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    • 4. 发明授权
    • Method and device for measuring reflected optical radiation
    • 用于测量反射光辐射的方法和装置
    • US07492461B2
    • 2009-02-17
    • US11188079
    • 2005-07-21
    • Raymond T. HebertJoel M. BlattJoseph T. Widunas
    • Raymond T. HebertJoel M. BlattJoseph T. Widunas
    • G01N21/47
    • G01N21/8483G01N21/253
    • The present invention provides an optics assembly, a reflectometer, and a diagnostic device for providing quantitative measurement of optical radiation reflected from a sampling area on an assay matrix. The reflectometer includes an optical radiation source and a detector. The optical radiation source and the detector are mounted in a single plane. An optics assembly is configured to direct the illumination from the optical radiation source to the sampling area on the assay matrix and to direct the radiation diffusely reflected from the sampling area to the detector. The optics assembly is positioned over the face of the circuit board having the optical radiation source and detector mounted directly thereto. The present invention also provides a method for determining the presence of one or more selected analytes in a sample employing a plurality of sampling areas on one or more assay matrixes.
    • 本发明提供了一种用于提供从测定矩阵上的取样区域反射的光辐射的定量测量的光学组件,反射计和诊断装置。 反射计包括光辐射源和检测器。 光学辐射源和检测器安装在单个平面中。 光学组件被配置为将来自光辐射源的照明引导到测定矩阵上的采样区域并且将从采样区域漫反射的辐射引导到检测器。 光学组件位于具有直接安装在其上的光辐射源和检测器的电路板的表面上。 本发明还提供了一种用于确定在一个或多个测定矩阵上使用多个采样区域的样品中一种或多种选择的分析物的存在的方法。
    • 6. 发明授权
    • Electronic assay device and method
    • 电子测定装置及方法
    • US5837546A
    • 1998-11-17
    • US657894
    • 1996-06-07
    • Michael P. AllenJoel M. BlattJoseph T. Widunas
    • Michael P. AllenJoel M. BlattJoseph T. Widunas
    • G01N21/78G01N21/86G01N27/04G01N27/327G01N33/543G01N37/00
    • G01N21/8483G01N33/5438B01L2400/0406
    • The present invention provides an assay device for determining the presence of one or more selected analytes in a sample. The device includes a housing having an exterior surface and defining an interior area. A sample receptor receives the sample. A sample treatment strip reacts the sample with a reagent to yield a physically detectable change which correlates with the amount of selected analyte in the sample. A detector responds to the physically detectable change and produces an electrical signal which correlates to the amount of the selected analyte in the sample. A processor converts the electrical signal to a digital output. A starter automatically activates the processor and detector upon the application of the sample to the device. A display visually displays the digital output external to the housing and is connected to the processor. The present invention also provides a method for determining the presence of one or more selected analytes in a sample within a disposable housing, automatically starting a diagnostic device to analyze a sample, and displaying quantitative assay results for a plurality of selected analytes in a sample on a diagnostic device.
    • 本发明提供了用于确定样品中一种或多种选择的分析物的存在的测定装置。 该装置包括具有外表面并限定内部区域的壳体。 样品受体接收样品。 样品处理带使样品与试剂反应,产生与样品中所选分析物的量相关的物理可检测的变化。 检测器响应于物理上可检测的变化并产生与样品中所选分析物的量相关的电信号。 处理器将电信号转换为数字输出。 当样品应用于设备时,起动器会自动激活处理器和检测器。 显示器可视地显示外壳外部的数字输出并连接到处理器。 本发明还提供了一种用于确定一次性外壳内的样品中一种或多种所选分析物的存在的方法,自动启动诊断装置以分析样品,以及显示样品中多个选定分析物的定量测定结果 诊断装置。
    • 8. 发明授权
    • Method and device for measuring reflected optical radiation
    • 用于测量反射光辐射的方法和装置
    • US08045169B2
    • 2011-10-25
    • US12235371
    • 2008-09-22
    • Raymond T. HebertJoel M. BlattJoseph T. Widunas
    • Raymond T. HebertJoel M. BlattJoseph T. Widunas
    • G01N21/55
    • G01N21/8483G01N21/253
    • The present invention provides an optics assembly, a reflectometer, and a diagnostic device for providing quantitative measurement of optical radiation reflected from a sampling area on an assay matrix. The reflectometer includes an optical radiation source and a detector. The optical radiation source and the detector are mounted in a single plane. An optics assembly is configured to direct the illumination from the optical radiation source to the sampling area on the assay matrix and to direct the radiation diffusely reflected from the sampling area to the detector. The optics assembly is positioned over the face of the circuit board having the optical radiation source and detector mounted directly thereto. The present invention also provides a method for determining the presence of one or more selected analytes in a sample employing a plurality of sampling areas on one or more assay matrixes.
    • 本发明提供了一种用于提供从测定矩阵上的取样区域反射的光辐射的定量测量的光学组件,反射计和诊断装置。 反射计包括光辐射源和检测器。 光学辐射源和检测器安装在单个平面中。 光学组件被配置为将来自光辐射源的照明引导到测定矩阵上的采样区域并且将从采样区域漫反射的辐射引导到检测器。 光学组件位于具有直接安装在其上的光辐射源和检测器的电路板的表面上。 本发明还提供了一种用于确定在一个或多个测定矩阵上使用多个采样区域的样品中一种或多种选择的分析物的存在的方法。
    • 9. 发明申请
    • Method and Device For Measuring Reflected Optical Radiation
    • 用于测量反射光辐射的方法和装置
    • US20090027682A1
    • 2009-01-29
    • US12235371
    • 2008-09-22
    • Raymond T. HebertJoel M. BlattJoseph T. Widunas
    • Raymond T. HebertJoel M. BlattJoseph T. Widunas
    • G01N21/55
    • G01N21/8483G01N21/253
    • The present invention provides an optics assembly, a reflectometer, and a diagnostic device for providing quantitative measurement of optical radiation reflected from a sampling area on an assay matrix. The reflectometer includes an optical radiation source and a detector. The optical radiation source and the detector are mounted in a single plane. An optics assembly is configured to direct the illumination from the optical radiation source to the sampling area on the assay matrix and to direct the radiation diffusely reflected from the sampling area to the detector. The optics assembly is positioned over the face of the circuit board having the optical radiation source and detector mounted directly thereto. The present invention also provides a method for determining the presence of one or more selected analytes in a sample employing a plurality of sampling areas on one or more assay matrixes.
    • 本发明提供了一种用于提供从测定矩阵上的取样区域反射的光辐射的定量测量的光学组件,反射计和诊断装置。 反射计包括光辐射源和检测器。 光学辐射源和检测器安装在单个平面中。 光学组件被配置为将来自光辐射源的照明引导到测定矩阵上的采样区域并且将从采样区域漫反射的辐射引导到检测器。 光学组件位于具有直接安装在其上的光辐射源和检测器的电路板的表面上。 本发明还提供了一种用于确定在一个或多个测定矩阵上使用多个采样区域的样品中一种或多种选择的分析物的存在的方法。