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1. 发明授权

US07750654B2 Probe method, prober, and electrode reducing/plasma-etching processing mechanism 有权
标题翻译：探头方法，探针和电极还原/等离子体蚀刻处理机制
公开(公告)号：US07750654B2
公开(公告)日：2010-07-06
申请号：US11068973
申请日：2005-03-02
申请人： Katsuya Okumura , Shigekazu Komatsu , Yuichi Abe , Kunihiro Furuya , Vincent Vezin , Kenichi Kubo
发明人： Katsuya Okumura , Shigekazu Komatsu , Yuichi Abe , Kunihiro Furuya , Vincent Vezin , Kenichi Kubo
IPC分类号： G01R31/02
CPC分类号： G01R31/2898
摘要： A probe method of this invention includes a step of reducing an electrode of a wafer by using a forming gas, and a step of bringing the electrode and a probe pin into contact with each other in a dry atmosphere. The probe method further includes, prior to a reducing process of an electrode of the object to be tested, placing the object to be tested in an inert gas atmosphere and heating the object to be tested. The reducing process is performed by bringing a reducing gas into contact with the electrode of the object to be tested under atmospheric pressure.
摘要翻译：本发明的探针方法包括通过使用成形气体来还原晶片的电极的步骤，以及在干燥气氛中使电极和探针彼此接触的步骤。探针方法还包括在待测试物体的电极的还原过程之前，将待测物体放置在惰性气体气氛中并加热被测物体。通过在大气压下使还原气体与待测试物体的电极接触来进行还原过程。

2. 发明申请

US20050151549A1 Probe method, prober, and electrode reducing/plasma-etching processing mechanism 有权
标题翻译：探头方法，探针和电极还原/等离子体蚀刻处理机制
公开(公告)号：US20050151549A1
公开(公告)日：2005-07-14
申请号：US11068973
申请日：2005-03-02
申请人： Katsuya Okumura , Shigekazu Komatsu , Yuichi Abe , Kunihiro Furuya , Vincent Vezin , Kenichi Kubo
发明人： Katsuya Okumura , Shigekazu Komatsu , Yuichi Abe , Kunihiro Furuya , Vincent Vezin , Kenichi Kubo
IPC分类号： G01R31/02 , G01R31/28
CPC分类号： G01R31/2898
摘要： A probe method of this invention includes a step of reducing an electrode of a wafer by using a forming gas, and a step of bringing the electrode and a probe pin into contact with each other in a dry atmosphere. The probe method further includes, prior to a reducing process of an electrode of the object to be tested, placing the object to be tested in an inert gas atmosphere and heating the object to be tested. The reducing process is performed by bringing a reducing gas into contact with the electrode of the object to be tested under atmospheric pressure.
摘要翻译：本发明的探针方法包括通过使用成形气体来还原晶片的电极的步骤，以及在干燥气氛中使电极和探针彼此接触的步骤。探针方法还包括在待测试物体的电极的还原过程之前，将待测物体放置在惰性气体气氛中并加热被测物体。通过在大气压下使还原气体与待测试物体的电极接触来进行还原过程。

3. 发明授权

US08971627B2 Template matching processing device and template matching processing program 有权
标题翻译：模板匹配处理设备和模板匹配处理程序
公开(公告)号：US08971627B2
公开(公告)日：2015-03-03
申请号：US13696260
申请日：2011-03-17
申请人： Jun'ichi Taguchi , Mitsuji Ikeda , Yuichi Abe , Masahiro Kitazawa , Wataru Nagatomo
发明人： Jun'ichi Taguchi , Mitsuji Ikeda , Yuichi Abe , Masahiro Kitazawa , Wataru Nagatomo
IPC分类号： G06K9/00 , G06K9/62 , G01B11/00 , G01B15/00 , G06T7/00 , H01L21/66
CPC分类号： G06K9/6201 , G01B11/00 , G01B15/00 , G06K9/6202 , G06T7/001 , G06T7/74 , G06T2207/30148 , H01L22/12 , H01L2924/0002 , H01L2924/00
摘要： The present invention is a template matching processing device capable of evaluating a similarity degree which supports even a case of intensive morphological change between a design image and a photographic image. In the template matching processing device, matching processing between the design image and the photographic image is performed, a partial design image is obtained by clipping a portion having the highest correlation (step 101), and processing for deforming the photographic image in accordance with the clipped design image (steps 102 to 105) is performed, so that correlation between the deformed image obtained and the design image is taken to be set as the similarity degree.
摘要翻译：本发明是一种模拟匹配处理装置，其能够评价即使在设计图像和摄影图像之间形成密集的情况的情况下也能够支持的相似度。在模板匹配处理装置中，进行设计图像与摄影图像之间的匹配处理，通过剪切具有最高相关性的部分（步骤101）获得部分设计图像，以及根据执行剪辑设计图像（步骤102至105），使得获得的变形图像与设计图像之间的相关性被设置为相似度。

