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1. 发明申请

WO2009066261A3 BEAM SHAPER, OPTICAL SYSTEM AND METHODS USING THE SAME 审中-公开
标题翻译：光束形状，光学系统和使用该光学系统的方法
公开(公告)号：WO2009066261A3
公开(公告)日：2009-07-23
申请号：PCT/IB2008054881
申请日：2008-11-20
申请人： KONINKL PHILIPS ELECTRONICS NV , VAN DIJK ERIK M H P , STALLINGA SJOERD , VOSSEN DIRK L J , BOAMFA MARIUS I
发明人： VAN DIJK ERIK M H P , STALLINGA SJOERD , VOSSEN DIRK L J , BOAMFA MARIUS I
IPC分类号： G01N21/64 , G02B5/18
CPC分类号： G01N21/6458 , G02B5/1833
摘要： An optical beam shaper comprises a polarization-dependent phase adjustment member which applies a phase pattern of equal magnitude and opposite sign to two orthogonal polarization states. In a preferred embodiment the beamer shaper is a dif tractive element made of a birefringent material, such as a photo-polymerizable liquid crystal polymer frozen in a uniaxial alignment, said dif tractive element comprising a plurality of zones, each zone having a stepped thickness defining a plurality of steps. The beam shaper can be used to introduce astigmatism to a polarized light beam or to undo the astigmatism to a beam with an orthogonal polarization state. The beam shaper is advantageously used within a detection device, such as a fluorescence scanner.
摘要翻译：光束整形器包括偏振相关相位调整构件，其对两个正交偏振状态施加相等幅度和相反符号的相位图案。在优选实施例中，光束整形器是由双折射材料制成的吸引元件，例如以单轴取向冷冻的光可聚合液晶聚合物，所述吸引元件包括多个区域，每个区域具有限定多个步骤。光束整形器可用于对偏振光束引入像散或者使具有正交偏振状态的光束的像散消除。光束整形器有利地用在诸如荧光扫描仪的检测装置内。

2. 发明申请

WO2009066252A2 MULTI-FOCAL SPOT GENERATOR AND MULTI-FOCAL MULTI-SPOT SCANNING MICROSCOPE 审中-公开
标题翻译：多焦点发生器和多焦点多点扫描显微镜
公开(公告)号：WO2009066252A2
公开(公告)日：2009-05-28
申请号：PCT/IB2008054860
申请日：2008-11-19
申请人： KONINKL PHILIPS ELECTRONICS NV , STALLINGA SJOERD , BAKKER LEVINUS P , VOSSEN DIRK L J
发明人： STALLINGA SJOERD , BAKKER LEVINUS P , VOSSEN DIRK L J
IPC分类号： G02B3/00 , G02B21/00 , G02B27/00
CPC分类号： G02B27/0087 , G02B3/0006 , G02B21/004
摘要： The invention relates to a spot-generator (10) having: an entrance surface (12) for receiving an incident light beam (20) and an exit surface (14) for transmitting the light beam, the entrance surface defining an entrance side (16) and the exit surface defining an exit side (18), wherein the spot generator is designed to modulate the incident light beam to generate on the exit side a plurality of separate light spots. According to the invention, the plurality of light spots comprises a first light spot (22) generated in a first focal plane (24) and a second light spot (26) generated in a second focal plane (28), the first focal plane and the second focal plane being essentially perpendicular to the mean propagation direction of the exit light beam, and wherein the first light spot (22) differs from every other light spot generated on the exit side by the spot generator in the projection of its position on a plane essentially perpendicular to the mean propagation direction of the exit light beam. Advantageously, the light spots of the plurality of separate light spots have identical spectra. The invention further relates to a multi-spot scanning microscope and to a method of generating an image of a microscopic sample. Advantageously, the method comprises the step of generating a three- dimensional image of the sample.
摘要翻译：本发明涉及点光发生器（10），其具有：用于接收入射光束（20）的入射表面（12）和用于透射光束的出射表面（14），入射面限定入射侧（16 ）和所述出射表面限定出射侧（18），其中所述光斑发生器被设计成调制所述入射光束，以在所述出射侧产生多个单独的光斑。根据本发明，多个光点包括在第一焦平面（24）中产生的第一光点（22）和在第二焦平面（28）中产生的第二光点（26），第一焦平面和所述第二焦平面基本上垂直于所述出射光束的平均传播方向，并且其中所述第一光点（22）在其位置的投影中由所述光点发生器在出射侧产生的每隔一个光点不同平面基本上垂直于出射光束的平均传播方向。有利地，多个分开的光点中的光点具有相同的光谱。本发明还涉及多点扫描显微镜和产生微观样品图像的方法。有利地，该方法包括产生样本的三维图像的步骤。

