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    • 1. 发明授权
    • System and method for testing a link control card
    • 用于测试链路控制卡的系统和方法
    • US07479781B2
    • 2009-01-20
    • US11440318
    • 2006-05-24
    • Kang WuWei ZhangJun HuangLi Ding
    • Kang WuWei ZhangJun HuangLi Ding
    • G01R31/00
    • H04L43/50
    • A system and method for testing a Link Control Card (LCC) of a storage device includes a host, a middle plane (MP), a switch, and a testing device array. The host is connected to the testing device array for sending out command sets and receiving results. The MP is connected between the LCC and the testing device array. The switch determines the LCC to output hard reset signals and the hard reset signals are transferred to the testing device array via the MP. The testing device array includes a plurality of testing devices, and each of the testing devices includes a micro-controller unit (MCU); a connector being connected to the MCU, and coupled to the MP; an address setting unit being connected to the MCU, for setting an unique address of each of the testing devices; and a first interface being connected to the MCU for outputting results.
    • 用于测试存储设备的链路控制卡(LCC)的系统和方法包括主机,中间平面(MP),交换机和测试设备阵列。 主机连接到测试设备阵列,用于发送命令集和接收结果。 MP连接在LCC和测试设备阵列之间。 该开关确定LCC输出硬复位信号,硬复位信号通过MP传输到测试器件阵列。 测试装置阵列包括多个测试装置,并且每个测试装置包括微控制器单元(MCU); 连接器连接到MCU,并连接到MP; 连接到MCU的地址设置单元,用于设置每个测试设备的唯一地址; 以及连接到MCU的第一接口,用于输出结果。
    • 2. 发明申请
    • System and method for testing a link control card
    • 用于测试链路控制卡的系统和方法
    • US20070109002A1
    • 2007-05-17
    • US11440318
    • 2006-05-24
    • Kang WuWei ZhangJun HuangLi Ding
    • Kang WuWei ZhangJun HuangLi Ding
    • G01R31/02
    • H04L43/50
    • A system and method for testing a Link Control Card (LCC) of a storage device includes a host, a middle plane (MP), a switch, and a testing device array. The host is connected to the testing device array for sending out command sets and receiving results. The MP is connected between the LCC and the testing device array. The switch determines the LCC to output hard reset signals and the hard reset signals are transferred to the testing device array via the MP. The testing device array includes a plurality of testing devices, and each of the testing devices includes a micro-controller unit (MCU); a connector being connected to the MCU, and coupled to the MP; an address setting unit being connected to the MCU, for setting an unique address of each of the testing devices; and a first interface being connected to the MCU for outputting results.
    • 用于测试存储设备的链路控制卡(LCC)的系统和方法包括主机,中间平面(MP),交换机和测试设备阵列。 主机连接到测试设备阵列,用于发送命令集和接收结果。 MP连接在LCC和测试设备阵列之间。 该开关确定LCC输出硬复位信号,硬复位信号通过MP传输到测试器件阵列。 测试装置阵列包括多个测试装置,并且每个测试装置包括微控制器单元(MCU); 连接器连接到MCU,并连接到MP; 连接到MCU的地址设置单元,用于设置每个测试设备的唯一地址; 以及连接到MCU的第一接口,用于输出结果。
    • 3. 发明授权
    • Testing system and testing method for a link control card
    • 链路控制卡的测试系统和测试方法
    • US07480835B2
    • 2009-01-20
    • US11440315
    • 2006-05-24
    • Kang WuWei ZhangJun Huang
    • Kang WuWei ZhangJun Huang
    • G06F11/00
    • G06F11/24
    • A system and method for testing a link control card (LCC) includes a host, a middle plane (MP), and an array having a plurality of testing devices. The host is connected to the LCC for transmitting signals, and the host is connected to the array for sending out commands and receiving results. The MP is connected between the LCC and the testing device array. Each of the testing devices includes a micro-controller unit (MCU), a connector connected to the MCU for receiving the signals, a hub connected to the connector for testing the signals, a voltage margin control unit connected to the MCU for controlling a voltage margin of the LCC, an address setting unit connected to the MCU, and a first interface connected to the MCU for outputting results.
    • 用于测试链路控制卡(LCC)的系统和方法包括主机,中间平面(MP)和具有多个测试设备的阵列。 主机连接到LCC发送信号,主机连接到阵列发送命令和接收结果。 MP连接在LCC和测试设备阵列之间。 每个测试装置包括微控制器单元(MCU),连接到MCU的用于接收信号的连接器,连接到连接器的用于测试信号的集线器,连接到MCU的电压余量控制单元,用于控制电压 LCC的余量,连接到MCU的地址设置单元,以及连接到MCU的第一接口,用于输出结果。
    • 4. 发明申请
    • Testing system and testing method for a link control card
    • 链路控制卡的测试系统和测试方法
    • US20070018668A1
    • 2007-01-25
    • US11440315
    • 2006-05-24
    • Kang WuWei ZhangJun Huang
    • Kang WuWei ZhangJun Huang
    • G01R31/02
    • G06F11/24
    • A system and method for testing a link control card (LCC) includes a host, a middle plane (MP), and an array having a plurality of testing devices. The host is connected to the LCC for transmitting signals, and the host is connected to the array for sending out commands and receiving results. The MP is connected between the LCC and the testing device array. Each of the testing devices includes a micro-controller unit (MCU), a connector connected to the MCU for receiving the signals, a hub connected to the connector for testing the signals, a voltage margin control unit connected to the MCU for controlling a voltage margin of the LCC, an address setting unit connected to the MCU, and a first interface connected to the MCU for outputting results.
    • 用于测试链路控制卡(LCC)的系统和方法包括主机,中间平面(MP)和具有多个测试设备的阵列。 主机连接到LCC发送信号,主机连接到阵列发送命令和接收结果。 MP连接在LCC和测试设备阵列之间。 每个测试装置包括微控制器单元(MCU),连接到MCU的用于接收信号的连接器,连接到连接器的用于测试信号的集线器,连接到MCU的电压余量控制单元,用于控制电压 LCC的余量,连接到MCU的地址设置单元,以及连接到MCU的第一接口,用于输出结果。