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1. 发明授权

US08373853B2 Device and method for providing a predeterminable concentration of at least one component in a liquid medium 有权
标题翻译：在液体介质中提供至少一种组分的预定浓度的装置和方法
公开(公告)号：US08373853B2
公开(公告)日：2013-02-12
申请号：US12617049
申请日：2009-11-12
申请人： Jochen Sieber , Marcus Dyba , Volker Seyfried
发明人： Jochen Sieber , Marcus Dyba , Volker Seyfried
IPC分类号： G01N1/38 , G01N21/64
CPC分类号： G01N1/38 , G01N1/10 , G01N21/64 , G01N35/1097 , G05D11/138
摘要： A method and a device for providing a predeterminable concentration of at least one component in a microscopic sample liquid medium are described. The device includes a feeding device for the at least one component. Measurement data are determined, measuring a predeterminable parameter using a microscopic method. The concentration of the at least one component is adjusted or controlled via the feeding device based on the basis of measurement data.
摘要翻译：描述了在微观样品液体介质中提供至少一种组分的可预定浓度的方法和装置。该装置包括用于至少一个部件的进给装置。确定测量数据，使用微观方法测量可预定参数。基于测量数据的基础，通过进给装置调节或控制至少一个部件的浓度。

2. 发明申请

US20100122588A1 DEVICE AND METHOD FOR PROVIDING A PREDETERMINABLE CONCENTRATION OF AT LEAST ONE COMPONENT IN A LIQUID MEDIUM 有权
标题翻译：用于提供液体介质中至少一个组分的可预测浓度的装置和方法
公开(公告)号：US20100122588A1
公开(公告)日：2010-05-20
申请号：US12617049
申请日：2009-11-12
申请人： Jochen Sieber , Marcus Dyba , Volker Seyfried
发明人： Jochen Sieber , Marcus Dyba , Volker Seyfried
IPC分类号： G01N1/14 , B01L3/02
CPC分类号： G01N1/38 , G01N1/10 , G01N21/64 , G01N35/1097 , G05D11/138
摘要： A method and a device for providing a predeterminable concentration of at least one component in a microscopic sample liquid medium are described. The device includes a feeding device for the at least one component. Measurement data are determined, measuring a predeterminable parameter using a microscopic method. The concentration of the at least one component is adjusted or controlled via the feeding device based on the basis of measurement data.
摘要翻译：描述了在微观样品液体介质中提供至少一种组分的可预定浓度的方法和装置。该装置包括用于至少一个部件的进给装置。确定测量数据，使用微观方法测量可预定参数。基于测量数据的基础，通过进给装置调节或控制至少一个部件的浓度。

3. 发明申请

US20130222568A1 Method and Device for Light-Microscopic Imaging of a Sample Structure 有权
标题翻译：用于样品结构的光显微镜成像的方法和装置
公开(公告)号：US20130222568A1
公开(公告)日：2013-08-29
申请号：US13806047
申请日：2011-06-27
申请人： Marcus Dyba , Volker Seyfried
发明人： Marcus Dyba , Volker Seyfried
IPC分类号： G02B21/36
CPC分类号： G02B21/365 , G01N21/6428 , G01N21/6458 , G02B21/16 , G02B21/367 , G02B27/58
摘要： A method for light-microscopy imaging of a sample structure (2, 34) is described, having the following steps: preparing the sample structure (2, 34) with markers that are transferrable into a state imageable by light microscopy, generating a sequence of individual-image data sets by sequential imaging of the sample structure (2, 34), in such a way that for each image, only a subset of the totality of the markers is in each case transferred into the state imageable by light microscopy, the markers of the respective subset having an average spacing from one another which is greater than the resolution limit of light-microscopy imaging which determines the extent of a light distribution representing one of the respectively imaged markers, generating at least two data blocks in which multiple successive individual-image data sets are respectively combined, superposing the individual-image data sets contained in the respective data block to yield a superposed-image data set, identifying an image offset between the superposed-image data sets, correcting the individual-image data sets that are contained in at least one of the superposed-image data sets on the basis of the identified image offset, determining center point positions of the light distributions representing the imaged markers, and assembling the center point positions into an offset-corrected overall image.
摘要翻译：描述了一种用于样品结构（2,34）的光学显微镜成像的方法，具有以下步骤：用可转移到可通过光学显微镜成像的状态的标记物制备样品结构（2,34），产生序列通过对样本结构（2,34）进行顺序成像，通过对每个图像进行顺序成像的单个图像数据集，只有标记的全部子集在每种情况下都转移到通过光学显微镜可成像的状态，相应子集的标记具有彼此之间的平均间隔，其大于光学显微镜成像的分辨率极限，其确定表示分别成像的标记之一的光分布的程度，生成至少两个数据块，其中多个连续分别组合各个图像数据集，将包含在各个数据块中的各个图像数据集叠加以产生叠加图像数据集，识别叠加图像数据组之间的图像偏移，基于所识别的图像偏移来校正包含在至少一个叠加图像数据集中的各个图像数据集，确定表示所述图像偏移的光分布的中心点位置成像标记，以及将中心点位置组装成偏移校正的整体图像。

