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1. 发明授权

US07057406B2 Integrated type probe card and its fabrication method 失效
标题翻译：集成型探针卡及其制作方法
公开(公告)号：US07057406B2
公开(公告)日：2006-06-06
申请号：US10822666
申请日：2004-04-13
申请人： Jyh-Chun Chang , Horng-Jee Wang , Min-Chieh Chou , Kun-Chih Pan , Ya-Ju Huang , Chu-Shu Tsai , Chih-Wei Chen
发明人： Jyh-Chun Chang , Horng-Jee Wang , Min-Chieh Chou , Kun-Chih Pan , Ya-Ju Huang , Chu-Shu Tsai , Chih-Wei Chen
IPC分类号： G01R31/26
CPC分类号： G01R31/2889
摘要： An integrated type probe card includes a circuit space converter having first and second contacts arranged at different density at two sides, probes connected to the contacts at one side of the circuit space converter that are arranged at a high density probes; a spring connector plate, which holds metal spring members in respective receiving holes thereof, a circuit board pressed on the metal spring members against the contacts at the other side of the circuit space converter that are arranged at a low density, and a level adjustment mechanism that accommodates the probes, the circuit space converter, the spring connector plate and the circuit board and enables the user to adjust the level status of the circuit space converter, keeping the circuit space converter electrically connected to the circuit board for transmitting test signal from the probes to the circuit board.
摘要翻译：集成式探针卡包括电路空间转换器，该电路空间转换器具有在两侧以不同密度布置的第一和第二触点，连接到以高密度探针布置的电路空间转换器一侧的触点的探针; 弹簧连接板，其在其各个容纳孔中保持金属弹簧构件，压在金属弹簧构件上的电路板抵靠电路空间转换器的另一侧以低密度排列的触点;电平调节机构容纳探头，电路空间转换器，弹簧连接器板和电路板，使用户能够调整电路空间转换器的电平状态，保持电路空间转换器电连接到电路板，以将测试信号从探针到电路板。

2. 发明申请

US20050174132A1 Integrated type probe card and its fabrication method 失效
标题翻译：集成型探针卡及其制作方法
公开(公告)号：US20050174132A1
公开(公告)日：2005-08-11
申请号：US10822666
申请日：2004-04-13
申请人： Jyh-Chun Chang , Horng-Jee Wang , Min-Chieh Chou , Kun-Chih Pan , Ya-Ju Huang , Chu-Shu Tsai , Chih-Wei Chen
发明人： Jyh-Chun Chang , Horng-Jee Wang , Min-Chieh Chou , Kun-Chih Pan , Ya-Ju Huang , Chu-Shu Tsai , Chih-Wei Chen
IPC分类号： G01R31/28 , G01R31/02
CPC分类号： G01R31/2889
摘要： An integrated type probe card includes a circuit space converter having first and second contacts arranged at different density at two sides, probes connected to the contacts at one side of the circuit space converter that are arranged at a high density probes; a spring connector plate, which holds metal spring members in respective receiving holes thereof, a circuit board pressed on the metal spring members against the contacts at the other side of the circuit space converter that are arranged at a low density, and a level adjustment mechanism that accommodates the probes, the circuit space converter, the spring connector plate and the circuit board and enables the user to adjust the level status of the circuit space converter, keeping the circuit space converter electrically connected to the circuit board for transmitting test signal from the probes to the circuit board.
摘要翻译：集成式探针卡包括电路空间转换器，该电路空间转换器具有在两侧以不同密度布置的第一和第二触点，连接到以高密度探针布置的电路空间转换器一侧的触点的探针; 弹簧连接板，其在其各个容纳孔中保持金属弹簧构件，压在金属弹簧构件上的电路板抵靠电路空间转换器的另一侧以低密度排列的触点;电平调节机构容纳探头，电路空间转换器，弹簧连接器板和电路板，使用户能够调整电路空间转换器的电平状态，保持电路空间转换器电连接到电路板，以将测试信号从探针到电路板。

