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1. 发明授权

US07804534B2 Solid-state imaging device, driving method thereof, and imaging apparatus 有权
标题翻译：固态成像装置，其驱动方法和成像装置
公开(公告)号：US07804534B2
公开(公告)日：2010-09-28
申请号：US11705766
申请日：2007-02-14
申请人： Masanori Nagase , Shu Takahashi , Jiro Matsuda , Mitsuru Iwata , Shinji Uya
发明人： Masanori Nagase , Shu Takahashi , Jiro Matsuda , Mitsuru Iwata , Shinji Uya
IPC分类号： H04N9/64 , H01L31/062 , H01L31/113
CPC分类号： H04N5/359 , H01L27/14818 , H04N5/3728
摘要： A solid-state imaging device comprises: a semiconductor substrate; a plurality of photoelectric conversion elements formed in a surface portion of the semiconductor substrate in the form of a two-dimensional array so as to comprise a plurality of sets, each comprising a subset of the photoelectric conversion elements arranged in one direction; charge transfer paths each formed at a side portion of the subset of the photoelectric conversion elements to cause a signal charge of the photoelectric conversion elements be read out when a readout pulse is applied and cause the signal charge which has been read out to be transferred when a transfer pulse is applied; and an electrically conductive light shielding film which is laminated on a surface of the semiconductor substrate through an insulating layer and has openings immediately above each of the photoelectric conversion elements.
摘要翻译：固态成像装置包括：半导体衬底; 多个光电转换元件，形成在二维阵列形式的半导体衬底的表面部分中，以便包括多个集合，每个集合包括沿一个方向布置的光电转换元件的子集; 当施加读出脉冲时，每个形成在光电转换元件的子集的侧部处的电荷传输路径以引起光电转换元件的信号电荷，并且当已经读出的信号电荷被传送时，施加转移脉冲; 以及通过绝缘层层叠在半导体基板的表面上并且在每个光电转换元件上方具有开口的导电性遮光膜。

2. 发明授权

US07759151B2 Solid state imaging apparatus, imaging apparatus and solid state imaging apparatus manufacturing method 有权
标题翻译：固态成像装置，成像装置和固态成像装置的制造方法
公开(公告)号：US07759151B2
公开(公告)日：2010-07-20
申请号：US12015608
申请日：2008-01-17
申请人： Jiro Matsuda , Masanori Nagase , Shu Takahashi
发明人： Jiro Matsuda , Masanori Nagase , Shu Takahashi
IPC分类号： H01L21/00
CPC分类号： H01L27/14812 , H01L29/66954 , H01L29/76833
摘要： A solid state imaging apparatus comprises: a semiconductor substrate; a photoelectric converting portion on the semiconductor substrate; a light shielding film in a region excluding a light receiving surface of the photoelectric converting portion; and a P-type impurity layer between a lower surface of the light shielding film and the semiconductor substrate.
摘要翻译：固态成像装置包括：半导体衬底; 半导体基板上的光电转换部; 在除光电转换部的受光面以外的区域中的遮光膜; 以及在遮光膜的下表面和半导体衬底之间的P型杂质层。

3. 发明申请

US20080055449A1 Solid-state imaging device, driving method thereof, and imaging apparatus 有权
标题翻译：固态成像装置，其驱动方法和成像装置
公开(公告)号：US20080055449A1
公开(公告)日：2008-03-06
申请号：US11705766
申请日：2007-02-14
申请人： Masanori Nagase , Shu Takahashi , Jiro Matsuda , Mitsuru Iwata , Shinji Uya
发明人： Masanori Nagase , Shu Takahashi , Jiro Matsuda , Mitsuru Iwata , Shinji Uya
IPC分类号： H04N3/14
CPC分类号： H04N5/359 , H01L27/14818 , H04N5/3728
摘要： A solid-state imaging device comprises: a semiconductor substrate; a plurality of photoelectric conversion elements formed in a surface portion of the semiconductor substrate in the form of a two-dimensional array so as to comprise a plurality of sets, each comprising a subset of the photoelectric conversion elements arranged in one direction; charge transfer paths each formed at a side portion of the subset of the photoelectric conversion elements to cause a signal charge of the photoelectric conversion elements be read out when a readout pulse is applied and cause the signal charge which has been read out to be transferred when a transfer pulse is applied; and an electrically conductive light shielding film which is laminated on a surface of the semiconductor substrate through an insulating layer and has openings immediately above each of the photoelectric conversion elements.
摘要翻译：固态成像装置包括：半导体衬底; 多个光电转换元件，形成在二维阵列形式的半导体衬底的表面部分中，以便包括多个集合，每个集合包括沿一个方向布置的光电转换元件的子集; 当施加读出脉冲时，每个形成在光电转换元件的子集的侧部处的电荷传输路径以引起光电转换元件的信号电荷，并且当已经读出的信号电荷被传送时，施加转移脉冲; 以及通过绝缘层层叠在半导体基板的表面上并且在每个光电转换元件上方具有开口的导电性遮光膜。

