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    • 4. 发明申请
    • APPARATUS AND METHOD FOR PREVENTING REGRESSION DEFECTS WHEN UPDATING SOFTWARE COMPONENTS
    • 更新软件组件时防止回退缺陷的装置和方法
    • US20130024469A1
    • 2013-01-24
    • US13188379
    • 2011-07-21
    • Xiao Chuan CaiYi QianNedzad TaljanovicYuan Wang
    • Xiao Chuan CaiYi QianNedzad TaljanovicYuan Wang
    • G06F17/30
    • G06F8/71
    • A method for preventing regression defects when updating software components is disclosed. In one embodiment, such a method includes providing a source repository storing multiple software components (e.g., software modules, source files, sections of program code, etc.). The method determines associations between the software components and stores these associations in a database. The method further enables a user to check out a software component from the source repository in order to make updates, and check in the software component to the source repository once updates are made. At a designated time, such as when the software component is checked in or out, the method automatically checks the database to determine whether the software component has an association with any other software component in the source repository. The method notifies the user if an association is discovered. A corresponding computer program product and apparatus are also disclosed.
    • 公开了一种在更新软件组件时防止回归缺陷的方法。 在一个实施例中,这种方法包括提供存储多个软件组件(例如,软件模块,源文件,程序代码部分等)的源存储库。 该方法确定软件组件之间的关联并将这些关联存储在数据库中。 该方法还允许用户从源存储库中检出软件组件以便进行更新,并且一旦进行更新就将软件组件检入到源存储库。 在指定的时间,例如当软件组件被检入或取出时,该方法自动检查数据库以确定软件组件是否与源存储库中的任何其他软件组件具有关联。 该方法通知用户是否发现关联。 还公开了相应的计算机程序产品和装置。
    • 5. 发明申请
    • UNIFORM STORAGE DEVICE BY PARTIAL VIRTUALIZATION MACHINE
    • 部分虚拟化机器的均匀存储设备
    • US20110314468A1
    • 2011-12-22
    • US12819943
    • 2010-06-21
    • Hua ZhouVincent J. ZimmerMichael A. RothmanYi QianJunwei Stanley ChenFujin Huang
    • Hua ZhouVincent J. ZimmerMichael A. RothmanYi QianJunwei Stanley ChenFujin Huang
    • G06F9/455G06F12/02
    • G06F9/45558G06F2009/45579
    • In a computing system having a processor package, an operating system, and a physical I/O device, a partial virtual machine is provided to instantiate a virtual I/O device corresponding to the physical I/O device, the virtual I/O device having a virtual I/O controller. The partial virtual machine includes an I/O port trap to capture an I/O request to the virtual I/O device by the operating system; an I/O controller emulator coupled to the I/O port trap to handle an I/O control request to the virtual I/O controller, when the I/O request comprises an I/O control request; an I/O device emulator coupled to the I/O port trap component to handle an I/O access request to communicate with the virtual I/O device, when the I/O request comprises an I/O access request; and a device driver coupled to the I/O controller emulator and the I/O device emulator to communicate with the physical I/O device based at least in part on the I/O control request and the I/O access request. The partial virtual machine executes within a secure enclave session within the processor package, improving security of I/O transactions by preventing access to the partial virtual machine by the operating system.
    • 在具有处理器包,操作系统和物理I / O设备的计算系统中,提供部分虚拟机来实例化对应于物理I / O设备的虚拟I / O设备,虚拟I / O设备 具有虚拟I / O控制器。 部分虚拟机包括I / O端口陷阱,以捕获操作系统对虚拟I / O设备的I / O请求; 当I / O请求包括I / O控制请求时,耦合到I / O端口陷阱的I / O控制器仿真器来处理对虚拟I / O控制器的I / O控制请求; 当I / O请求包括I / O访问请求时,耦合到I / O端口陷阱组件的I / O设备仿真器来处理与虚拟I / O设备通信的I / O访问请求; 以及耦合到I / O控制器仿真器和I / O设备仿真器以至少部分地基于I / O控制请求和I / O访问请求与物理I / O设备通信的设备驱动器。 部分虚拟机在处理器包内的安全飞地会话内执行,通过防止操作系统访问部分虚拟机来提高I / O事务的安全性。
    • 6. 发明授权
    • Multiple channel interferometric surface contour measurement system
    • 多通道干涉测量面轮廓测量系统
    • US07751063B2
    • 2010-07-06
    • US11910638
    • 2006-04-04
    • Robert F. DillonNeil JudellYi QianYunqing ZhuD. Scott AckersonGurpreet Singh
    • Robert F. DillonNeil JudellYi QianYunqing ZhuD. Scott AckersonGurpreet Singh
    • G01B9/02G01B11/02
    • G01B11/2441G01B11/2527
    • Described is a multiple channel interferometric surface contour measurement system. The measurement system includes a multiple channel interferometer projector, a digital camera and a processor. The projector includes two or more interferometer channels. Each channel has an optical axis spatially separate from the optical axes of the other channels. Each channel projects a fringe pattern onto the surface of an object to be measured. Image data for the fringe patterns projected on the object surface are acquired by the digital camera. The processor controls the projection of the fringe patterns of different spatial frequencies, adjusts the phase of each fringe pattern and generates surface contour data in response to the camera image data. The multiple channel interferometric surface contour measurement system provides numerous advantages over conventional single channel interferometric systems, including reduced sensitivity to optical noise, improved stability and increased measurement accuracy.
