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1. 发明授权

US06903341B2 Apparatus for generating tera-Hertz wave and tuning method 失效
标题翻译：用于产生t赫赫兹波和调谐方法的装置
公开(公告)号：US06903341B2
公开(公告)日：2005-06-07
申请号：US10406605
申请日：2003-04-04
申请人： Kazuhiro Imai , Kodo Kawase , Hiromasa Ito
发明人： Kazuhiro Imai , Kodo Kawase , Hiromasa Ito
IPC分类号： G02F1/39 , G02F1/35
CPC分类号： G02F1/39 , G02F2203/04 , G02F2203/13
摘要： There are disclosed a nonlinear optical crystal 1 which can generate a THz wave by a parametric effect; a pump light incidence apparatus 12 for allowing a pump light 2 to be incident upon the nonlinear optical crystal; and a seed light injection apparatus 14 for injecting a seed light 5 having a variable frequency in a generation direction of an idler light 3 generated by the pump light. The seed light injection apparatus 14 comprises angle dispersion compensation means 16 set so that an incidence angle θIN of the seed light upon the nonlinear optical crystal 1 substantially equals to a desired phase matching condition regardless of a wavelength.
摘要翻译：公开了一种可以通过参数效应产生太赫兹波的非线性光学晶体1; 泵浦光入射装置12，用于使泵浦光2入射在非线性光学晶体上; 以及种子光注射装置14，用于在由泵浦光产生的惰轮3的产生方向上喷射具有可变频率的种子光5。种子光注入装置14包括角度色散补偿装置16，其设置为使得非线性光学晶体1上的种子光的入射角θIN IN基本上等于期望的相位匹配条件，而不管波长如何。

2. 发明授权

US08493057B2 Electromagnetic wave measuring apparatus, measuring method, program, and recording medium 有权
标题翻译：电磁波测量装置，测量方法，程序和记录介质
公开(公告)号：US08493057B2
公开(公告)日：2013-07-23
申请号：US12731483
申请日：2010-03-25
申请人： Shigeki Nishina , Motoki Imamura , Akiyoshi Irisawa , Tomoyu Yamashita , Eiji Kato , Kodo Kawase
发明人： Shigeki Nishina , Motoki Imamura , Akiyoshi Irisawa , Tomoyu Yamashita , Eiji Kato , Kodo Kawase
IPC分类号： G01S3/02
CPC分类号： G01J5/0285 , G01N21/3563 , G01N21/3581 , G01N21/8806
摘要： A detector detects an electromagnetic wave having a frequency of 0.01 THz≦f≦100 THz and transmitted through a device under test (DUT). A changer changes a relative position of an intersection of an optical path of the electromagnetic wave and the DUT, with respect to the DUT. A deriver derives a characteristic value of the electromagnetic wave based on a detection result of the detector, while the characteristic value is associated with an assumed relative position, which is the relative position if the electromagnetic wave is not refracted by the DUT. A corrector changes the assumed relative position to an actual relative position, which is the relative position if the refraction of the electromagnetic wave by the DUT is considered. A corrected deriver derives the characteristic value associated with a predetermined relative position based on an output from the corrector.
摘要翻译：检测器检测频率为0.01THz @ f @ 100THz的电磁波，并通过被测器件（DUT）传输。变换器相对于DUT来改变电磁波和DUT的光路的交点的相对位置。导出器基于检测器的检测结果导出电磁波的特征值，而特征值与假设的相对位置相关联，假设的相对位置是电磁波未被DUT折射的相对位置。校正器将假设的相对位置改变为实际的相对位置，如果考虑到DUT的电磁波的折射，则相对位置是相对位置。校正后的发生器基于校正器的输出导出与预定相对位置相关联的特征值。