4. 发明申请

US20080173905A1 SOLID STATE IMAGING DEVICE AND METHOD OF MANUFACTURING THE SAME 有权
标题翻译：固态成像装置及其制造方法
公开(公告)号：US20080173905A1
公开(公告)日：2008-07-24
申请号：US11952755
申请日：2007-12-07
申请人： Masanori NAGASE , Jiro Matsuda , Tsuneo Sasamoto , Toshiaki Hayakawa
发明人： Masanori NAGASE , Jiro Matsuda , Tsuneo Sasamoto , Toshiaki Hayakawa
IPC分类号： H01L27/148 , H01L31/18
CPC分类号： H01L29/76858 , H01L27/14621 , H01L27/14683 , H01L27/14806 , H01L27/14818 , H01L27/14843
摘要： A solid state imaging device comprises: a photoelectric converting portion provided on a semiconductor substrate; a charge transfer path, formed in an adjacent position to the photoelectric converting portion, that receives a signal charge generated in the photoelectric converting portion and transfers the signal charge in a predetermined direction; and a gate electrode that transfers the signal charge from the photoelectric converting portion to the charge transfer path, wherein the gate electrode comprises polysilicon having a different conductive type from that of a semiconductor region forming a charge storing portion of the charge transfer path.
摘要翻译：固态成像装置包括：设置在半导体衬底上的光电转换部; 形成在与光电转换部相邻的位置的电荷传输路径，其接收在光电转换部中产生的信号电荷，并沿预定方向传送信号电荷; 以及栅极电极，其将信号电荷从光电转换部分传送到电荷传输路径，其中栅电极包括与形成电荷转移路径的电荷存储部分的半导体区域的导电类型不同的多晶硅。

5. 发明授权

US07714401B2 Solid state imaging device and method of manufacturing the same 有权
标题翻译：固态成像装置及其制造方法
公开(公告)号：US07714401B2
公开(公告)日：2010-05-11
申请号：US11952755
申请日：2007-12-07
申请人： Masanori Nagase , Jiro Matsuda , Tsuneo Sasamoto , Toshiaki Hayakawa
发明人： Masanori Nagase , Jiro Matsuda , Tsuneo Sasamoto , Toshiaki Hayakawa
IPC分类号： H01L27/14
CPC分类号： H01L29/76858 , H01L27/14621 , H01L27/14683 , H01L27/14806 , H01L27/14818 , H01L27/14843
摘要： A solid state imaging device comprises: a photoelectric converting portion provided on a semiconductor substrate; a charge transfer path, formed in an adjacent position to the photoelectric converting portion, that receives a signal charge generated in the photoelectric converting portion and transfers the signal charge in a predetermined direction; and a gate electrode that transfers the signal charge from the photoelectric converting portion to the charge transfer path, wherein the gate electrode comprises polysilicon having a different conductive type from that of a semiconductor region forming a charge storing portion of the charge transfer path.
摘要翻译：固态成像装置包括：设置在半导体衬底上的光电转换部; 形成在与光电转换部相邻的位置的电荷传输路径，其接收在光电转换部中产生的信号电荷，并沿预定方向传送信号电荷; 以及栅极电极，其将信号电荷从光电转换部分传送到电荷传输路径，其中栅电极包括与形成电荷转移路径的电荷存储部分的半导体区域的导电类型不同的多晶硅。

