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    • 2. 发明授权
    • Optical arrangement for illuminating objects and double—confocal scanning microscope
    • 用于照明物体的光学布置和双共焦扫描显微镜
    • US06570705B2
    • 2003-05-27
    • US09954018
    • 2001-09-18
    • Joerg BewersdorfHilmar GugelJuergen Hoffmann
    • Joerg BewersdorfHilmar GugelJuergen Hoffmann
    • G02B2106
    • G02B21/0076G02B21/0032G02B21/088G02B26/06
    • The present invention relates to an optical arrangement for illuminating objects (1), in particular fluorescent objects, preferably in conjunction with a confocal or a double-confocal scanning microscope, having an illuminating beam path (2) of a light source (3), a detection beam path (4) of a detector (5), and a component (6) which unifies the detection beam path (4). For the purpose of at least largely loss-free union of the light coming from the object (1) into a propagation direction (19), the optical arrangement according to the invention is characterized in that with reference to the beam cross section active for the detector, light of the fist and second partial detection beam can be united at least largely in an overlapping fashion into one propagation direction (19) at the component (6) thereby providing an unified the detection beam path (4).
    • 本发明涉及一种用于照射物体(1)的光学装置,特别是荧光物体,优选与共聚焦或双共焦扫描显微镜结合,具有光源(3)的照明光束路径(2) 检测器(5)的检测光束路径(4)和统一检测光路(4)的部件(6)。 为了将来自物体(1)的光至少在很大程度上无损地结合到传播方向(19)中,根据本发明的光学装置的特征在于,参考对于 检测器,第一部分检测光束和第二部分检测光束的光可以至少大部分地以组合(6)的一个传播方向(19)重叠地组合在一起,从而提供统一的检测光束路径(4)。
    • 3. 发明申请
    • Microscope having a reference specimen
    • 显微镜具有参考标本
    • US20050078361A1
    • 2005-04-14
    • US10919899
    • 2004-08-17
    • Joerg BewersdorfHilmar Gugel
    • Joerg BewersdorfHilmar Gugel
    • G02B21/34G02B21/00
    • G02B21/0024G02B21/006G02B21/0076
    • The present invention concerns a microscope, in particular a confocal or double confocal scanning microscope, as well as a method for operating a microscope, at least one specimen support unit associated with the specimen being provided, at least one reference specimen of known configuration being provided, and the reference specimen being detectable by light microscopy for calibration, alignment or adjustment of the microscope. With the microscope according to the present invention and the method according to the invention for operating a microscope, drift-related changes can be detected and compensated for. Auxiliary means with which a specimen can easily and reliably be focused are also provided.
    • 本发明涉及显微镜,特别是共聚焦或双共聚焦扫描显微镜,以及用于操作显微镜的方法,至少一个与所述样本相关联的样本支撑单元,提供了至少一个已知构造的参考样本 ,并且通过光学显微镜检测参考样品用于显微镜的校准,对准或调整。 利用根据本发明的显微镜和用于操作显微镜的根据本发明的方法,可以检测和补偿漂移相关的变化。 还提供了可以容易且可靠地聚焦的试样的辅助装置。
    • 6. 发明申请
    • BEAM SPLITTER MODULE
    • 光束分离器模块
    • US20120193520A1
    • 2012-08-02
    • US13363030
    • 2012-01-31
    • Joerg BewersdorfBrian Thomas Bennett
    • Joerg BewersdorfBrian Thomas Bennett
    • G01J1/04G01J3/51
    • G02B27/145G02B19/0028G02B19/0057G02B19/0066G02B27/1006G02B27/14G02B27/141G02B27/144
    • A primary beam splitter (310) of an optical apparatus (300) can be used to split an incident light beam (305) into a primary plurality of light beams and to direct a first beam of the primary plurality of light beams in a first direction and a second beam of the primary plurality of light beams in a second direction orthogonal to the first direction. Secondary beam splitters (315a,b) positioned in beam paths of the first and second beams can be used to split the first and second beams of the primary plurality of light beams into a secondary plurality of light beams (320a,b) and to split the second beam of the primary plurality of light beams into a tertiary plurality of light beams (325a,b). A primary plurality of beam reflectors (335a,b/340a,b/345a,b) can be positioned and used to redirect the secondary and tertiary plurality of light beams toward a common detector (355).
