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    • 3. 发明申请
    • Asymmetrical RF Drive for Electrode of Plasma Chamber
    • 等离子室电极的非对称RF驱动
    • US20090159423A1
    • 2009-06-25
    • US12343519
    • 2008-12-24
    • Jozef KudelaCarl A. SorensenSoo Young ChoiJohn M. White
    • Jozef KudelaCarl A. SorensenSoo Young ChoiJohn M. White
    • H05H1/00H01L21/3065B23H7/14
    • H01L21/02B44C1/227C23C16/513H01J37/32091H01J37/32577H01L21/02104
    • RF power is coupled to one or more RF drive points (50-56) on an electrode (20-28) of a plasma chamber such that the level of RF power coupled to the RF drive points (51-52, 55-56) on the half (61) of the electrode that is closer to the workpiece passageway (12) exceeds the level of RF power coupled to the RF drive points (53-54), if any, on the other half (62) of the electrode. Alternatively, RF power is coupled to one or more RF drive points on an electrode of a plasma chamber such that the weighted mean of the drive point positions is between the center (60) of the electrode and the workpiece passageway. The weighted mean is based on weighting each drive point position by the time-averaged level of RF power coupled to that drive point position. The invention offsets an increase in plasma density that otherwise would exist adjacent the end of the electrode closest to the passageway.
    • RF功率耦合到等离子体室的电极(20-28)上的一个或多个RF驱动点(50-56),使得耦合到RF驱动点(51-52,55-56)的RF功率的电平 更靠近工件通道(12)的电极的一半(61)超过了电极的另一半(62)上耦合到RF驱动点(53-54)的RF功率的水平(如果有的话) 。 或者,RF功率耦合到等离子体室的电极上的一个或多个RF驱动点,使得驱动点位置的加权平均值在电极的中心(60)和工件通道之间。 加权平均值基于通过耦合到该驱动点位置的RF功率的时间平均水平来加权每个驱动点位置。 本发明抵消等离子体密度的增加,否则其将邻近电极最靠近通道的端部存在。
    • 5. 发明申请
    • METHOD AND APPARATUS FOR CONTROLLING PLASMA UNIFORMITY
    • 用于控制等离子体均匀性的方法和装置
    • US20090197015A1
    • 2009-08-06
    • US12344210
    • 2008-12-24
    • Jozef KudelaGaku FurutaCarl A. SorensenSoo Young ChoiJohn M. White
    • Jozef KudelaGaku FurutaCarl A. SorensenSoo Young ChoiJohn M. White
    • C23C16/513
    • H01J37/32623C23C16/345C23C16/5096H01J37/32082
    • Systems, methods, and apparatus involve a plasma processing chamber for depositing a film on a substrate. The plasma processing chamber includes a lid assembly having a ground plate, a backing plate, and a non-uniformity existing between the ground plate and the backing plate. The non-uniformity may interfere with RF wave uniformity and cause an impedance imbalance between portions of the ground plate and backing plate. The non-uniformity may include a structure or a reduced spacing of non-uniform surfaces. A reduced spacing of non-uniform surfaces may exist where a first distance between the ground plate and the backing plate at a first end is different from a second distance between the ground plate and the backing plate at a second end. The structure may be from 2 cm to 10 cm thick, cover from 20% to 50% of the backing plate, and be located away from a discontinuity existing inside the chamber.
    • 系统,方法和装置包括用于在基板上沉积膜的等离子体处理室。 等离子体处理室包括具有接地板,背板和存在于接地板和背板之间的不均匀性的盖组件。 不均匀性可能会干扰RF波均匀性,并导致接地板和背板的部分之间的阻抗不平衡。 不均匀性可以包括非均匀表面的结构或减小的间隔。 存在不均匀表面的减小的间隔,其中在第一端处的接地板和背板之间的第一距离在第二端处不同于接地板和背板之间的第二距离。 该结构可以是2cm至10cm厚,覆盖背板的20%至50%,并且位于远离存在于腔室内的不连续处。