6. 发明授权

US06513253B2 Method for evaluating measurement error in coordinate measuring machine and gauge for coordinate measuring machine 失效
标题翻译：坐标测量机测量误差估算方法和坐标测量机测量方法
公开(公告)号：US06513253B2
公开(公告)日：2003-02-04
申请号：US09777956
申请日：2001-02-07
申请人： Jiro Matsuda , Susumu Asanuma , Masanori Shibata
发明人： Jiro Matsuda , Susumu Asanuma , Masanori Shibata
IPC分类号： G01C2500
CPC分类号： G01B21/042 , G01B3/30
摘要： A gauge for a coordinate measuring machine has a plurality of balls whose centers are located on at least one line inclined with respect to a reference axis in a virtual reference plane. The gauge is set on a measuring table of the coordinate measuring machine. Orthogonal coordinates in which one of the coordinate axes is identical to the reference axis are set in the virtual reference plane. The coordinates of the center of each ball are measured by the coordinate measuring machine. Thereafter, the gauge is turned and inverted by 180 degrees about the reference axis and is set again on the measuring table. Orthogonal coordinates in which one of the coordinate axes is identical to the reference axis are set in the virtual reference plane. The coordinates of the center of each ball are measured in the same way as above. Thus, measurement errors of the straightness of the machine axes of the coordinate measuring machine and the orthogonality between the machine axes can be easily and precisely evaluated.
摘要翻译：用于坐标测量机的量规具有多个球，其中心位于相对于虚拟参考平面中的参考轴线倾斜的至少一条线上。量规设在坐标测量机的测量台上。坐标轴中的一个坐标轴与参考轴相同的正交坐标被设置在虚拟参考平面中。每个球的中心坐标由坐标测量机测量。此后，量规绕参考轴线转动并反转180度，并再次设置在测量台上。坐标轴中的一个坐标轴与参考轴相同的正交坐标被设置在虚拟参考平面中。以与上述相同的方式测量每个球的中心坐标。因此，可以容易且精确地评估坐标测量机的机器轴线的平直度和机器轴之间的正交性的测量误差。

7. 发明授权

US08514312B2 Image sensor and image-reading device 有权
标题翻译：图像传感器和图像读取装置
公开(公告)号：US08514312B2
公开(公告)日：2013-08-20
申请号：US12610620
申请日：2009-11-02
申请人： Jiro Matsuda
发明人： Jiro Matsuda
IPC分类号： H04N3/14 , H04N5/335
CPC分类号： H01L27/14825 , H01L27/14812
摘要： An image sensor includes: a charge generating unit that generates a charge in response to light, and has a potential well that stores the charge; a first charge storage unit the first charge storage unit having a potential well deeper than the potential well of the charge generating unit and storing a charge transferred from the charge generating unit; a first electrode covering an end of the charge generating unit, to which a voltage is applied, to form a gradient of a potential so that a charge stored in the charge generating unit is transferred to the first charge storage unit; and a second electrode covering a part of the charge generating unit, to which a voltage is applied to make a part of the potential well of the charge generating unit shallow, the shallow part corresponding to the part of the charge generating unit covered by the second electrode.
摘要翻译：图像传感器包括：电荷产生单元，其响应于光而产生电荷，并且具有存储电荷的势阱; 第一电荷存储单元，所述第一电荷存储单元具有比所述电荷产生单元的势阱更深的电位并存储从所述电荷产生单元传送的电荷; 覆盖电荷产生单元的端部的第一电极，施加电压以形成电位梯度，使得存储在电荷产生单元中的电荷被转移到第一电荷存储单元; 以及覆盖所述电荷产生单元的一部分的第二电极，施加电压以使所述电荷产生单元的所述势阱的一部分较浅的所述浅电极对应于由所述电荷产生单元覆盖的所述电荷产生单元的部分电极。