4. 发明申请

US20140219545A1 SEMICONDUCTOR INSPECTION SYSTEM 有权
标题翻译：半导体检测系统
公开(公告)号：US20140219545A1
公开(公告)日：2014-08-07
申请号：US14234977
申请日：2012-07-20
申请人： Akiyuki Sugiyama , Yuichi Abe
发明人： Akiyuki Sugiyama , Yuichi Abe
IPC分类号： G06T7/00
CPC分类号： G06T7/001 , G01B15/08 , H01L22/12 , H01L2924/0002 , H01L2924/00
摘要： When the lengths of FEM wafers are automatically measured, not only the sizes of targets, the lengths of which are to be measured, are often varied from those in registration, but also the patterns of the targets are often deformed. Therefore, it is difficult to automatically determine whether the length measurement is possible or not. Therefore, the following are executed with a semiconductor inspection system: (1) a process of identifying the position of the contour line of an inspected image using a distance image calculated from a reference image, (2) a process of calculating a defect size image based on the position of the contour line with respect to the identified distance image, and detecting a defect candidate from the defect size image, and (3-1) a process of, upon detection of the defect candidate, calculating the size of the detected defect candidate, or (3-2) a process of detecting a portion different between the first and second contour lines as the defect candidate.
摘要翻译：当自动测量有限元晶片的长度时，不仅要测量其长度的目标的尺寸通常与注册的尺寸不同，而且目标的图案也经常变形。因此，难以自动确定长度测量是否可行。因此，使用半导体检查系统执行以下操作：（1）使用从参考图像计算的距离图像来识别被检查图像的轮廓线的位置的处理，（2）计算缺陷尺寸图像的处理基于所述轮廓线相对于所识别的距离图像的位置，以及从所述缺陷尺寸图像检测缺陷候选，以及（3-1）在检测到所述缺陷候选时，计算所检测到的所述缺陷候选的大小的处理缺陷候选者，或（3-2）检测第一和第二轮廓线之间的部分的缺陷候选的处理。

5. 发明申请

US20140023265A1 PATTERN MATCHING APPARATUS AND COMPUTER PROGRAM 审中-公开
标题翻译：图案匹配装置和计算机程序
公开(公告)号：US20140023265A1
公开(公告)日：2014-01-23
申请号：US13981963
申请日：2011-12-07
申请人： Masahiro Kitazawa , Mitsuji Ikeda , Yuichi Abe , Junichi Taguchi , Wataru Nagatomo
发明人： Masahiro Kitazawa , Mitsuji Ikeda , Yuichi Abe , Junichi Taguchi , Wataru Nagatomo
IPC分类号： G06T7/00
CPC分类号： G06T7/0004 , G06T7/001 , G06T2207/10061 , G06T2207/30148 , H01L22/12
摘要： It is an object of the present invention to provide a semiconductor inspection apparatus capable of well carrying out position alignment and correctly determining whether the position alignment has been carried out successfully or has ended in a failure without operator interventions even if an inspected image is an image having few characteristics as is the case with a repetitive pattern or the inspected image is an image having a complicated shape.The semiconductor inspection apparatus includes means for imaging a shape on a wafer or on an exposure mask; means for storing an image inspected by the imaging means; means for storing design data of the semiconductor circuit corresponding to a position on the wafer or on the exposure mask which are to be imaged by the imaging means; means for storing a design-data image obtained as a result of converting the design data into an image; means for generating a design-data ROI image by converting an interest drawing region found from a relative crude-density relation of a shape included in the design-data image into an image; and a position alignment section configured to carry out position alignment on the inspected image and the design-data image. The semiconductor inspection apparatus makes use of the design-data ROI image in order to identify a position at which the inspected image and the design-data image match each other or compute the degree of coincidence.
摘要翻译：本发明的目的是提供一种半导体检查装置，即使被检查的图像是图像，也能够良好地执行位置对准并且正确地确定位置对准是否已经成功地执行或者在没有操作者干预的情况下已经结束具有与重复图案的情况相同的特性，或被检查图像是具有复杂形状的图像。半导体检查装置包括用于对晶片或曝光掩模上的形状进行成像的装置; 用于存储由成像装置检查的图像的装置; 用于存储对应于要由成像装置成像的晶片或曝光掩模上的位置的半导体电路的设计数据的装置; 用于存储作为将设计数据转换为图像而获得的设计数据图像的装置; 用于通过将从所述设计数据图像中包含的形状的相对粗密度关系中找到的兴趣绘制区域转换为图像来生成设计数据ROI图像的装置; 以及位置对准部，被配置为在被检查图像和设计数据图像上执行位置对准。半导体检查装置利用设计数据ROI图像来识别被检查图像和设计数据图像彼此匹配的位置或计算符合度。