3. 发明申请

WO2009022245A3 MECHANICAL RESONANCE DETECTION SYSTEM 审中-公开
标题翻译：机械共振检测系统
公开(公告)号：WO2009022245A3
公开(公告)日：2009-08-20
申请号：PCT/IB2008052972
申请日：2008-07-24
申请人： KONINKL PHILIPS ELECTRONICS NV , VOSSEN DIRK L J , VLUTTERS RUUD , CIUHU CALINA , DE BRUIJN FREDERIK J
发明人： VOSSEN DIRK L J , VLUTTERS RUUD , CIUHU CALINA , DE BRUIJN FREDERIK J
IPC分类号： G01H13/00
CPC分类号： G01H13/00
摘要： In a mechanical resonance detection system, a vibration applicator (VFO, EMT) imposes a mechanical vibration (MV) at various different frequencies onto at least a portion of a physical object (S). An imaging assembly (IAS) captures images (IM) within an imaging frame that lies in at least a portion of the physical object (S), which undergoes the mechanical vibration (MV). At least one element of the imaging assembly (IAS) equally undergoes the mechanical vibration (MV) so that the imaging frame moves in synchronization with the mechanical vibration (MV). An analyzer (BLA, DTA) analyzes the images so as to provide an indication of a frequencyofthe mechanical vibration whereby an image has a relatively high degree of blur.
摘要翻译：在机械共振检测系统中，振动施加器（VFO，EMT）将各种不同频率的机械振动（MV）施加到物理对象（S）的至少一部分上。成像组件（IAS）捕获位于物理对象（S）的至少一部分中的成像帧内的图像（IM），其经历机械振动（MV）。成像组件（IAS）的至少一个元件同样经历机械振动（MV），使得成像框架与机械振动（MV）同步移动。分析仪（BLA，DTA）分析图像以提供机械振动频率的指示，由此图像具有相对较高的模糊度。

4. 发明申请

WO2009066253A2 MULTI-MODAL SPOT GENERATOR AND MULTI-MODAL MULTI-SPOT SCANNING MICROSCOPE 审中-公开
标题翻译：多模光斑发生器和多模多光斑扫描显微镜
公开(公告)号：WO2009066253A2
公开(公告)日：2009-05-28
申请号：PCT/IB2008054861
申请日：2008-11-19
申请人： KONINKL PHILIPS ELECTRONICS NV , STALLINGA SJOERD , VOSSEN DIRK L J , BAKKER LEVINUS P , HULSKEN BAS
发明人： STALLINGA SJOERD , VOSSEN DIRK L J , BAKKER LEVINUS P , HULSKEN BAS
IPC分类号： G02B3/00 , G02B5/18 , G02B21/00 , G02B27/00 , G02B27/09
CPC分类号： G02B21/0032 , G02B27/0087 , G02B27/0905
摘要： The invention relates to a spot generator (10) having: -an entrysurface (12) for receiving an incident light beam (20) and an exit surface (14) for transmitting the light beam, the entry surface defining an entryside (16) and the exit surface defining an exit side (18). According to the invention, the spot generator is designed to modulate the incident light beam to generate on the exit side a first plurality (22) and a second plurality (24) of separate light spots, each light spot belonging to the first plurality having a first angular spectrum and each light spot belonging to the second plurality having a second angular spectrum different than the first angular spectrum. Advantageously, the spot generator comprises a periodic binary phase structure. The invention further relates to a multi-spot scanning microscope and to a method of imaging a microscopic sample.
摘要翻译：本发明涉及一种点发生器（10），其具有： - 用于接收入射光束（20）的表面（12）和用于透射光束的出射表面（14），所述入射表面限定了农庄（16）;以及出口表面限定出口侧（18）。根据本发明，点发生器被设计为调制入射光束以在出射侧产生第一多个（22）和第二多个（24）分离的光点，属于第一多个的每个光点具有第一角谱和属于第二多个谱的每个光斑具有不同于第一角谱的第二角谱。有利地，点发生器包括周期性二元相位结构。本发明还涉及一种多点扫描显微镜和一种对显微镜样品成像的方法。

