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1. 发明申请

US20050227358A1 Methods of determining a quality of an array substrate 审中-公开
标题翻译：确定阵列基板质量的方法
公开(公告)号：US20050227358A1
公开(公告)日：2005-10-13
申请号：US10817566
申请日：2004-04-01
申请人： John McEntee , Joseph Vandenburg , Brent Tolosko , Nelson Holcomb
发明人： John McEntee , Joseph Vandenburg , Brent Tolosko , Nelson Holcomb
IPC分类号： B01L7/00 , G01N21/00 , G01N21/95
CPC分类号： G01N21/95 , B01L7/00
摘要： Methods and devices for determining a quality of a substrate surface are provided. Embodiments of the subject methods include producing a plurality of droplets on the surface of a substrate, illuminating the droplet-coated surface, observing a resultant optical property from the surface; and evaluating a quality of the substrate based on the observed optical property. In certain embodiments, an evaluated substrate is one which is to be used in the fabrication of an array assembly and the evaluation is performed prior to fabricating an array on the subject surface. In certain embodiments, an evaluated substrate is one which includes one or more arrays thereon and the evaluation is performed subsequent to the fabrication of the array on the substrate, e.g., to evaluate the quality of the features of the fabricated array. Also provided are apparatuses, systems and kits for use in practicing the subject methods.
摘要翻译：提供了用于确定衬底表面质量的方法和装置。本发明的方法的实施例包括在基板的表面上产生多个液滴，照射液滴涂覆表面，从表面观察得到的光学特性; 并且基于观察到的光学性质来评价基板的质量。在某些实施例中，所评估的衬底是用于制造阵列组件的衬底，并且在对象表面上制造阵列之前进行评估。在某些实施方案中，所评估的衬底是其上包括一个或多个阵列的衬底，并且在衬底上阵列的制造之后执行评估，例如以评估所制造的阵列的特征的质量。还提供了用于实践主题方法的装置，系统和套件。

2. 发明申请

US20050137280A1 Devices for calibrating optical scanners and methods of using the same 失效
标题翻译：用于校准光学扫描仪的设备及其使用方法
公开(公告)号：US20050137280A1
公开(公告)日：2005-06-23
申请号：US10944457
申请日：2004-09-16
申请人： Nelson Holcomb , Russell Parker , Steven Lefkowitz
发明人： Nelson Holcomb , Russell Parker , Steven Lefkowitz
IPC分类号： G01N21/27 , G01N21/64 , G01N27/447 , C08L1/00
CPC分类号： G01N21/278 , G01N21/6428 , G01N21/6452 , Y10T428/26 , Y10T428/268
摘要： Calibration devices for optical scanners and methods for their use are provided. The subject devices are characterized by having a polymeric coating with at least one fluorescent agent, where the devices have minimal local and global nonuniformities. The subject device may also include one or more photobleached regions. In using the subject devices, a surface is illuminated with at least one light source, fluorescence data is obtained from the surface and the optical system is calibrated based upon the obtained fluorescence data. The subject invention finds use in a variety of optical scanners, including biopolymeric array optical scanners. Also provided are kits for use in verifying and calibrating optical scanners.
摘要翻译：提供了用于光学扫描仪的校准装置及其使用方法。本发明装置的特征在于具有至少一种荧光剂的聚合物涂层，其中装置具有最小的局部和全局不均匀性。主体装置还可以包括一个或多个照相漂白区域。在使用目标装置时，用至少一个光源照射表面，从表面获得荧光数据，并且基于获得的荧光数据校准光学系统。本发明可用于各种光学扫描仪，包括生物聚合物阵列光学扫描仪。还提供了用于验证和校准光学扫描仪的套件。

3. 发明申请

US20050272946A1 Derivatizing organometallic halides 失效
标题翻译：衍生有机金属卤化物
公开(公告)号：US20050272946A1
公开(公告)日：2005-12-08
申请号：US10863715
申请日：2004-06-07
申请人： Nelson Holcomb
发明人： Nelson Holcomb
IPC分类号： C07F7/10 , C07F7/18 , C07F7/22 , C07F7/24
CPC分类号： C07F7/188
摘要： Methods, compounds, and kits are provided for derivatizing organometallic halide compounds. The methods include reacting an organometallic halide with a reagent to produce an analyte having desired properties. In a preferred form, the analyte has properties that render it more susceptible to chemical analysis in relation to its respective organometallic halide. The compounds include the analyte product of the derivatization reaction. The kits include a reagent and, preferably, some or all of the tools that may be used to perform the derivatization reaction.
摘要翻译：提供了用于衍生化有机金属卤化物化合物的方法，化合物和试剂盒。所述方法包括使有机金属卤化物与试剂反应以产生具有所需性质的分析物。在优选形式中，分析物具有使其更易于相对于其各自的有机金属卤化物进行化学分析的性质。化合物包括衍生化反应的分析物产物。试剂盒包括试剂，优选地，可用于进行衍生化反应的一些或全部工具。

4. 发明申请

US20050112292A1 Methods for treating at least one member of a microarray structure and methods of using the same 审中-公开
标题翻译：用于治疗微阵列结构的至少一个成员的方法及其使用方法
公开(公告)号：US20050112292A1
公开(公告)日：2005-05-26
申请号：US10722950
申请日：2003-11-25
申请人： Russell Parker , Duan Dutton , Nelson Holcomb
发明人： Russell Parker , Duan Dutton , Nelson Holcomb
IPC分类号： B05D3/04 , C23C16/00 , G01N33/543
CPC分类号： G01N33/54393
摘要： Methods for treating at least one member of a backing element/microarray assembly structure are provided. The subject methods include at least one of: (1) depositing a component on the at least one member, (2) extracting a component from the at least one member, and (3) surface modifying the at least one member, to treat the at least one member of a backing element/microarray assembly structure. Embodiments of the subject invention also include treated microarray structure members, e.g., produced in accordance with the subject methods, as well as methods for using treated microarray structure members in array assay protocols. Also provided are systems and kits for use in the subject methods.
摘要翻译：提供了用于处理背衬元件/微阵列组装结构的至少一个构件的方法。主题方法包括以下中的至少一个：（1）在至少一个构件上沉积组分，（2）从至少一个构件提取组分，和（3）表面修饰至少一个构件，以处理背衬元件/微阵列组件结构的至少一个构件。本发明的实施方案还包括经处理的微阵列结构构件，例如根据本发明方法制备的，以及在阵列测定方案中使用经处理的微阵列结构构件的方法。还提供了用于主题方法的系统和套件。

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