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2. 发明专利

JPS60146136A STRESS MEASURING METHOD BY X-RAY DIFFRACTION USING CURVE METHOD 失效
公开(公告)号：JPS60146136A
公开(公告)日：1985-08-01
申请号：JP249484
申请日：1984-01-10
申请人： KURITA MASANORI
发明人： KURITA MASANORI , ISHII MASAMI
IPC分类号： G01L1/00 , G01L1/25 , G01N23/207
摘要： PURPOSE:To enhance accuracy of a peak position and to shorten stress measuring time, by obtaining correcting value (z) for all X-ray intensities, which are measured at a specified step and exceed 0.8zmax. CONSTITUTION:The peak position of the diffraction line of a steel material having no stress is about 156 deg.. Therefore X-ray intensity is measured from a point A on the side larger than that angle at a specified step width (c). A correcting value (z) for the intensity is plotted. Here, the (x) coordinates of the starting point A for measurement and an initial point C, where the correcting value (z) of the X rays exceeds 0.8zmax, are made to be xa and xc, respectively. When the difference angle (x) is gradually decreased and as soon as it passes the peak of the diffraction angle, a computer computes the maximum value zmax of the correcting value (z). When the diffraction angle (x) becomes smaller and the correcting value (z) of the X-ray intensity (z) becomes smaller than 0.8zmax, the measurement of the X-ray intensity is finished by the instruction from the computer and the measurement at the next X-ray incident angle is started. Therefore in the measurement of X-ray intensity of the low angle side, the necessary points can be measured efficiently except the last one point R, which is smaller than 0.8zmax.

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