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1. 发明申请

US20090128182A1 DRIVER CIRCUIT AND TEST APPARATUS 失效
标题翻译：驱动电路和测试装置
公开(公告)号：US20090128182A1
公开(公告)日：2009-05-21
申请号：US11941086
申请日：2007-11-16
申请人： KENSUKE KAMO , TAKASHI SEKINO , TOSHIAKI AWAJI
发明人： KENSUKE KAMO , TAKASHI SEKINO , TOSHIAKI AWAJI
IPC分类号： G01R31/26 , H03K3/00
CPC分类号： G01R31/31924
摘要： Provided is a driver circuit that has a first operational mode and a second operational mode and outputs an output signal according to an input signal. The driver circuit includes a first driver section that, in the first operational mode, generates and outputs the output signal according to the input signal and, in the second operational mode, is controlled to be disabled; a high precision driver section that, in the first operational mode, is controlled to be disabled and, in the second operational mode, outputs a source power having a predetermined voltage; and a second driver section that, in the first operational mode, receives the output signal output by the first driver section and outputs the received signal to the outside and, in the second operational mode, receives the source power from the high precision driver section, generates the output signal according to the input signal, and outputs the thus generated signal to the outside.
摘要翻译：提供了具有第一操作模式和第二操作模式的驱动器电路，并且根据输入信号输出输出信号。驱动器电路包括第一驱动器部分，其在第一操作模式中根据输入信号产生并输出输出信号，并且在第二操作模式中被控制为禁用; 高精度驱动器部分，其在第一操作模式中被控制为禁用，并且在第二操作模式中，输出具有预定电压的源电源; 以及第二驱动器部，其在第一操作模式中接收由第一驱动器部分输出的输出信号并将接收到的信号输出到外部，并且在第二操作模式中，从高精度驱动器部分接收源功率，根据输入信号生成输出信号，并将这样生成的信号输出到外部。

2. 发明申请

US20090134900A1 Test apparatus, pin electronics card, electrical device and switch 失效
标题翻译：测试装置，针电子卡，电气设备和开关
公开(公告)号：US20090134900A1
公开(公告)日：2009-05-28
申请号：US12060242
申请日：2008-03-31
申请人： TOSHIAKI AWAJI , TAKASHI SEKINO , MASAKAZU ANDO
发明人： TOSHIAKI AWAJI , TAKASHI SEKINO , MASAKAZU ANDO
IPC分类号： G01R31/02 , H01H3/04
CPC分类号： G01R31/31924 , G01R31/3191 , H01H59/0009
摘要： Provided is a test apparatus for testing a device under test, the test apparatus including: a pattern generating section that inputs a test pattern to the device under test; a judging section that receives an output signal of the device under test, and makes judgment concerning pass/fail of the device under test based on the output signal; an internal circuit that exchanges signals between the device under test and the pattern generating section or the judging section; a first transmission line that connects the internal circuit to the device under test; and a first switch that connects the first transmission line to a ground potential in not testing the device under test, and cuts off the first transmission line from the ground potential in testing of the device under test.
摘要翻译：提供了一种用于测试被测设备的测试设备，该测试设备包括：模式产生部分，将测试模式输入到被测设备; 判断部，其接收被测设备的输出信号，并根据输出信号对被测设备的通过/失败进行判断; 内部电路，用于在被测设备与模式产生部分或判断部分之间交换信号; 将内部电路连接到被测设备的第一传输线; 以及第一开关，其在不测试被测器件的情况下将第一传输线连接到地电位，并且在被测器件的测试中将第一传输线从接地电位切断。

3. 发明申请

US20100001776A1 DIFFERENTIAL SIGNAL TRANSMITTING APPARATUS AND A TEST APPARATUS 有权
标题翻译：差分信号发送装置和测试装置
公开(公告)号：US20100001776A1
公开(公告)日：2010-01-07
申请号：US12204814
申请日：2008-09-05
申请人： TAKAYUKI NAKAMURA , TOSHIAKI AWAJI
发明人： TAKAYUKI NAKAMURA , TOSHIAKI AWAJI
IPC分类号： H03H11/16 , H03K5/13
CPC分类号： G01R31/31917 , G01R31/3191 , H04L25/0272
摘要： Provided is a differential signal transmission apparatus that transmits a differential signal expressed by a potential difference between a positive signal and a negative signal, including a positive signal transmission line that transmits the positive signal; a negative signal transmission line that transmits the negative signal; and a delay compensating circuit that compensates for a time difference between the positive signal and the negative signal with a variable compensation time.
摘要翻译：提供一种差分信号发送装置，其发送由正信号和负信号之间的电位差表示的差分信号，包括发送正信号的正信号传输线; 发送负信号的负信号传输线; 以及延迟补偿电路，其以可变的补偿时间补偿正信号和负信号之间的时间差。

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