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    • 1. 发明申请
    • MEASURING OVERLAY AND PROFILE ASYMMETRY USING SYMMETRIC AND ANTI-SYMMETRIC SCATTEROMETRY SIGNALS
    • 使用对称和对称分析信号测量覆盖和轮廓不对称
    • WO2006133258A3
    • 2007-03-29
    • PCT/US2006022059
    • 2006-06-06
    • KLA TENCOR TECH CORPKANDEL DANIELGROSS KENFRIEDMANN MICHAELFU JIYOUKRISHNAN SHANKARGOLOVANEVSKY BORIS
    • KANDEL DANIELGROSS KENFRIEDMANN MICHAELFU JIYOUKRISHNAN SHANKARGOLOVANEVSKY BORIS
    • G01J4/00
    • G01N21/211G01N21/9501G01N21/956G03F7/70633
    • Systems and methods are disclosed for using ellipsometer configurations to measure the partial Mueller matrix and the complete Jones matrix of a system that may be isotropic or anisotropic. In one embodiment two or more signals, which do not necessarily satisfy any symmetry assumptions individually, are combined into a composite signal which satisfies a symmetry assumption. The individual signals are collected at two or more analyzer angles. Symmetry properties of the composite signals allow easy extraction of overlay information for any relative orientation of the incident light beam with respect to a ID grating target, as well as for targets comprising general 2D gratings. Signals of a certain symmetry property also allow measurement of profile asymmetry in a very efficient manner. In another embodiment a measurement methodology is defined to measure only signals which satisfy a symmetry assumption. An optional embodiment comprises a single polarization element serving as polarizer (111) and analyzer (115). Another optional embodiment uses an analyzing prism (144) to simultaneously collect two polarization components of reflected light.
    • 公开了使用椭偏仪配置来测量可能是各向同性或各向异性的系统的部分Mueller矩阵和完整琼斯矩阵的系统和方法。 在一个实施例中,不一定满足任何对称假设的两个或更多个信号被组合成满足对称假设的复合信号。 各个信号以两个或多个分析器角度收集。 复合信号的对称属性允许容易地提取用于入射光束相对于ID光栅目标的任何相对取向以及包括通用2D光栅的目标的覆盖信息。 具有某种对称性质的信号也可以以非常有效的方式测量轮廓不对称。 在另一个实施例中,测量方法被定义为仅测量满足对称假设的信号。 可选实施例包括用作偏振器(111)和分析器(115)的单个偏振元件。 另一个可选实施例使用分析棱镜(144)同时收集反射光的两个偏振分量。
    • 3. 发明申请
    • OPTICAL SYSTEM POLARIZER CALIBRATION
    • 光学系统偏振器校准
    • WO2012177404A3
    • 2013-05-10
    • PCT/US2012041258
    • 2012-06-07
    • KLA TENCOR CORPDE VEER JOHANNES DPOSLAVSKY LEONIDZHUANG GUORONG VKRISHNAN SHANKAR
    • DE VEER JOHANNES DPOSLAVSKY LEONIDZHUANG GUORONG VKRISHNAN SHANKAR
    • G02B27/62G02B5/30
    • G01N21/21G01J3/504G01N21/274
    • A method to calibrate a polarizer in polarized optical system at any angle of incidence, by decoupling the calibration from a polarization effect of the system, by providing a calibration apparatus that includes a substrate having a polarizer disposed on a surface thereof, with an indicator on the substrate for indicating a polarization orientation of the polarizer, loading the calibration apparatus in the polarized optical system with the indicator in a desired position, determining an initial angle between the polarization orientation and a reference of the polarized optical system, acquiring spectra using the polarized optical system at a plurality of known angles between the polarization orientation and the reference of the polarized optical system, using the spectra to plot a curve indicating an angle of the polarizer in the polarized optical system, and when the angle of the polarizer is outside of a desired range, adjusting the angle of the polarizer, and repeating the steps of acquiring the spectra, and plotting a curve indicating the angle of the polarizer.
    • 一种通过提供校准装置来校准偏振光学系统中任何入射角的偏振器的方法,通过提供校准装置,该校准装置包括具有设置在其表面上的偏振器的衬底, 用于指示偏振器的偏振取向的衬底,将校准装置装载在具有指示器的期望位置的偏振光学系统中,确定极化取向和偏振光学系统的基准之间的初始角度,使用偏振光 光学系统以偏振方向和偏振光学系统的基准之间的多个已知角度,使用光谱绘制指示偏振器在偏振光学系统中的角度的曲线,以及当偏振器的角度在 期望的范围,调整偏振器的角度,并重复以下步骤 获取光谱,并绘制一个指示偏振片角度的曲线。