑轮设置有检测单元80.检测单元80检测环形带齿的齿爬上皮带轮的齿的状态,由此预测 皮带破损。 因此,可以防止制版机中面团的污染。
    • 5. 发明授权
    • Image processing apparatus and image processing method
    • 图像处理装置和图像处理方法
    • US08264604B2
    • 2012-09-11
    • US12816716
    • 2010-06-16
    • Kazuhide Fujita
    • Kazuhide Fujita
    • H04N7/01
    • H04N7/012H04N7/0147
    • A image processing apparatus includes an interlace/progressive converter that converts interlaced input image data into progressive image data; an up-convert material detector that detects low quality up-convert material likelihood of the interlaced input image data; and an image processor that obtains output image data by processing progressive image data on the basis of the detected signal of the up-convert material detector, wherein the up-convert material detector detects the low quality up-convert material likelihood on the basis of ratio of the sum of an inter-field pixel value difference and the sum of in-field pixel value difference, the pixels in a predetermined area being obtained as sequential notable pixels using image data of a first field and a second field that are continuous in each field.
    • 一种图像处理装置包括将隔行输入图像数据转换成逐行图像数据的隔行/逐行转换器; 上变换材料检测器,其检测隔行输入图像数据的低质量上转换材料似然性; 以及图像处理器,其基于上变换材料检测器的检测信号,通过处理逐行图像数据来获得输出图像数据,其中上转换材料检测器基于比率检测低质量上转换材料似然性 使用场间像素值差的总和和场内像素值差的和,使用在每个像素值连续的第一场和第二场的图像数据作为顺序显着像素获得预定区域中的像素 领域。
    • 6. 发明授权
    • Probe structure for measuring electric characteristics of a
semiconductor element
    • 用于测量半导体元件的电特性的探针结构
    • US5576630A
    • 1996-11-19
    • US260992
    • 1994-06-16
    • Kazuhide Fujita
    • Kazuhide Fujita
    • G01R31/28G01R31/02
    • G01R31/2886
    • A probe structure for measuring electric characteristics of a semiconductor element containing a first electrically conductive circuit board having a structure wherein the contact portions, which are contacted with the terminals of a material to be tested, are disposed in a first insulator in the direction of the thickness thereof so as to penetrate the insulator and are connected to a first electrically conductive wiring formed between the first insulator and a second insulator. The probe structure also contains a second electrically conductive circuit board having a coefficient of thermal expansion which is the same as or similar to that of the material to be tested and having a structure wherein the first electrically conductive wiring is connected to a second electrically conductive wiring which, in turn, is connected to an electric tester for testing the electric characteristics of the material to be tested. The first electrically conductive circuit board is electrically connected to the second electrically conductive circuit board, and an elastic body is disposed between the first electrically conductive circuit board and the second electrically conductive circuit board.
    • 一种用于测量包含第一导电电路板的半导体元件的电特性的探针结构,所述第一导电电路板具有这样的结构,其中与被测试材料的端子接触的接触部分沿第一绝缘体 其厚度穿过绝缘体并且连接到形成在第一绝缘体和第二绝缘体之间的第一导电布线。 探针结构还包含第二导电电路板,其热膨胀系数与被测材料的热膨胀系数相同或类似,并且具有其中第一导电布线连接到第二导电布线 这又连接到用于测试待测试材料的电特性的电测试器。 第一导电电路板电连接到第二导电电路板,并且弹性体设置在第一导电电路板和第二导电电路板之间。