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    • 5. 发明申请
    • EMPLOYING BEAM SCANNING FOR OPTICAL DETECTION
    • 采用光束扫描进行光学检测
    • WO2008010120A2
    • 2008-01-24
    • PCT/IB2007/052499
    • 2007-06-27
    • KONINKLIJKE PHILIPS ELECTRONICS N.V.VAN DIJK, Erik, M., H., P.BOAMFA, Marius, I.BALISTRERI, Marcello, L., M.WIMBERGER-FRIEDL, Reinhold
    • VAN DIJK, Erik, M., H., P.BOAMFA, Marius, I.BALISTRERI, Marcello, L., M.WIMBERGER-FRIEDL, Reinhold
    • G01N21/64
    • G01N21/6452
    • A detection system (100) is described allowing scanning of an excitation irradiation beam over a substrate (8) for detecting luminescence sites. The scanning thereby is performed by using an optical deflector (5) for varying an angle of incidence of the excitation irradiation beam on a single focusing element (7) on an irradiation path between the deflector (5) and the substrate (8). By varying the angle of incidence on the single focusing element (7), the focus point of the excitation irradiation beam is shifted in the focal plane of the focusing element (7), where the substrate (8) is positioned. The latter allows fast scanning of the excitation irradiation beam. In a preferred embodiment, an additional scanning motion in a substantially different direction is furthermore superimposed, resulting in the possibility for scanning an appropriate area of the substrate (8). The additional scanning motion may be obtained using a split optics system, whereby substantially only the single focusing element (7) and the optical deflector (5) are moved with respect to the substrate (8), whereas other optical components typically are fixed with respect to the substrate (8) during the scanning.
    • 描述了一种检测系统(100),其允许在用于检测发光位点的基板(8)上扫描激发照射束。 通过使用用于改变偏转器(5)和基板(8)之间的照射路径上的单个聚焦元件(7)上的激发照射光束的入射角的光学偏转器(5)来进行扫描。 通过改变单个聚焦元件(7)上的入射角,激发照射光束的焦点在基底(8)所在的聚焦元件(7)的焦平面上移动。 后者允许激发照射束的快速扫描。 在优选实施例中,进一步叠加基本不同方向的附加扫描运动,导致扫描基板(8)的适当区域的可能性。 可以使用分离光学系统获得附加扫描运动,由此基本上仅单个聚焦元件(7)和光学偏转器(5)相对于基板(8)移动,而其它光学部件通常相对于 在扫描期间到基板(8)。