3. 发明授权

US07619429B2 Integrated probe module for LCD panel light inspection 有权
标题翻译：集成探头模块，用于LCD面板灯检测
公开(公告)号：US07619429B2
公开(公告)日：2009-11-17
申请号：US10689262
申请日：2003-10-20
申请人： Min-Chieh Chou , Jiu-Shu Tasi , Horng-Jee Wang , Ya-Ju Huang , Kun-Chih Pan , Chih-Wei Chen , Jyh-Chun Chang
发明人： Min-Chieh Chou , Jiu-Shu Tasi , Horng-Jee Wang , Ya-Ju Huang , Kun-Chih Pan , Chih-Wei Chen , Jyh-Chun Chang
IPC分类号： G01R31/02
CPC分类号： G01R1/06711 , G01R1/06727 , G01R1/07342 , G01R3/00
摘要： A probe module which is particularly suitable for testing an LCD panel. The probe module includes a probe base, a plurality of probe pins provided on the probe base, and a high-density circuit interconnection which includes a flexible circuit board that connects the probe pins to a testing apparatus. The tip of each probe pin may have a pointed or tapered configuration, or alternatively, a hemi-spherical configuration.
摘要翻译：特别适用于测试LCD面板的探头模块。探针模块包括探针基座，设置在探针基座上的多个探针，以及包括将探针连接到测试装置的柔性电路板的高密度电路互连。每个探针的尖端可以具有尖的或锥形的构造，或者可以是半球形构造。

4. 发明申请

US20050083074A1 Integrated probe module for LCD panel light inspection 有权
标题翻译：集成探头模块，用于LCD面板灯检测
公开(公告)号：US20050083074A1
公开(公告)日：2005-04-21
申请号：US10689262
申请日：2003-10-20
申请人： Min-Chieh Chou , Jiu-Shu Tasi , Horng-Jee Wang , Ya-Ju Huang , Kun-Chih Pan , Chih-Wei Chen , Jyh-Chun Chang
发明人： Min-Chieh Chou , Jiu-Shu Tasi , Horng-Jee Wang , Ya-Ju Huang , Kun-Chih Pan , Chih-Wei Chen , Jyh-Chun Chang
IPC分类号： G01R1/067 , G01R1/073 , G01R3/00 , G01R31/02
CPC分类号： G01R1/06711 , G01R1/06727 , G01R1/07342 , G01R3/00
摘要： A probe module which is particularly suitable for testing an LCD panel. The probe module includes a probe base, a plurality of probe pins provided on the probe base, and a high-density circuit interconnection which includes a flexible circuit board that connects the probe pins to a testing apparatus. The tip of each probe pin may have a pointed or tapered configuration, or alternatively, a hemi-spherical configuration.
摘要翻译：特别适用于测试LCD面板的探头模块。探针模块包括探针基座，设置在探针基座上的多个探针，以及包括将探针连接到测试装置的柔性电路板的高密度电路互连。每个探针的尖端可以具有尖的或锥形的构造，或者可以是半球形构造。

5. 发明申请

US20090002004A1 Integrated compound nano probe card and method of making same 有权
公开(公告)号：US20090002004A1
公开(公告)日：2009-01-01
申请号：US12071311
申请日：2008-02-20
申请人： Horng-Jee Wang , Ya-Ru Huang , Min-Chieh Chou
发明人： Horng-Jee Wang , Ya-Ru Huang , Min-Chieh Chou
IPC分类号： G01R1/073
CPC分类号： G01R1/06755 , B82Y10/00 , B82Y30/00 , G01R1/07314 , G01R3/00 , H01L2924/00013 , Y10S977/742 , H01L2224/29099
摘要： An integrated compound nano probe card is disclosed to include a substrate layer having a front side and a back side, and compound probe pins arranged in the substrate layer. Each compound probe pin has a bundle of aligned parallel nanotubes/nanorods and a bonding material bonded to the bundle of aligned parallel nanotubes/nanorods and filled in gaps in the nanotubes/nanorods. Each compound probe pin has a base end exposed on the back side of the substrate layer and a distal end spaced above the front side of the substrate layer.