6. 发明申请

US20140016824A1 DEVICE AND METHOD FOR DETECTING ANGLE OF ROTATION FROM NORMAL POSITION OF IMAGE 有权
标题翻译：用于检测图像正常位置的旋转角的装置和方法
公开(公告)号：US20140016824A1
公开(公告)日：2014-01-16
申请号：US14005913
申请日：2011-11-09
申请人： Jun'ichi Taguchi , Mitsuji Ikeda , Yuichi Abe , Masahiro Kitazawa
发明人： Jun'ichi Taguchi , Mitsuji Ikeda , Yuichi Abe , Masahiro Kitazawa
IPC分类号： G06T7/00
CPC分类号： G06T7/0004 , G06K9/3275
摘要： An evaluation value indicative of the extent of lines in each direction is calculated for a pre-processed image in which 0s are filled in and extended in the lateral direction of the inputted image and which has been reduced ⅛th in the longitudinal direction. To obtain the angle of rotation of an image from the change in the evaluation value obtained while the angle relative to the lateral direction of the pre-processed image is modified in small steps, a parallel line is drawn for each direction, a projection is taken, and the sum of squares serves as the evaluation value of the direction. The direction having the highest evaluation value serves as the obtained direction of rotation from the normal position. The projection of each direction references the point of intersection between the parallel line drawn for each direction and the coordinate line of the horizontal axis.
摘要翻译：对于其中0被填充并在输入图像的横向方向上延伸并且在纵向方向上减少1/8的预处理图像来计算指示每个方向的行程度的评估值。为了在以小步骤修改相对于预处理图像的横向方向的角度获得的评估值的变化中获得图像的旋转角度，对于每个方向绘制平行线，进行投影，并且平方和作为方向的评价值。具有最高评估值的方向用作从正常位置获得的旋转方向。每个方向的投影参考在每个方向绘制的平行线与水平轴的坐标线之间的交点。

7. 发明申请

US20120207397A1 Pattern Matching Method and Pattern Matching Apparatus 有权
标题翻译：模式匹配方法和模式匹配装置
公开(公告)号：US20120207397A1
公开(公告)日：2012-08-16
申请号：US13502823
申请日：2010-10-06
申请人： Wataru Nagatomo , Yuichi Abe , Mitsuji Ikeda
发明人： Wataru Nagatomo , Yuichi Abe , Mitsuji Ikeda
IPC分类号： G06K9/68
CPC分类号： G06K9/6203 , G06K9/6253 , G06K9/6255 , G06K9/6857 , G06T7/74 , G06T2207/10061 , G06T2207/20016 , G06T2207/30148 , H01J2237/221 , H01J2237/226
摘要： Provided is a template matching method and a template matching apparatus, where the degree of matching between a template and the actual image upon template matching is maintained at a high level, without depending on a partial appearance of a lower layer. Proposed as one embodiment, is a method and an apparatus for template matching, where either an area is set in which comparison of the template and the image is not conducted, or a second area is set inside the template where comparison different from comparison conducted in a first comparison area is to be conducted, and the template matching is conducted on the basis either of comparison excluding the non-comparison area, or of comparison using the first and second areas.
摘要翻译：提供了一种模板匹配方法和模板匹配装置，其中模板匹配之间的模板和实际图像之间的匹配程度保持在高水平，而不依赖于较低层的部分外观。作为一个实施例，提出了一种用于模板匹配的方法和装置，其中设置了不进行模板和图像的比较的区域，或者在模板内部设置第二区域，其中比较不同于进行比较将进行第一比较区域，并且基于除非比较区域之外的比较或使用第一和第二区域的比较进行模板匹配。