    • 可以使用光学设备(300)的主分束器(310)将入射光束(305)分裂成主要的多个光束并且将第一个多个光束的第一光束沿第一方向 以及在与第一方向正交的第二方向上的主多个光束的第二光束。 定位在第一和第二光束的光束路径中的次级光束分离器(315a,b)可用于将主要多个光束的第一和第二光束分成次级多个光束(320a,b)并分裂 所述主多个光束的第二光束成为第三多个光束(325a,b)。 可以将主要的多个光束反射器(335a,b / 340a,b / 345a,b)定位并用于将次级和第三级光束朝着公共检测器(355)重定向。
    • 7. 发明申请
    • 3D Biplane Microscopy
    • 3D双平面显微镜
    • US20100265318A1
    • 2010-10-21
    • US12826422
    • 2010-06-29
    • Joerg BewersdorfManuel F. JuetteTravis GouldSam T. Hess
    • Joerg BewersdorfManuel F. JuetteTravis GouldSam T. Hess
    • H04N13/02
    • G02B21/367G02B21/16G02B21/361G02B27/58H04N13/218H04N13/254H04N2013/0085
    • A microscopy system is configured for creating 3D images from individually localized probe molecules. The microscopy system includes a sample stage, an activation light source, a readout light source, a beam splitting device, at least one camera, and a controller. The activation light source activates probes of at least one probe subset of photo-sensitive luminescent probes, and the readout light source causes luminescence light from the activated probes. The beam splitting device splits the luminescence light into at least two paths to create at least two detection planes that correspond to the same or different number of object planes of the sample. The camera detects simultaneously the at least two detection planes, the number of object planes being represented in the camera by the same number of recorded regions of interest. The controller is programmable to combine a signal from the regions of interest into a 3D data.
    • 配置显微镜系统以从单独定位的探针分子创建3D图像。 显微镜系统包括样品台,激活光源,读出光源,分束装置,至少一个照相机和控制器。 活化光源激活光敏发光探针的至少一个探针子集的探针,并且读出的光源引起来自激活的探针的发光。 分束装置将发光分成至少两条路径,以产生对应于样品的相同或不同数目的物平面的至少两个检测平面。 相机同时检测至少两个检测平面,相机中相同数量的记录感兴趣区域的对象平面数目被表示在相机中。 控制器是可编程的,以将来自感兴趣区域的信号组合成3D数据。
    • 8. 发明授权
    • 3D biplane microscopy
    • 3D双平面显微镜
    • US07772569B2
    • 2010-08-10
    • US12060730
    • 2008-04-01
    • Joerg BewersdorfManuel F. JuetteTravis GouldSam T. Hess
    • Joerg BewersdorfManuel F. JuetteTravis GouldSam T. Hess
    • G01J1/58G02B21/06
    • G02B21/367G02B21/16G02B21/361G02B27/58H04N13/218H04N13/254H04N2013/0085
    • A microscopy system is configured for creating 3D images from individually localized probe molecules. The microscopy system includes a sample stage, an activation light source, a readout light source, a beam splitting device, at least one camera, and a controller. The activation light source activates probes of at least one probe subset of photo-sensitive luminescent probes, and the readout light source causes luminescence light from the activated probes. The beam splitting device splits the luminescence light into at least two paths to create at least two detection planes that correspond to the same or different number of object planes of the sample. The camera detects simultaneously the at least two detection planes, the number of object planes being represented in the camera by the same number of recorded regions of interest. The controller is programmable to combine a signal from the regions of interest into a 3D data.
    • 配置显微镜系统以从单独定位的探针分子创建3D图像。 显微镜系统包括样品台,激活光源,读出光源,分束装置,至少一个照相机和控制器。 活化光源激活光敏发光探针的至少一个探针子集的探针,并且读出的光源引起来自激活的探针的发光。 分束装置将发光分成至少两条路径,以产生对应于样品的相同或不同数目的物平面的至少两个检测平面。 相机同时检测至少两个检测平面,相机中相同数量的记录感兴趣区域的对象平面数目被表示在相机中。 控制器是可编程的,以将来自感兴趣区域的信号组合成3D数据。
    • 10. 发明授权
    • Microscope and method for operating a microscope
    • 显微镜和操作显微镜的方法
    • US06798569B2
    • 2004-09-28
    • US10037851
    • 2002-01-04
    • Joerg BewersdorfHilmar Gugel
    • Joerg BewersdorfHilmar Gugel
    • G02B2100
    • G02B21/0024G02B21/006G02B21/0076
    • The present invention concerns a microscope, in particular a confocal or double confocal scanning microscope, as well as a method for operating a microscope, at least one specimen support unit associated with the specimen being provided, at least one reference specimen of known configuration being provided, and the reference specimen being detectable by light microscopy for calibration, alignment or adjustment of the microscope. With the microscope according to the present invention and the method according to the invention for operating a microscope, drift-related changes can be detected and compensated for. Auxiliary means with which a specimen can easily and reliably be focused are also provided.
    • 本发明涉及显微镜,特别是共聚焦或双共聚焦扫描显微镜,以及用于操作显微镜的方法,至少一个与所述样本相关联的样本支撑单元,提供了至少一个已知构造的参考样本 ,并且通过光学显微镜检测参考样品用于显微镜的校准,对准或调整。 利用根据本发明的显微镜和用于操作显微镜的根据本发明的方法,可以检测和补偿漂移相关的变化。 还提供了可以容易且可靠地聚焦的试样的辅助装置。