6. 发明授权

US07671612B2 Integrated compound nano probe card and method of making same 有权
标题翻译：综合复合纳米探针卡及其制作方法
公开(公告)号：US07671612B2
公开(公告)日：2010-03-02
申请号：US12071312
申请日：2008-02-20
申请人： Horng-Jee Wang , Ya-Ru Huang , Min-Chieh Chou
发明人： Horng-Jee Wang , Ya-Ru Huang , Min-Chieh Chou
IPC分类号： G01R31/02
CPC分类号： G01R1/06755 , B82Y10/00 , B82Y30/00 , G01R1/07314 , G01R3/00 , H01L2924/00013 , Y10S977/742 , H01L2224/29099
摘要： An integrated compound nano probe card is disclosed to include a substrate layer having a front side and a back side, and compound probe pins arranged in the substrate layer. Each compound probe pin has a bundle of aligned parallel nanotubes/nanorods and a bonding material bonded to the bundle of aligned parallel nanotubes/nanorods and filled in gaps in the nanotubes/nanorods. Each compound probe pin has a base end exposed on the back side of the substrate layer and a distal end spaced above the front side of the substrate layer.
摘要翻译：公开了一种集成化合物纳米探针卡，其包括具有前侧和背侧的基底层和布置在基底层中的复合探针。每个复合探针都具有一对排列的平行的纳米管和纳米棒，以及粘合到对齐的平行纳米管/纳米棒束上并且填充在纳米管/纳米棒中的间隙中的粘合材料。每个复合探针具有暴露在基底层的背面上的基端和在基底层的前侧间隔开的远端。

7. 发明申请

US20090121734A1 Integrated compound nano probe card and method of making same 有权
公开(公告)号：US20090121734A1
公开(公告)日：2009-05-14
申请号：US12071312
申请日：2008-02-20
申请人： Horng-Jee Wang , Ya-Ru Huang , Min-Chieh Chou
发明人： Horng-Jee Wang , Ya-Ru Huang , Min-Chieh Chou
IPC分类号： G01R1/067 , G01R31/02
CPC分类号： G01R1/06755 , B82Y10/00 , B82Y30/00 , G01R1/07314 , G01R3/00 , H01L2924/00013 , Y10S977/742 , H01L2224/29099
摘要： An integrated compound nano probe card is disclosed to include a substrate layer having a front side and a back side, and compound probe pins arranged in the substrate layer. Each compound probe pin has a bundle of aligned parallel nanotubes/nanorods and a bonding material bonded to the bundle of aligned parallel nanotubes/nanorods and filled in gaps in the nanotubes/nanorods. Each compound probe pin has a base end exposed on the back side of the substrate layer and a distal end spaced above the front side of the substrate layer.

8. 发明授权

US07652492B2 Integrated compound nano probe card 有权
标题翻译：综合复合纳米探针卡
公开(公告)号：US07652492B2
公开(公告)日：2010-01-26
申请号：US12071311
申请日：2008-02-20
申请人： Horng-Jee Wang , Ya-Ru Huang , Min-Chieh Chou
发明人： Horng-Jee Wang , Ya-Ru Huang , Min-Chieh Chou
IPC分类号： G01R31/02
CPC分类号： G01R1/06755 , B82Y10/00 , B82Y30/00 , G01R1/07314 , G01R3/00 , H01L2924/00013 , Y10S977/742 , H01L2224/29099
摘要： An integrated compound nano probe card is disclosed to include a substrate layer having a front side and a back side, and compound probe pins arranged in the substrate layer. Each compound probe pin has a bundle of aligned parallel nanotubes/nanorods and a bonding material bonded to the bundle of aligned parallel nanotubes/nanorods and filled in gaps in the nanotubes/nanorods. Each compound probe pin has a base end exposed on the back side of the substrate layer and a distal end spaced above the front side of the substrate layer.
摘要翻译：公开了一种集成化合物纳米探针卡，其包括具有前侧和背侧的基底层和布置在基底层中的复合探针。每个复合探针都具有一对排列的平行的纳米管和纳米棒，以及粘合到对齐的平行纳米管/纳米棒束上并且填充在纳米管/纳米棒中的间隙中的粘合材料。每个复合探针具有暴露在基底层的背面上的基端和在基底层的前侧间隔开的远端。