3. 发明申请

US20110037001A1 TERAHERTZ BEAM SCANNING APPARATUS AND METHOD THEREOF 失效
标题翻译： TERAHERTZ光束扫描装置及其方法
公开(公告)号：US20110037001A1
公开(公告)日：2011-02-17
申请号：US12989368
申请日：2009-04-21
申请人： Ken-ichiro Maki , Takayuki Shibuya , Chiko Otani , Kodo Kawase
发明人： Ken-ichiro Maki , Takayuki Shibuya , Chiko Otani , Kodo Kawase
IPC分类号： G02B26/10 , G02F1/35 , G02F1/29
CPC分类号： H01Q3/42 , G02F2203/13 , H01Q19/06 , H01Q19/062
摘要： To provide a terahertz beam scanning apparatus and method that can scan a terahertz beam at high speed over a wide angle. The terahertz beam scanning apparatus includes: a laser device 12 that generates a first laser beam 1 and a second laser beam 2 having different wavelengths; a laser optical system 14 that focuses the first laser beam 1 and the second laser beam 2 on a same common focal point 14b; and a terahertz generator 16 that is located at the common focal point and generates a terahertz beam 4 by difference frequency mixing. The laser optical system 14 is configured to be capable of changing a relative incidence θi between the first laser beam and the second laser beam to the terahertz generator.
摘要翻译：提供一种太赫兹波束扫描装置和方法，可以在广角上高速扫描太赫波束。太赫兹光束扫描装置包括：激光装置12，其产生具有不同波长的第一激光束1和第二激光束2; 将第一激光束1和第二激光束2聚焦在同一公共焦点14b上的激光光学系统14; 以及位于公共焦点处的太赫兹发生器16，通过差频混频产生太赫兹波束4。激光光学系统14被配置为能够将第一激光束和第二激光束之间的相对入射角与i之间的距离改变为太赫兹发生器。

4. 发明授权

US08119988B2 Collection-amount detection method for particulate matters and collection-amount detection apparatus therefor and exhaust-gas converting apparatus 失效
标题翻译：用于颗粒物的收集量检测方法及其收集量检测装置和排气转换装置
公开(公告)号：US08119988B2
公开(公告)日：2012-02-21
申请号：US12664427
申请日：2008-06-20
申请人： Shigeki Daido , Naohisa Oyama , Hitoshi Kato , Shinji Tsuji , Juji Suzuki , Takayuki Shibuya , Kodo Kawase
发明人： Shigeki Daido , Naohisa Oyama , Hitoshi Kato , Shinji Tsuji , Juji Suzuki , Takayuki Shibuya , Kodo Kawase
IPC分类号： G01J5/02
CPC分类号： B01D46/442 , B01D46/0063 , B01D46/0086 , B01D46/2418 , B01D2273/22 , B01D2279/30 , F01N3/025 , F01N9/002 , F01N2550/04 , F01N2560/05 , F01N2560/06 , F01N2560/08 , F01N2560/12 , Y02T10/47
摘要： A filter 2 for collecting PMs, a microwave transmitter 30 for emitting electromagnetic waves whose frequency is dozens of GHz-a few of THz onto the filter 2, a microwave receiver 31 for detecting an intensity of the electromagnetic waves that have transmitted through the filter 2, and a computing means for computing a collection amount of PMs from the intensity that has been detected with the microwave receiver 31 are included. Since it is possible to detect the distribution of the collection amount of PMs with good accuracy, it is possible to carry out a recycling process in a state where the collection amount does not become too much, and thereby it is possible to make a reducing-agent supply amount into exhaust gases minimum at the time of the recycling process.
摘要翻译：用于收集PM的滤波器2，用于发射频率为几十GHz的电磁波的微波发射器30，几个THz到滤波器2上的微波接收器31，用于检测通过滤波器2的电磁波的强度的微波接收器31 并且包括用于根据已经用微波接收器31检测到的强度来计算PM的收集量的计算装置。由于可以高精度地检测PM的收集量的分布，所以可以在收集量不会变得太多的状态下进行再循环处理，从而可以进行还原 - 在回收过程中，废气中的试剂供应量最小。

5. 发明申请

US20060219922A1 Method and equipment for judging target by tera heltz wave spectrometry 失效
标题翻译：用Tera赫兹波谱法判断目标的方法和设备
公开(公告)号：US20060219922A1
公开(公告)日：2006-10-05
申请号：US10550303
申请日：2004-03-18
申请人： Yuki Watanabe , Kodo Kawase , Tomofumi Ikari
发明人： Yuki Watanabe , Kodo Kawase , Tomofumi Ikari
IPC分类号： G01J5/02
CPC分类号： G01N21/3581 , G01N21/3563
摘要： A method includes a spectroscopic measurement step of pre-measuring a spectrum [S] of tera-hertz wave absorbencies of a target component for a plurality of frequencies ranging about from 1 THz to 3 THz, and an object spectroscopic step of irradiating an object with tera-hertz-waves of the plurality of frequencies to measure absorbencies I of the object. Presence and absence of the target component in the object is determined on the basis of the spectrum [S] of the absorbancy S and the spectrum [I] of the absorbancy I of the object.
摘要翻译：一种方法包括：分光测量步骤，用于对大约1THz至3THz范围内的多个频率预测目标分量的赫赫兹波吸收度的频谱[S]，以及用于将目标分光照射到多个频率的多赫兹波，以测量物体的吸光度I. 基于吸收率S的光谱[S]和物体的吸收度I的光谱[I]来确定物体中目标成分的存在和不存在。

