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    • 2. 发明专利
    • Particle size measuring system and program of ground material
    • 颗粒尺寸测量系统和接地材料程序
    • JP2009036533A
    • 2009-02-19
    • JP2007198780
    • 2007-07-31
    • Kajima Corp鹿島建設株式会社
    • FUJISAKI KATSUTOSHIKANBE TAKAYUKIKURONUMA IZURUOKAMOTO MICHITAKATAKADA ETSUHISAKOBAYASHI HIROAKIHAMA KENJUTAKIGUCHI NORIOKITAMOTO YUKIYOSHIMIURA SATORU
    • G01N15/02
    • PROBLEM TO BE SOLVED: To provide a system and a program capable of forming simply in a short time, a particle size cumulative curve of a ground material having a wide particle size distribution width.
      SOLUTION: This system includes a computer 10 for storing particle size cumulative curves P1, P2, P2, etc., of a material Gs having a smaller particle size than a prescribed particle size D determined from a plurality of samples B of the ground material, a measuring device 5 for measuring a volume V of the whole sample A of the ground material, and a detection device 6 for detecting a contour of a material GL having a larger particle size than the prescribed particle size D in the sample A. The computer 10 includes a means 17 for forming a particle size cumulative curve P (d≥D) by calculating a volume v from the contour of each material GL having the large particle size; a means 18 for calculating a total volume ratio (V-Σv) of the material Gs having the small particle size in the sample A from the total Σv of each volume v and the volume V of the whole sample A, and estimating a particle size cumulative curve P (d≤D) corresponding to the ratio from the particle size cumulative curves P1, P2, P2, etc., of the plurality of samples B; and a means 19 for synthesizing the formed particle size cumulative curve P (d≥D) with the estimated particle size cumulative curve P (d≤D).
      COPYRIGHT: (C)2009,JPO&INPIT
    • 要解决的问题:为了提供能够在短时间内简单地形成的系统和程序,具有宽的粒度分布宽度的研磨材料的粒度累积曲线。 解决方案:该系统包括一个计算机10,用于存储粒子的累积曲线P1,P2,P2等,粒子尺寸小于由多个样品B确定的规定粒径D的粒径 研磨材料,用于测量研磨材料的整个样品A的体积V的测量装置5和用于检测样品A中具有比规定粒径D更大的粒径的材料GL的轮廓的检测装置6 计算机10包括用于通过从具有大粒度的每种材料GL的轮廓计算体积v来形成粒度累积曲线P(d≥D)的装置17; 用于从每个体积v的总Σv和整个样品A的体积V计算样品A中具有小粒度的材料Gs的总体积比(V-Σv)的装置18,并且估计颗粒尺寸 累积曲线P(d≤D)对应于多个样本B的粒度累积曲线P1,P2,P2等的比率; 以及用于将所形成的粒度累积曲线P(d≥D)与估计的粒径累积曲线P(d≤D)合成的装置19。 版权所有(C)2009,JPO&INPIT