    • 描述了多通道干涉测量表面轮廓测量系统。 测量系统包括多通道干涉仪投影仪,数码相机和处理器。 该投影仪包括两个或更多个干涉仪通道。 每个通道具有与其他通​​道的光轴在空间上分开的光轴。 每个通道将条纹图案投射到要测量的对象的表面上。 通过数码相机获取投影在物体表面上的条纹图案的图像数据。 处理器控制不同空间频率的条纹图案的投影,调整每个条纹图案的相位并响应于相机图像数据生成表面轮廓数据。 多通道干涉测量表面轮廓测量系统提供了许多优于传统单通道干涉测量系统的优点,包括降低对光学噪声的灵敏度,改进的稳定性和增加的测量精度。
    • 7. 发明授权
    • Determining positional error of an optical component using structured light patterns
    • 使用结构化光图案确定光学部件的位置误差
    • US07599071B2
    • 2009-10-06
    • US11910646
    • 2006-04-04
    • Robert F. DillonRoy D. AllenNeil JudellYi Qian
    • Robert F. DillonRoy D. AllenNeil JudellYi Qian
    • G01B9/02G01B11/02
    • G01B11/2441G01B11/2527
    • Described is an interferometric surface contour measurement system for projecting structured light patterns onto an object. The measurement system includes an interferometric projector, an imager, and a processor. The imager is rigidly coupled to the projector to maintain a stable relationship to the projected, structured light pattern. The imager receives the structured light pattern and together with the processor, determines whether the projected image includes a positional error. In some embodiments, the projector is a multi-channel projector, each channel having an optical axis spatially separated from the others, one of the channels including the imager and dedicated for determining positional error. In other embodiments, the projector is a single-channel projector projecting a structured light pattern onto the object, a portion of the structured light pattern being tapped-off for determining positional error.
    • 描述了一种用于将结构光图案投影到物体上的干涉测量表面轮廓测量系统。 测量系统包括干涉式投影仪,成像器和处理器。 成像器刚性耦合到投影仪以保持与投影的结构化光图案的稳定关系。 成像器接收结构化光图案并与处理器一起确定投影图像是否包括位置误差。 在一些实施例中,投影仪是多通道投影仪,每个通道具有与其它通道在空间上分离的光轴,其中一个通道包括成像器,专用于确定位置误差。 在其他实施例中,投影仪是将结构化光图案投射到物体上的单通道投影仪,结构化光图案的一部分被分接以确定位置误差。
    • 8. 发明申请
    • Multiple Channel Interferometric Surface Contour Measurement System
    • 多通道干涉表面轮廓测量系统
    • US20080165341A1
    • 2008-07-10
    • US11910638
    • 2006-04-04
    • Robert F. DillonNeil JudellYi QianYuqing ZhuD. Scott AckersonGurpreet Singh
    • Robert F. DillonNeil JudellYi QianYuqing ZhuD. Scott AckersonGurpreet Singh
    • G01C11/12G02B27/00G02B7/00G01N21/00
    • G01B11/2441G01B11/2527
    • Described is a multiple channel interferometric surface contour measurement system. The measurement system includes a multiple channel interferometer projector, a digital camera and a processor. The projector includes two or more interferometer channels. Each channel has an optical axis spatially separate from the optical axes of the other channels. Each channel projects a fringe pattern onto the surface of an object to be measured. Image data for the fringe patterns projected on the object surface are acquired by the digital camera. The processor controls the projection of the fringe patterns of different spatial frequencies, adjusts the phase of each fringe pattern and generates surface contour data in response to the camera image data. The multiple channel interferometric surface contour measurement system provides numerous advantages over conventional single channel interferometric systems, including reduced sensitivity to optical noise, improved stability and increased measurement accuracy.