5. 发明申请

WO2008152568A3 METHOD AND DEVICE FOR ANALYZING A SAMPLE 审中-公开
标题翻译：用于分析样品的方法和装置
公开(公告)号：WO2008152568A3
公开(公告)日：2009-02-19
申请号：PCT/IB2008052267
申请日：2008-06-09
申请人： KONINKL PHILIPS ELECTRONICS NV , VAN ALEM TOON , BIERHOFF WALTHERUS C J , HELWEGEN IVON F , MIHAJLOVIC NENAD , STALLINGA SJOERD , VOSSEN DIRK L J
发明人： VAN ALEM TOON , BIERHOFF WALTHERUS C J , HELWEGEN IVON F , MIHAJLOVIC NENAD , STALLINGA SJOERD , VOSSEN DIRK L J
IPC分类号： G01N21/27 , G02B21/00
CPC分类号： G02B21/002 , G02B21/0024
摘要： The invention relates to an optical device for analyzing a sample (8), comprising: - means for irradiating the sample (8) with at least one light beam, - a reference marker (12) placed on a light path (P) of the light beam so that the reference marker (12) is irradiated by said light beam simultaneously with the sample (8), - means for simultaneously detecting light interacted with the sample (8), for analyzing the sample (8), and with the reference marker (12), for at least one of calibrating, aligning or adjusting the optical device.
摘要翻译：本发明涉及一种用于分析样品（8）的光学装置，包括： - 用于用至少一个光束照射所述样品（8）的装置， - 放置在所述样品（8）的光路（P）上的参考标记（12）光束，使得参考标记（12）与样品（8）同时被所述光束照射， - 用于同时检测与样品（8）相互作用的光，用于分析样品（8）以及参考的装置标记（12），用于校准，对准或调整光学装置中的至少一个。

6. 发明专利

BRPI0819301A2 Gerador de pontos, e , microscópio de varredura de multipontos 未知
公开(公告)号：BRPI0819301A2
公开(公告)日：2015-05-12
申请号：BRPI0819301
申请日：2008-11-19
申请人： KONINKL PHILIPS ELECTRONICS NV
发明人： STALLINGA SJOERD , VOSSEN DIRK L J , BAKKER LEVINUS P , HULSKEN BAS
IPC分类号： G02B3/00 , G02B5/18 , G02B21/00 , G02B27/00 , G02B27/09

7. 发明专利

BRPI0819304A2 Gerador de ponto de luz, microscópio de varredura de múltiplos pontos de luz, e, método para gerar uma imagem de uma amostra microscópica 未知
公开(公告)号：BRPI0819304A2
公开(公告)日：2015-05-12
申请号：BRPI0819304
申请日：2008-11-19
申请人： KONINKL PHILIPS ELECTRONICS NV
发明人： STALLINGA SJOERD , BAKKER LEVINUS P , VOSSEN DIRK L J
IPC分类号： G02B3/00 , G02B21/00 , G02B27/00

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