9. 发明授权

US07585548B2 Integrated compound nano probe card and method of making same 有权
标题翻译：综合复合纳米探针卡及其制作方法
公开(公告)号：US07585548B2
公开(公告)日：2009-09-08
申请号：US12071310
申请日：2008-02-20
申请人： Horng-Jee Wang , Ya-Ru Huang , Min-Chieh Chou
发明人： Horng-Jee Wang , Ya-Ru Huang , Min-Chieh Chou
IPC分类号： B05D5/00
CPC分类号： G01R1/06755 , B82Y10/00 , B82Y30/00 , G01R1/07314 , G01R3/00 , H01L2924/00013 , Y10S977/742 , H01L2224/29099
摘要： An integrated compound nano probe card is disclosed to include a substrate layer having a front side and a back side, and compound probe pins arranged in the substrate layer. Each compound probe pin has a bundle of aligned parallel nanotubes/nanorods and a bonding material bonded to the bundle of aligned parallel nanotubes/nanorods and filled in gaps in the nanotubes/nanorods. Each compound probe pin has a base end exposed on the back side of the substrate layer and a distal end spaced above the front side of the substrate layer.
摘要翻译：公开了一种集成化合物纳米探针卡，其包括具有前侧和背侧的基底层和布置在基底层中的复合探针。每个复合探针都具有一对排列的平行的纳米管和纳米棒，以及粘合到对齐的平行纳米管/纳米棒束上并且填充在纳米管/纳米棒中的间隙中的粘合材料。每个复合探针具有暴露在基底层的背面上的基端和在基底层的前侧间隔开的远端。

10. 发明授权

US07400159B2 Integrated complex nano probe card and method of making same 有权
标题翻译：集成复合纳米探针卡及其制作方法
公开(公告)号：US07400159B2
公开(公告)日：2008-07-15
申请号：US10393262
申请日：2003-03-21
申请人： Horng-Jee Wang , Ya-Ru Huang , Min-Chieh Chou
发明人： Horng-Jee Wang , Ya-Ru Huang , Min-Chieh Chou
IPC分类号： G01R31/02
CPC分类号： G01R1/06755 , B82Y10/00 , B82Y30/00 , G01R1/07314 , G01R3/00 , H01L2924/00013 , Y10S977/742 , H01L2224/29099
摘要： An integrated complex nano probe card is disclosed to include a substrate layer having a front side and a back side, and complex probe pins arranged in the substrate layer. Each complex probe pin has a bundle of aligned parallel nanotubes/nanorods and a bonding material bonded to the bundle of aligned parallel nanotubes/nanorods and filled in gaps in the nanotubes/nanorods. Each complex probe pin has a base end exposed on the back side of the substrate layer and a distal end spaced above the front side of the substrate layer.
摘要翻译：公开了一种集成的复合纳米探针卡，其包括具有前侧和后侧的基底层，以及布置在基底层中的复杂探针。每个复合探针都具有一束对准的平行纳米管/纳米棒，以及粘合到对齐的平行纳米管/纳米棒的束并且填充在纳米管/纳米棒中的间隙中的粘合材料。每个复合探针具有暴露在基底层的背面上的基端和在基底层的前侧间隔开的远端。

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