6. 发明授权

US07291838B2 Apparatus and method for detecting scattered material by terahertz wave 有权
标题翻译：用太赫兹波检测散射材料的装置和方法
公开(公告)号：US07291838B2
公开(公告)日：2007-11-06
申请号：US11216153
申请日：2005-09-01
申请人： Kodo Kawase , Takayuki Shibuya , Yuichi Ogawa , Masahiro Yamashita
发明人： Kodo Kawase , Takayuki Shibuya , Yuichi Ogawa , Masahiro Yamashita
IPC分类号： G01J5/02
CPC分类号： G01V8/005 , G01N21/3563 , G01N21/3581
摘要： There is disclosed an apparatus comprising: a terahertz wave generation device which generates a terahertz wave; a terahertz wave irradiation device which irradiates an object to be inspected with the terahertz wave; and a scattering intensity detection device which cuts a rectilinear wave of the terahertz wave which has passed through the object to be inspected and which detects an intensity of a scattered wave, and a scattered material such as powder or foam contained in an envelope, a capsule, a container or the like is detected in a non-destructive manner without unsealing the envelope or the like.
摘要翻译：公开了一种装置，包括：产生太赫兹波的太赫兹波产生装置; 用太赫兹波照射被检查物体的太赫兹波照射装置; 以及散射强度检测装置，其切断已经通过被检查物体的太赫兹波的直线波，并检测散射波的强度，以及散布的物质，例如容纳在外壳中的粉末或泡沫，胶囊以非破坏性的方式检测容器等，而无需开封信封等。

7. 发明申请

US20060006886A1 Method and apparatus for diagnosing fault in semiconductor device 有权
标题翻译：用于诊断半导体器件故障的方法和装置
公开(公告)号：US20060006886A1
公开(公告)日：2006-01-12
申请号：US11038485
申请日：2005-01-21
申请人： Masatsugu Yamashita , Kodo Kawase , Masayoshi Tonouchi , Toshihiro Kiwa , Kiyoshi Nikawa
发明人： Masatsugu Yamashita , Kodo Kawase , Masayoshi Tonouchi , Toshihiro Kiwa , Kiyoshi Nikawa
IPC分类号： G01R31/305
CPC分类号： G01R31/311
摘要： An apparatus for diagnosing a fault in a semiconductor device includes an laser applying unit, a detection/conversion unit, and a fault diagnosis unit. The semiconductor device is held at a state where no bias voltage is applied thereto. The laser applying unit then applies a pulse laser beam having a predetermined wavelength to the semiconductor device so as to two-dimensionally scan the semiconductor device with the pulse laser beam. The detection/conversion unit detects an electromagnetic wave generated from a laser applied position in the semiconductor device, and converts the detected electromagnetic wave into a time-varying voltage signal that corresponds to a time-varying amplitude of an electric field of the electromagnetic wave. The fault diagnosis unit derives an electric field distribution in the semiconductor device on the basis of the time-varying voltage signal to perform fault diagnosis on the semiconductor device.
摘要翻译：用于诊断半导体器件中的故障的装置包括激光施加单元，检测/转换单元和故障诊断单元。半导体器件保持在不施加偏置电压的状态。激光施加单元然后将具有预定波长的脉冲激光束施加到半导体器件，以便用脉冲激光束对半导体器件进行二维扫描。检测/转换单元检测从半导体器件中的激光施加位置产生的电磁波，并将检测到的电磁波转换成对应于电磁波的电场的时变幅度的时变电压信号。故障诊断单元根据时变电压信号，在半导体装置中导出电场分布，对半导体装置进行故障诊断。

8. 发明申请

US20050116170A1 Method and apparatus for detecting materials 失效
标题翻译：检测材料的方法和装置
公开(公告)号：US20050116170A1
公开(公告)日：2005-06-02
申请号：US10953465
申请日：2004-09-30
申请人： Kodo Kawase , Yuuki Watanabe , Tomofumi Ikari
发明人： Kodo Kawase , Yuuki Watanabe , Tomofumi Ikari
IPC分类号： G01N21/35 , G01N21/3581 , G01N21/17
CPC分类号： G01N21/3581 , G01N21/3563 , G01N2021/3595
摘要： An apparatus for detecting materials includes a database for storing detecting spectra of detecting materials, and a tera-hertz wave applying unit for applying-tera-hertz waves having a plurality of different frequencies around a boundary between a light wave frequency and a radio wave frequency, to a predetermined position of an inspecting object. The apparatus includes an output wave receiving unit for receiving an output wave that is the tera-hertz wave having been applied to the inspecting object, and a determining unit for determining whether or not the output wave includes the detecting spectrum.
摘要翻译：用于检测材料的装置包括用于存储检测材料的检测光谱的数据库和用于在光波频率和无线电波频率之间的边界周围施加具有多个不同频率的赫赫兹波施加单元到达检查对象的预定位置。该装置包括：输出波接收单元，用于接收已经施加到检查对象的泰赫赫波的输出波;以及确定单元，用于确定输出波是否包括检测光谱。

