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1. 发明专利

JP2013205252A Film thickness measurement method, measurement device, film thickness change measurement method and measurement device 审中-公开
标题翻译：薄膜厚度测量方法，测量装置，薄膜厚度变化测量方法和测量装置
公开(公告)号：JP2013205252A
公开(公告)日：2013-10-07
申请号：JP2012075100
申请日：2012-03-28
申请人： Chiba Univ , 国立大学法人千葉大学 , Kansai Paint Co Ltd , 関西ペイント株式会社
发明人： SHIINA TATSUO , MORI KENJI , NAKAOKA TOYOHITO
IPC分类号： G01B11/06
摘要： PROBLEM TO BE SOLVED: To provide a film thickness measurement method that can measure a film thickness of a coated film with high accuracy and in a short time.SOLUTION: A method of irradiating a coated film 4 with light from a light source 1 and determining a thickness of the coated film 4 by detecting an intensity of interference light including reflection light from the coated film 4 comprises: a branch step of branching the light from the light source 1 into reference light and incident light to the coated film 4; an interference step of causing the reflection light from the coated film 4 and the reference light to be interfered with each other by adjusting an optical distance of the reference light; a detection step of detecting a plurality of intensity signals generated by the interference of the reflection light from the coated film 4 and the reference light; and a film thickness calculation step of calculating the thickness of the coated film 4 from an interval between adjacent peaks of a plurality of detected intensity signals. The coated film 4 may be an optical curing resin or an electron beam curing resin.
摘要翻译：要解决的问题：提供一种能够以高精度和短时间测量涂膜的膜厚的膜厚测量方法。解决方案：一种用来自光源1的光照射涂覆膜4并确定通过检测包括来自涂覆膜4的反射光的干涉光的强度，涂覆膜4的厚度包括：将来自光源1的光分支为参考光和入射光到分散膜4的分支步骤; 通过调整参考光的光学距离来使来自涂膜4和参考光的反射光彼此干涉的干涉步骤; 检测步骤，检测由来自涂膜4和参考光的反射光的干涉产生的多个强度信号; 以及膜厚计算步骤，从多个检测强度信号的相邻峰之间的间隔计算涂膜4的厚度。涂膜4可以是光固化树脂或电子束固化树脂。

2. 发明专利

JP2013200165A Probe cap and probe 有权
标题翻译：探索CAP和探索
公开(公告)号：JP2013200165A
公开(公告)日：2013-10-03
申请号：JP2012067570
申请日：2012-03-23
申请人： Kansai Paint Co Ltd , 関西ペイント株式会社
发明人： MORI KENJI , NAKAOKA TOYOHITO
IPC分类号： G01N21/01
摘要： PROBLEM TO BE SOLVED: To provide a probe cap and a probe capable of facilitating accurate inquiry.SOLUTION: A probe cap 1 to be mounted on a probe 10 for inquiring an object to be inquired includes: a cap body 2; a contact face 3 formed at an end portion of the cap body 2; and a light guide path formed inside the cap body 2. The contact face 3 is bent along one direction X, and the light guide path includes an opening part 40 extending to the contact face 3 and opened at the contact face 3, and linearly extends along a normal direction Z of the contact face 3 in the opening part 40.
摘要翻译：要解决的问题：提供能够促进准确查询的探针盖和探针。解决方案：安装在探针10上用于询问被查询物体的探针盖1包括：盖体2; 形成在盖主体2的端部的接触面3; 以及形成在盖主体2内的导光路径。接触面3沿着一个方向X弯曲，导光路径包括延伸到接触面3并在接触面3处开口的开口部40，并且线性延伸沿开口部40的接触面3的法线方向Z。