4. 发明授权

US08319970B2 Device and method for beam adjustment in an optical beam path 有权
标题翻译：光束路径中光束调整的装置和方法
公开(公告)号：US08319970B2
公开(公告)日：2012-11-27
申请号：US12073360
申请日：2008-03-04
申请人： Holger Birk , Marcus Dyba , Hilmar Gugel , Volker Seyfried
发明人： Holger Birk , Marcus Dyba , Hilmar Gugel , Volker Seyfried
IPC分类号： G01N21/55
CPC分类号： G02B21/06
摘要： A device for beam adjustment in an optical beam path, having at least two mutually independent light sources providing respective beams of a high or extremely high resolution microscope, the beams of the light sources superposed in a common illumination beam path. The device includes a calibration sample with the aid of which the pupil position and/or focal position of the beams can be checked. The device also includes a sample holder arranged to bring the calibration sample into and out of the common illumination beam path at the site or in the vicinity of an intermediate image. A corresponding method is described. In accordance with the device and method, it is possible to undertake the beam adjustment independently of the actual use, that is to say, in the case of a high resolution microscope, independently of the examination sample and/or the recording of images.
摘要翻译：一种用于光束路径中的光束调节的装置，具有至少两个相互独立的光源，其提供高分辨率或极高分辨率显微镜的各个光束，所述光源的光束叠加在公共照明光束路径中。该装置包括校准样品借助于此可以检查光束的光瞳位置和/或焦点位置。该装置还包括样本保持器，其被布置成使得校准样品进入和离开中间图像的位置处或附近的公共照明光束路径。描述相应的方法。根据该装置和方法，可以独立于实际使用进行光束调节，也就是说，在高分辨率显微镜的情况下，独立于检查样本和/或图像的记录。

5. 发明授权

US07830506B2 Method for high spatial resolution examination of samples 有权
标题翻译：样品高空间分辨率检测方法
公开(公告)号：US07830506B2
公开(公告)日：2010-11-09
申请号：US11653444
申请日：2007-01-16
申请人： Hilmar Gugel , Marcus Dyba , Volker Seyfried
发明人： Hilmar Gugel , Marcus Dyba , Volker Seyfried
IPC分类号： G01J3/30
CPC分类号： G01N21/6458
摘要： A method for high spatial resolution examination of a sample, the sample to be examined including a substance that can be repeatedly converted from a first state into a second state, the first and the second states differing from one another in at least one optical property. The method includes: a) bringing the substance into the first state by means of a switching signal in a sample region to be recorded, b)inducing the second state by means of an optical signal, spatially delimited subregions being specifically excluded within the sample region to be recorded, c) reading out the remaining first states, and d) steps a) to c) are repeated, the optical signal being displaced upon each repetition in order to scan the sample, wherein the individual steps a) to d) are carried out in a sequence adapted to the respective measuring situation.
摘要翻译：一种用于样品的高空间分辨率检查的方法，待检查的样品包括可以从第一状态重复转换为第二状态的物质，第一和第二状态在至少一个光学性质中彼此不同。该方法包括：a）借助于要记录的样本区域中的切换信号使物质进入第一状态，b）通过光信号诱导第二状态，在样本区域内具体排除空间划分的子区域被记录，c）读出剩余的第一状态，并且d）步骤a）至c）被重复，光信号在每次重复时被移位以便扫描样品，其中各个步骤a）至d）是以适合于相应测量情况的顺序进行。