8. 发明申请

US20070003129A1 Semiconductor device-inspecting apparatus and semiconductor device-inspecting method 审中-公开
标题翻译：半导体装置检查装置及半导体装置检查方法
公开(公告)号：US20070003129A1
公开(公告)日：2007-01-04
申请号：US11475071
申请日：2006-06-27
申请人： Jiro Matsuda
发明人： Jiro Matsuda
IPC分类号： G06K9/00
CPC分类号： G01N21/956
摘要： An inspection apparatus for inspecting a pattern on a semiconductor substrate is provided and includes: an inspection unit having an objective lens for the inspecting; a table supporting a semiconductor substrate, the table being capable of rotating with respect to the inspection unit; and a position-controlling unit that rotates the table an angle relative to the inspection unit and fixes the table at a position of the angle.
摘要翻译：提供了一种用于检查半导体衬底上的图案的检查装置，包括：具有用于检查的物镜的检查单元; 支撑半导体衬底的工作台，该工作台能够相对于检查单元旋转; 以及位置控制单元，其使所述工作台相对于所述检查单元旋转角度，并将所述工作台固定在所述角度的位置。

9. 发明授权

US08643916B2 Reading device 有权
标题翻译：阅读设备
公开(公告)号：US08643916B2
公开(公告)日：2014-02-04
申请号：US13481175
申请日：2012-05-25
申请人： Hirokazu Ichikawa , Yoshiro Yamaguchi , Eigo Nakagawa , Jiro Matsuda
发明人： Hirokazu Ichikawa , Yoshiro Yamaguchi , Eigo Nakagawa , Jiro Matsuda
IPC分类号： H04N1/04
CPC分类号： H04N1/4076 , H04N1/02865 , H04N1/0312 , H04N1/12 , H04N1/193
摘要： A reading device includes a first illuminating section that illuminates a reading area with first illumination light of a first direction; a second illuminating section that illuminates the reading area with second illumination light of a second direction; a light-receiving section that receives reflection light of the first illumination light and reflection light of the second illumination light reflected from the reading area, the first illumination light being applied from the first illuminating section and the second illumination light being applied from the second illuminating section; and reflecting members that are disposed side by side in the reading area in a widthwise direction thereof, and that have first and second reflecting surfaces.
摘要翻译：读取装置包括：第一照明部，其利用第一方向的第一照明光照亮读取区域; 第二照明部，其利用第二方向的第二照明光照亮所述读取区域; 受光部，其接收第一照明光的反射光和从读取区域反射的第二照明光的反射光，第一照明光从第一照明部施加，第二照明光从第二照明部分; 以及在读取区域中沿其宽度方向并排布置并且具有第一和第二反射表面的反射构件。

10. 发明申请

US20050066534A1 Gauge for three-dimensional coordinate measurer 审中-公开
标题翻译：三维坐标测量仪
公开(公告)号：US20050066534A1
公开(公告)日：2005-03-31
申请号：US10488182
申请日：2003-05-06
申请人： Jiro Matsuda
发明人： Jiro Matsuda
IPC分类号： G01B5/00 , G01B5/012 , G01B5/016 , G01B5/24 , G01B5/245 , G01B5/28 , G01B21/00 , G01B21/04 , G01D21/00
CPC分类号： G01B21/042 , G01B3/30
摘要： A gauge (10) for a three-dimensional coordinate measurer fixed onto the measurement table of the three-dimensional coordinate measurer to measure by utilizing the center-to-center distances of spheres and the axis and plane formed of the centers of the plurality of spheres, wherein fitting grooves (2) are formed in the surface of a cylindrical or conical holding body (1) and spherical fixing members (4) having the plurality of spheres (3) arranged thereon are fixedly fitted to the fitting grooves (2), and a standard ring gauge (5) is formed in the holding body (1), whereby three items, that are, scale calibration, straightness, and squareness of the three-dimensional coordinate measurer can be evaluated simultaneously merely by one measurement.
摘要翻译：用于三维坐标测量器的量规（10），其固定在三维坐标测量器的测量台上，以通过利用球体的中心到中心的距离以及由多个球体，其中在圆柱形或锥形保持体（1）的表面中形成有配合槽（2），并且具有布置在其上的多个球体（3）的球形固定构件（4）固定地配合到装配槽（2），并且在保持体（1）中形成标准环规（5），由此可以通过一次测量同时评估三维坐标测量器的三个项目，即刻度校准，直线度和矩形度。

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