    • 描述了多通道干涉测量表面轮廓测量系统。 测量系统包括多通道干涉仪投影仪,数码相机和处理器。 该投影仪包括两个或更多个干涉仪通道。 每个通道具有与其他通​​道的光轴在空间上分开的光轴。 每个通道将条纹图案投射到要测量的对象的表面上。 通过数码相机获取投影在物体表面上的条纹图案的图像数据。 处理器控制不同空间频率的条纹图案的投影,调整每个条纹图案的相位并响应于相机图像数据生成表面轮廓数据。 多通道干涉测量表面轮廓测量系统提供了许多优于传统单通道干涉测量系统的优点,包括降低对光学噪声的灵敏度,改进的稳定性和增加的测量精度。
    • 9. 发明授权
    • Polyimide/silicon oxide bi-layer for bond pad parasitic capacitance control in semiconductor electro-optical device
    • 聚酰亚胺/氧化硅双层用于半导体电光器件中的焊盘寄生电容控制
    • US06365968B1
    • 2002-04-02
    • US09130742
    • 1998-08-07
    • Yi QianHanh LuRichard Sahara
    • Yi QianHanh LuRichard Sahara
    • H01L2348
    • H01S5/22H01L2224/05644H01L2224/85205H01L2924/01078H01L2924/01079H01S5/0425H01S5/2275H01S2301/176
    • An electro-optical, ridge-waveguide device and method for its fabrication utilizes a polyimide ridge-protection layer, which provides good ridge protection/planarization while minimizing parasitic capacitance. A silicon oxide interlayer is used between a metal contact layer and the polyimide. This interlayer facilitates the adhesion between the metal contact layer and the underlying device since good adhesion can be obtained between the silicon oxide layer and the polyimide layer and between the metal layer and silicon oxide layer. Preferably, the polyimide is roughened to increase the surface area contact between the polyimide layer and silicon oxide layer to further increase adhesion and thus the pull-off force required to separate the metal contact layer from the device. While such roughening can be achieved through plasma etching, in a preferred embodiment, the polyimide layer is roughened by patterned etching. Specifically, a patterned photoresist is used as a etch-protection layer to form a series of wells in the polyimide layer that have a pitch between 1 and 20 microns.
    • 电光学,脊 - 波导器件及其制造方法利用聚酰亚胺脊保护层,其在最小化寄生电容的同时提供良好的脊保护/平坦化。 在金属接触层和聚酰亚胺之间使用氧化硅中间层。 由于在氧化硅层和聚酰亚胺层之间以及金属层和氧化硅层之间可以获得良好的粘附性,所以该中间层有助于金属接触层与下面的器件之间的粘附。 优选地,聚酰亚胺被粗糙化以增加聚酰亚胺层和氧化硅层之间的表面积接触,以进一步提高粘合性,并因此提高将金属接触层与器件分开所需的拉脱力。 尽管通过等离子体蚀刻可以实现这种粗糙化,但是在优选实施例中,通过图案化蚀刻使聚酰亚胺层变粗糙。 具体地,使用图案化的光致抗蚀剂作为蚀刻保护层,以在聚酰亚胺层中形成间距在1和20微米之间的一系列孔。
    • 10. 发明授权
    • Optical fiber-based three-dimensional imaging system
    • 基于光纤的三维成像系统
    • US08477318B2
    • 2013-07-02
    • US12738207
    • 2008-10-23
    • Robert F. DillonYi QianGurpreet Singh
    • Robert F. DillonYi QianGurpreet Singh
    • G01B11/02G01B9/21G01B11/24
    • A61B5/0088A61B5/0084A61B5/4547A61B5/682A61C9/006A61C9/0073G01B11/2527
    • Described are an imaging device and method for determining three-dimensional position information of a surface of an object. The device includes a pair of optical fibers, a phase shifter, a detector array and a processor. The phase shifter is coupled to one of the optical fibers and is used to change a phase of optical radiation emitted from the optical fiber relative to a phase of optical radiation emitted from the other optical fiber. The detector array receives optical radiation scattered by the surface of the object. The processor communicates with the detector array and the phase shifter. Signals generated by the detector array are received by the processor and three-dimensional position information for the surface is calculated in response to the received optical radiation scattered by the surface of the object and the change in the relative phase of optical radiation emitted by the optical fibers.
    • 描述了一种用于确定物体表面的三维位置信息的成像装置和方法。 该装置包括一对光纤,移相器,检测器阵列和处理器。 移相器耦合到光纤中的一个,并且用于改变从光纤相对于从另一光纤发射的光辐射的相位发射的光辐射的相位。 检测器阵列接收由物体表面散射的光辐射。 处理器与检测器阵列和移相器通信。 由检测器阵列产生的信号由处理器接收,并且响应于由物体的表面散射的接收的光辐射和由光学器件发射的光辐射的相对相位的变化来计算表面的三维位置信息 纤维。