9. 发明授权

US08121157B2 Terahertz beam scanning apparatus and method thereof 失效
标题翻译：太赫兹光束扫描装置及其方法
公开(公告)号：US08121157B2
公开(公告)日：2012-02-21
申请号：US12989368
申请日：2009-04-21
申请人： Ken-ichiro Maki , Takayuki Shibuya , Chiko Otani , Kodo Kawase
发明人： Ken-ichiro Maki , Takayuki Shibuya , Chiko Otani , Kodo Kawase
IPC分类号： H01S3/10
CPC分类号： H01Q3/42 , G02F2203/13 , H01Q19/06 , H01Q19/062
摘要： To provide a terahertz beam scanning apparatus and method that can scan a terahertz beam at high speed over a wide angle. The terahertz beam scanning apparatus includes: a laser device 12 that generates a first laser beam 1 and a second laser beam 2 having different wavelengths; a laser optical system 14 that focuses the first laser beam 1 and the second laser beam 2 on a same common focal point 14b; and a terahertz generator 16 that is located at the common focal point and generates a terahertz beam 4 by difference frequency mixing. The laser optical system 14 is configured to be capable of changing a relative incidence θi between the first laser beam and the second laser beam to the terahertz generator.
摘要翻译：提供一种太赫兹波束扫描装置和方法，可以在广角上高速扫描太赫波束。太赫兹光束扫描装置包括：激光装置12，其产生具有不同波长的第一激光束1和第二激光束2; 将第一激光束1和第二激光束2聚焦在同一公共焦点14b上的激光光学系统14; 以及位于公共焦点处的太赫兹发生器16，通过差频混频产生太赫兹波束4。激光光学系统14被配置为能够将第一激光束和第二激光束之间的相对入射角与i之间的距离改变为太赫兹发生器。

10. 发明授权

US07173447B2 Method and apparatus for diagnosing fault in semiconductor device 有权
标题翻译：用于诊断半导体器件故障的方法和装置
公开(公告)号：US07173447B2
公开(公告)日：2007-02-06
申请号：US11038485
申请日：2005-01-21
申请人： Masatsugu Yamashita , Kodo Kawase , Masayoshi Tonouchi , Toshihiro Kiwa , Kiyoshi Nikawa
发明人： Masatsugu Yamashita , Kodo Kawase , Masayoshi Tonouchi , Toshihiro Kiwa , Kiyoshi Nikawa
IPC分类号： G01R31/26
CPC分类号： G01R31/311
摘要： An apparatus for diagnosing a fault in a semiconductor device includes an laser applying unit, a detection/conversion unit, and a fault diagnosis unit. The semiconductor device is held at a state where no bias voltage is applied thereto. The laser applying unit then applies a pulse laser beam having a predetermined wavelength to the semiconductor device so as to two-dimensionally scan the semiconductor device with the pulse laser beam. The detection/conversion unit detects an electromagnetic wave generated from a laser applied position in the semiconductor device, and converts the detected electromagnetic wave into a time-varying voltage signal that corresponds to a time-varying amplitude of an electric field of the electromagnetic wave. The fault diagnosis unit derives an electric field distribution in the semiconductor device on the basis of the time-varying voltage signal to perform fault diagnosis on the semiconductor device.
摘要翻译：用于诊断半导体器件中的故障的装置包括激光施加单元，检测/转换单元和故障诊断单元。半导体器件保持在不施加偏置电压的状态。激光施加单元然后将具有预定波长的脉冲激光束施加到半导体器件，以便用脉冲激光束对半导体器件进行二维扫描。检测/转换单元检测从半导体器件中的激光施加位置产生的电磁波，并将检测到的电磁波转换成对应于电磁波的电场的时变幅度的时变电压信号。故障诊断单元根据时变电压信号，在半导体装置中导出电场分布，对半导体装置进行故障诊断。

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