3. 发明专利

JP2011147916A Method for forming multilayer coating film having high chroma, and coated object 有权
标题翻译：形成具有高色度的多层涂膜的方法和涂层物体
公开(公告)号：JP2011147916A
公开(公告)日：2011-08-04
申请号：JP2010013328
申请日：2010-01-25
申请人： Kansai Paint Co Ltd , Toyota Motor Corp , トヨタ自動車株式会社 , 関西ペイント株式会社
发明人： HAYATA YUKI , NISHIMURA AKIRA , MORI KENJI , OMURA MASAHIRO , NAKAO YASUSHI
IPC分类号： B05D1/36 , B05D5/06 , B05D7/24 , B32B27/20 , C09D5/02 , C09D5/29 , C09D7/12 , C09D201/00
摘要： PROBLEM TO BE SOLVED: To provide a multilayer coating film having high chroma and deep design properties.
SOLUTION: The multilayer coating film includes, at the least, an intermediate coating film formed on the object to be coated, a first base coating film formed on the intermediate coating film, a second base coating film formed on the first base coating film, and a clear coating film formed on the second base coating film. A method for forming the multilayer coating film comprises, a first base coating film forming step, a second base coating film forming step, a clear coating film forming step, and a baking step. The concentration of the coating material solid content contained in a first water-based base coating material is within 5-15 mass% of the total mass of the first water-based base coating material, the concentration of the coating material solid content contained in a second water-based base coating material is within 15-45 mass% of the total mass of the second water-based base coating material, the film thickness of the first base coating film, which has such a state that a base resin and a curing agent are cured and dried, is within 2-8 μm and the ratio of the film thickness of the first base coating film, which has such the state that the base resin and the curing agent are cured and dried, to that of the second base coating film, which has such the state that the base resin and the curing agent are cured and dried, is within 1:1.5 to 1:6.
COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：提供具有高色度和深度设计特性的多层涂膜。解决方案：多层涂膜至少包括形成在被涂物上的中间涂膜，形成在中间涂膜上的第一基涂膜，形成在第一基涂层上的第二基涂膜膜和形成在第二基底涂膜上的透明涂膜。形成多层涂膜的方法包括：第一基底涂膜形成步骤，第二基底涂膜形成步骤，透明涂膜形成步骤和烘烤步骤。包含在第一水性基础涂料中的涂料固体含量的浓度在第一水性基础涂料的总质量的5-15质量％以内，包含在第二水性基础涂料在第二水性基础涂料的总质量的15-45质量％之内，第一基底涂膜的膜厚，其具有基础树脂和固化物固化和干燥的试剂在2-8μm范围内，并且具有使基础树脂和固化剂固化和干燥的状态的第一基底涂膜的膜厚比与第二基材的膜厚具有使基础树脂和固化剂固化和干燥的状态的涂膜在1:1.5至1:6之间。版权所有（C）2011，JPO＆INPIT

4. 发明专利

JP2013205253A Film thickness measurement method and film thickness measurement device 有权
标题翻译：薄膜厚度测量方法和薄膜厚度测量装置
公开(公告)号：JP2013205253A
公开(公告)日：2013-10-07
申请号：JP2012075116
申请日：2012-03-28
申请人： Chiba Univ , 国立大学法人千葉大学 , Kansai Paint Co Ltd , 関西ペイント株式会社
发明人： SHIINA TATSUO , MORI KENJI , NAKAOKA TOYOHITO
IPC分类号： G01B11/06 , G01N21/45
摘要： PROBLEM TO BE SOLVED: To provide a film thickness measurement method that can measure a thickness of a coated film with high accuracy and in a short time without preliminary measuring a refractive index.SOLUTION: The film thickness measurement method comprises the steps of: branching measurement light from a light source into reference light and incident light to a reference air layer bd having a predetermined thickness; causing reflection light from the reference air layer bd and the reference light to be interfered with each other, detecting a plurality of intensity signals generated by the interference and determining an optical distance BD corresponding to a thickness of the reference air layer bd from an interval between adjacent peaks to the intensity signal; mounting the coated film in the reference air layer bd, and defining a first air layer bc'; causing reflection light from the first air layer bc' and the reference light to be interfered with each other and detecting a plurality of intensity signals generated by the interference; determining an optical distance BC' corresponding to a thickness of the first air layer bc' from an interval between adjacent peaks to the intensity signal; and calculating a thickness c'd of the coated film from the optical distance BD of the reference air layer and the optical distance BC' of the first air layer.
摘要翻译：要解决的问题：提供可以在不预先测量折射率的情况下以高精度和短时间测量涂膜的厚度的膜厚度测量方法。解决方案：膜厚测量方法包括以下步骤：分支测量从光源到参考光和入射光到具有预定厚度的参考空气层bd的光; 引起来自参考空气层bd和参考光的反射光彼此干涉，检测由干涉产生的多个强度信号，并根据参考空气层bd的厚度确定与参考空气层bd的厚度相对应的光学距离BD，相邻峰值与强度信号; 将涂膜安装在参考空气层bd中，并限定第一空气层bc'; 使得来自第一空气层bc'和参考光的反射光彼此干涉并检测由干涉产生的多个强度信号; 从相邻峰之间的间隔与强度信号确定对应于第一空气层bc'的厚度的光学距离BC'; 并根据参考空气层的光学距离BD和第一空气层的光学距离BC'计算涂膜的厚度c'd。

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