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    • 3. 发明授权
    • Method for cache correction using functional tests translated to fuse repair
    • 使用功能测试翻译保险丝修复的缓存校正方法
    • US07487397B2
    • 2009-02-03
    • US11260562
    • 2005-10-27
    • Walter R. LockwoodRyan J. PenningtonHugh ShenKenneth L. Wright
    • Walter R. LockwoodRyan J. PenningtonHugh ShenKenneth L. Wright
    • G06F11/00
    • G06F11/2236
    • A method of correcting defects in a storage array of a microprocessor, such as a cache memory, by operating the microprocessor to carry out a functional test procedure which utilizes cache memory, collecting fault data in a trace array during the functional test procedure, identifying a location of the defect in the cache memory using the fault data, and repairing the defect by setting a fuse to reroute access requests for the location to a redundant array. The fault data may include an error syndrome and a failing address. The functional test procedure creates random cache access sequences that cause varying loads of traffic in the cache memory using a test pattern based on a random seed. The functional test procedure may be carried out after completion of a nonfunctional, built-in self test of the microprocessor which sets some of the fuses.
    • 一种通过操作微处理器来执行利用高速缓冲存储器的功能测试程序来校正诸如高速缓存存储器的微处理器的存储阵列中的缺陷的方法,在功能测试程序期间收集跟踪阵列中的故障数据, 使用故障数据在高速缓冲存储器中定位缺陷,以及通过设置保险丝将该位置的访问请求重新路由到冗余阵列来修复缺陷。 故障数据可能包括错误综合征和故障地址。 功能测试过程创建随机高速缓存访​​问序列,其使用基于随机种子的测试模式在高速缓冲存储器中引起变化的流量负载。 功能测试程序可以在完成设置一些保险丝的微处理器的非功能性内置自检之后完成。
    • 4. 发明申请
    • METHOD FOR CACHE CORRECTION USING FUNCTIONAL TESTS TRANSLATED TO FUSE REPAIR
    • 使用翻译成保险丝修复功能的测试方法进行高速缓存校正
    • US20090083579A1
    • 2009-03-26
    • US12325272
    • 2008-12-01
    • Walter R. LockwoodRyan J. PenningtonHugh ShenKenneth L. Wright
    • Walter R. LockwoodRyan J. PenningtonHugh ShenKenneth L. Wright
    • G06F11/07
    • G06F11/2236
    • A method of correcting defects in a storage array of a microprocessor, such as a cache memory, by operating the microprocessor to carry out a functional test procedure which utilizes cache memory, collecting fault data in a trace array during the functional test procedure, identifying a location of the defect in the cache memory using the fault data, and repairing the defect by setting a fuse to reroute access requests for the location to a redundant array. The fault data may include an error syndrome and a failing address. The functional test procedure creates random cache access sequences that cause varying loads of traffic in the cache memory using a test pattern based on a random seed. The functional test procedure may be carried out after completion of a nonfunctional, built-in self test of the microprocessor which sets some of the fuses.
    • 一种通过操作微处理器来执行利用高速缓冲存储器的功能测试程序来校正诸如高速缓存存储器的微处理器的存储阵列中的缺陷的方法,在功能测试程序期间收集跟踪阵列中的故障数据, 使用故障数据在高速缓冲存储器中定位缺陷,以及通过设置保险丝将该位置的访问请求重新路由到冗余阵列来修复缺陷。 故障数据可能包括错误综合征和故障地址。 功能测试过程创建随机高速缓存访​​问序列,其使用基于随机种子的测试模式在高速缓冲存储器中引起变化的流量负载。 功能测试程序可以在完成设置一些保险丝的微处理器的非功能性内置自检之后完成。
    • 6. 发明授权
    • Method for cache correction using functional tests translated to fuse repair
    • 使用功能测试翻译保险丝修复的缓存校正方法
    • US07770067B2
    • 2010-08-03
    • US12325272
    • 2008-12-01
    • Walter R. LockwoodRyan J. PenningtonHugh ShenKenneth L. Wright
    • Walter R. LockwoodRyan J. PenningtonHugh ShenKenneth L. Wright
    • G06F11/00
    • G06F11/2236
    • A method of correcting defects in a storage array of a microprocessor, such as a cache memory, by operating the microprocessor to carry out a functional test procedure which utilizes cache memory, collecting fault data in a trace array during the functional test procedure, identifying a location of the defect in the cache memory using the fault data, and repairing the defect by setting a fuse to reroute access requests for the location to a redundant array. The fault data may include an error syndrome and a failing address. The functional test procedure creates random cache access sequences that cause varying loads of traffic in the cache memory using a test pattern based on a random seed. The functional test procedure may be carried out after completion of a nonfunctional, built-in self test of the microprocessor which sets some of the fuses.
    • 一种通过操作微处理器来执行利用高速缓冲存储器的功能测试程序来校正诸如高速缓存存储器的微处理器的存储阵列中的缺陷的方法,在功能测试程序期间收集跟踪阵列中的故障数据, 使用故障数据在高速缓冲存储器中定位缺陷,以及通过设置保险丝将该位置的访问请求重新路由到冗余阵列来修复缺陷。 故障数据可能包括错误综合征和故障地址。 功能测试过程创建随机高速缓存访​​问序列,其使用基于随机种子的测试模式在高速缓冲存储器中引起变化的流量负载。 功能测试程序可以在完成设置一些保险丝的微处理器的非功能性内置自检之后完成。