6. 发明申请

US20070206277A1 Method for high spatial resolution examination of samples 有权
标题翻译：样品高空间分辨率检测方法
公开(公告)号：US20070206277A1
公开(公告)日：2007-09-06
申请号：US11653444
申请日：2007-01-16
申请人： Hilmar Gugel , Marcus Dyba , Volker Seyfried
发明人： Hilmar Gugel , Marcus Dyba , Volker Seyfried
IPC分类号： G02B21/06
CPC分类号： G01N21/6458
摘要： A method for high spatial resolution examination of samples, preferably by using a laser scanning fluorescence microscope, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, B), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the following steps: a) the substance is brought into the first state (Z1, A) by means of a switching signal (2) in a sample region (P) to be recorded, b) the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, c) the remaining first states (Z1, A1, A2, A3) are read out by means of a test signal (7), and d) steps a) to c) are repeated, the optical signal (4) being displaced upon each repetition in order to scan the sample (1), is defined in that the individual steps a) to d) are carried out in a sequence adapted to the respective measuring situation.
摘要翻译：优选通过使用激光扫描荧光显微镜对待测样品（1）进行高空间分辨率检测的方法，包括可以从第一状态（Z 1，A）重复转换成第二状态的物质（1） Z 2，B），第一和第二状态（Z 1，A; Z 2，B）在至少一个光学性质上彼此不同，包括以下步骤：a）物质进入第一状态 Z 1，A）通过要记录的采样区域（P）中的切换信号（2），b）通过光信号（4）感应第二状态（Z 2，B），空间限定在要记录的样本区域（P）中特别排除子区域，c）剩余的第一状态（Z 1，A 1，A 2，A 3 ）通过测试信号（7）读出，并且d）重复步骤a）至c），光信号（4）在每次重复时移位以便扫描样品（1），是defi 其特征在于，各个步骤a）至d）以适合于相应测量情况的顺序进行。

7. 发明授权

US09772485B2 Method and device for light-microscopic imaging of a sample structure 有权
公开(公告)号：US09772485B2
公开(公告)日：2017-09-26
申请号：US13806047
申请日：2011-06-27
申请人： Marcus Dyba , Volker Seyfried
发明人： Marcus Dyba , Volker Seyfried
IPC分类号： G02B21/36 , G01N21/64 , G02B21/16 , G02B27/58
CPC分类号： G02B21/365 , G01N21/6428 , G01N21/6458 , G02B21/16 , G02B21/367 , G02B27/58
摘要： A method for light-microscopy imaging of a sample structure (2, 34) is described, having the following steps: preparing the sample structure (2, 34) with markers that are transferrable into a state imageable by light microscopy, generating a sequence of individual-image data sets by sequential imaging of the sample structure (2, 34), in such a way that for each image, only a subset of the totality of the markers is in each case transferred into the state imageable by light microscopy, the markers of the respective subset having an average spacing from one another which is greater than the resolution limit of light-microscopy imaging which determines the extent of a light distribution representing one of the respectively imaged markers, generating at least two data blocks in which multiple successive individual-image data sets are respectively combined, superposing the individual-image data sets contained in the respective data block to yield a superposed-image data set, identifying an image offset between the superposed-image data sets, correcting the individual-image data sets that are contained in at least one of the superposed-image data sets on the basis of the identified image offset, determining center point positions of the light distributions representing the imaged markers, and assembling the center point positions into an offset-corrected overall image.