8. 发明授权

US08091027B2 Content playback apparatus, content playback method and storage medium 有权
标题翻译：内容播放装置，内容播放方法和存储介质
公开(公告)号：US08091027B2
公开(公告)日：2012-01-03
申请号：US11654730
申请日：2007-01-18
申请人： Takatoshi Nakamura , Yuichi Abe , Yoichiro Sako , Masamichi Asukai , Mitsuru Takehara , Katsuya Shirai , Toru Sasaki , Toshiro Terauchi
发明人： Takatoshi Nakamura , Yuichi Abe , Yoichiro Sako , Masamichi Asukai , Mitsuru Takehara , Katsuya Shirai , Toru Sasaki , Toshiro Terauchi
IPC分类号： G06F3/16 , G06F3/00
CPC分类号： G06F3/04842 , G05B15/02 , G06F3/04817 , G06F3/0482 , G11B19/025 , G11B27/105 , G11B27/34
摘要： A content playback apparatus includes: a display section that displays a plurality of indicators associated with a plurality of pieces of content, and a specifier to be used to specify one of the indicators; a playback section that plays back the piece of content associated with the indicator specified by the specifier; a switch section that switches, in accordance with a user's operation, what the specifier specifies to new the indicator; and a playback control section that controls the playback section such that if the user's operation switches, while the piece of content associated with the indicator specified by the specifier is played, what the specifier specifies to next the indicator and the user's subsequent operation switches, within a predetermined period of time from when the previous switch is completed, what the specifier specifies to subsequent the indicator, the playback section keeps playing back the piece of content.
摘要翻译：内容再现装置包括：显示部，其显示与多条内容相关联的多个指示符;以及指定符，用于指定其中一个指示符; 播放部分，其播放与由说明符指定的指示符相关联的内容; 切换部，其根据用户的操作切换指定者对新的指示符指定的内容; 以及播放控制部分，其控制重放部分，使得如果用户的操作切换，当与由说明符指定的指示符相关联的内容被播放时，说明符指定下一个指示符和用户的后续操作切换，从上次切换完成之后的预定时间段，说明符对随后的指示符指定什么，播放部分继续播放该片内容。

9. 发明申请

US20110119356A1 DATA PROCESSING SYSTEM, DATA PROCESSING APPARATUS, PROGRAM, AND DATA PROCESSING METHOD 有权
标题翻译：数据处理系统，数据处理设备，程序和数据处理方法
公开(公告)号：US20110119356A1
公开(公告)日：2011-05-19
申请号：US12943383
申请日：2010-11-10
申请人： Yuichi Abe
发明人： Yuichi Abe
IPC分类号： G06F15/16
CPC分类号： G06F17/30893
摘要： There is provided a data processing system including a server device for providing Web data having a data portion with a specific identifier, and a data processing apparatus having a receiving unit for receiving the Web data from the server device, an analysis unit for analyzing the Web data to extract the specific identifier from the Web data, and a data processing unit for changing the data portion with the specific identifier based on local data.
摘要翻译：提供了一种数据处理系统，包括用于提供具有特定标识符的数据部分的Web数据的服务器设备，以及具有用于从服务器设备接收Web数据的接收单元的数据处理设备，用于分析Web的分析单元用于从Web数据中提取特定标识符的数据，以及用于基于本地数据用特定标识符改变数据部分的数据处理单元。

10. 发明授权

US07678983B2 Music edit device, music edit information creating method, and recording medium where music edit information is recorded 有权
标题翻译：音乐编辑装置，音乐编辑信息创建方法以及记录音乐编辑信息的记录介质
公开(公告)号：US07678983B2
公开(公告)日：2010-03-16
申请号：US12093059
申请日：2006-12-07
申请人： Akihiro Komori , Kosei Yamashita , Yasushi Miyajima , Motoyuki Takai , Norikazu Hiraki , Yuichi Abe
发明人： Akihiro Komori , Kosei Yamashita , Yasushi Miyajima , Motoyuki Takai , Norikazu Hiraki , Yuichi Abe
IPC分类号： G06F7/00
CPC分类号： G10H1/0025 , G10H2210/125 , G10H2220/081 , G10H2240/016 , G10H2240/325 , G11B27/034 , G11B27/105 , G11B27/322
摘要： A music editing apparatus that can accomplish editing of superimposing or connecting whole or part of each of many songs such that their beats adjusted is provided. The music editing apparatus includes a remix processing section which performs a remix process based on both meta data that are pre-generated corresponding to song data and that contain at least a time-based beat position and a file for deciding a remix pattern; a synchronizing reproduction controlling section which generates a master beat, sends the master beat to the remix processing section, and reproduces a plurality of songs based on individual entries of the meta data according to the remix process that the remix processing section has designated corresponding to the remix pattern and the meta data; and a mixing section which mixes songs reproduced by the synchronizing reproduction controlling section. The remix processing section performs the remix process based on a remix pattern file structured as hierarchical layers each of which has a control parameter portion and a data entity portion.
摘要翻译：一种音乐编辑装置，其能够完成对多个歌曲的整体或部分的叠加或连接进行编辑，从而提供其调节的节拍。音乐编辑装置包括：再混合处理部，其基于与歌曲数据相对应地预先生成的元数据，并且至少包含基于时间的拍子位置和用于决定混音图案的文件，进行混音处理; 产生主节奏的同步再现控制部分将主节拍发送到再混合处理部分，并且根据重新混音处理部分已经指定的与该元数据对应的再混合处理，基于元数据的各个条目再现多首歌曲 remix模式和元数据; 以及混合部分，其混合由同步再现控制部分再现的歌曲。再混合处理部分，根据构成为具有控制参数部分和数据实体部分的分级层的再混合图案文件执行混音处理。

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