8. 发明申请

US20080316469A1 Device and method for beam adjustment in an optical beam path 有权
标题翻译：光束路径中光束调整的装置和方法
公开(公告)号：US20080316469A1
公开(公告)日：2008-12-25
申请号：US12073360
申请日：2008-03-04
申请人： Holger Birk , Marcus Dyba , Hilmar Gugel , Volker Seyfried
发明人： Holger Birk , Marcus Dyba , Hilmar Gugel , Volker Seyfried
IPC分类号： G02B26/08 , G01N21/00
CPC分类号： G02B21/06
摘要： A device for beam adjustment in an optical beam path, having at least two mutually independent light sources (1, 2), in particular in a beam path (8, 9) of a preferably high or extremely high resolution microscope, the beams of the light sources (1, 2) requiring to be superposed in a common illumination beam path (10), is characterized in that a calibration sample (22) with the aid of which the pupil position and/or focal position of the beams can be checked can be brought into and taken out of the illumination beam path (10).
摘要翻译：一种用于光束路径中的光束调节的装置，具有至少两个相互独立的光源（1,2），特别是在优选高或极高分辨率显微镜的光束路径（8,9）中，所述光束需要叠加在公共照明光束路径（10）中的光源（1,2）的特征在于，借助于校准样品（22）可以检查光束的瞳孔位置和/或焦点位置可以被引入并从照明光束路径（10）中取出。

9. 发明申请

US20070206278A1 Method and microscope for high spatial resolution examination of samples 有权
标题翻译：样品高空间分辨率检测方法与显微镜
公开(公告)号：US20070206278A1
公开(公告)日：2007-09-06
申请号：US11653446
申请日：2007-01-16
申请人： Marcus Dyba , Hilmar Gugel
发明人： Marcus Dyba , Hilmar Gugel
IPC分类号： G02B21/06
CPC分类号： G02B27/58 , G02B21/0076
摘要： A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, A), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined in that the optical signal (4) is provided in the form of a focal line (10) with a cross-sectional profile having at least one intensity zero point (5) with laterally neighboring intensity maxima (9).
摘要翻译：一种用于样品的高空间分辨率检查的方法和显微镜，特别是激光扫描荧光显微镜，待检查的样品（1）包括可以从第一状态（Z 1，A）重复转换成第二状态（Z 2，A），第一状态和第二状态（Z 1，A; Z 2，B）在至少一个光学特性中彼此不同，包括以下步骤：样本区域（P）被记录的信号首先进入第一状态（Z 1，A），并且通过光信号（4）感应第二状态（Z 2，B），在样本区域内特别排除空间划分的子区域（P）被定义为光信号（4）以焦线（10）的形式提供，其横截面轮廓具有至少一个具有横向相邻的强度最大值的强度零点（5）（9）。

10. 发明申请

US20130229494A1 MICROSCOPIC DEVICE AND MICROSCOPIC METHOD FOR THE THREE-DIMENSIONAL LOCALIZATION OF POINT-LIKE OBJECTS 有权
标题翻译：用于点对象物体的三维局部化的微观器件和微观方法
公开(公告)号：US20130229494A1
公开(公告)日：2013-09-05
申请号：US13600463
申请日：2012-08-31
申请人： Marcus Dyba
发明人： Marcus Dyba
IPC分类号： G02B21/36
CPC分类号： G02B21/367 , G02B21/18
摘要： A microscopic device provides three-dimensional localization of point-like objects and includes two imaging optics, each configured to image a same point-like object located in an object space into two separate image spaces as a focused light distribution. Two detector units are respectively associated with the imaging optics and configured to capture an analyzable light spot in detection points of a detection surface disposed in the respective image space. Each imaging optics includes an optical device that orients the focused light distributions obliquely to a detection axis such that, taking into account the detection point correspondence, the two light spots shift in opposite directions based on a z-position of the point-like object. An evaluation unit brings the detection points of the two detection surfaces into mutual pairwise correspondence and analyzes the two light spots so as to ascertain a lateral x-y position and an axial z-position of the point-like object.
摘要翻译：微观装置提供点样物体的三维定位，并且包括两个成像光学元件，每个成像光学元件被配置为将位于物体空间中的相同点样物体成像为聚焦光分布的两个分开的图像空间。两个检测器单元分别与成像光学元件相关联，并且被配置为在设置在各个图像空间中的检测表面的检测点中捕获可分析的光斑。每个成像光学器件包括光学装置，其将聚焦光分布倾斜于检测轴定向，使得考虑到检测点对应，基于点状物体的z-位置，两个光点在相反方向上移动。评估单元将两个检测表面的检测点相互成对地对应，并分析两个光点，以确定点状物体的横向x-y位置和轴向z位置。

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