专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US07266468B1 Structural data analysis system 有权
标题翻译：结构数据分析系统
公开(公告)号：US07266468B1
公开(公告)日：2007-09-04
申请号：US11367802
申请日：2006-03-03
申请人： Jiri Gardavsky , Jim Roan , Yu Guo , Hannes Loferer , Richard A. Krakowski
发明人： Jiri Gardavsky , Jim Roan , Yu Guo , Hannes Loferer , Richard A. Krakowski
IPC分类号： G01D1/00
CPC分类号： G06K9/6253 , G06T7/0006 , G06T2207/30108 , Y02T10/82
摘要： A system and method for identifying significant bivariate checkpoints. The system includes a controller configured to receive measurements for a plurality of checkpoints and calculate the covariance and correlation for each checkpoint pair. The controller identifies significant bivariate checkpoints based on the covariance between the checkpoint pairs. Further, the controller may also calculate the correlation for each checkpoint pair and identify the significant bivariate checkpoints based on a combination of the covariance and the correlation between the checkpoints. Further, the controller may rank the significant bivariate checkpoints and provide the significant bivariate checkpoints to a principal component algorithm.
摘要翻译：用于识别重要双变量检查点的系统和方法。该系统包括被配置为接收多个检查点的测量并计算每个检查点对的协方差和相关性的控制器。控制器根据检查点对之间的协方差识别重要的双变量检查点。此外，控制器还可以计算每个检查点对的相关性，并且基于协方差和检查点之间的相关性的组合来识别有效的双变量检查点。此外，控制器可对重要的双变量检查点进行排序，并向主成分算法提供有效的双变量检查点。

2. 发明授权

US08014002B2 Contour sensor incorporating MEMS mirrors 有权
标题翻译：轮廓传感器结合MEMS镜
公开(公告)号：US08014002B2
公开(公告)日：2011-09-06
申请号：US12416463
申请日：2009-04-01
申请人： Shyam P. Keshavmurthy , Chengchih Lin , Alfred A. Pease , Richard A. Krakowski
发明人： Shyam P. Keshavmurthy , Chengchih Lin , Alfred A. Pease , Richard A. Krakowski
IPC分类号： G01B11/24
CPC分类号： G01B11/2509 , G01B11/2513 , G01B11/2518
摘要： A structured light sensor system for measuring contour of a surface includes an imaging lens system, an image capturing device, a first set of micro electromechanical system (MEMS) mirrors, and a control module. The imaging lens system focuses light reflected from the surface, wherein the imaging lens system has a corresponding lens plane. The image capturing device captures the focused light and generates data corresponding to the captured light, wherein the image capturing device has a corresponding image plane that is not parallel to the lens plane. The first set of MEMS mirrors direct the focused light to the image capturing device. The control module receives the data, determines a quality of focus of the captured light based on the received data, and controls the first set of MEMS mirrors based on the quality of focus to maintain a Scheimpflug tilt condition between the lens plane and the image plane.
摘要翻译：用于测量表面轮廓的结构光传感器系统包括成像透镜系统，图像捕获装置，第一组微机电系统（MEMS）镜和控制模块。成像透镜系统对从表面反射的光进行聚焦，其中成像透镜系统具有对应的透镜平面。图像捕获装置捕获聚焦的光并产生与所捕获的光对应的数据，其中，图像捕获装置具有不与透镜平面平行的对应的图像平面。第一组MEMS镜将聚焦光引导到图像捕获装置。控制模块接收数据，基于接收到的数据确定捕获光的焦点质量，并且基于聚焦质量来控制第一组MEMS反射镜，以保持透镜平面和图像平面之间的Scheimpflug倾斜状态。

3. 发明申请

US20090262363A1 CONTOUR SENSOR INCORPORATING MEMS MIRRORS 有权
标题翻译： CONTOUR传感器并入MEMS镜
公开(公告)号：US20090262363A1
公开(公告)日：2009-10-22
申请号：US12416463
申请日：2009-04-01
申请人： Shyam P. Keshavmurthy , Chengchih Lin , Alfred A. Pease , Richard A. Krakowski
发明人： Shyam P. Keshavmurthy , Chengchih Lin , Alfred A. Pease , Richard A. Krakowski
IPC分类号： G01B11/24 , G12B13/00
CPC分类号： G01B11/2509 , G01B11/2513 , G01B11/2518
摘要： A structured light sensor system for measuring contour of a surface includes an imaging lens system, an image capturing device, a first set of micro electromechanical system (MEMS) mirrors, and a control module. The imaging lens system focuses light reflected from the surface, wherein the imaging lens system has a corresponding lens plane. The image capturing device captures the focused light and generates data corresponding to the captured light, wherein the image capturing device has a corresponding image plane that is not parallel to the lens plane. The first set of MEMS mirrors direct the focused light to the image capturing device. The control module receives the data, determines a quality of focus of the captured light based on the received data, and controls the first set of MEMS mirrors based on the quality of focus to maintain a Scheimpflug tilt condition between the lens plane and the image plane.
摘要翻译：用于测量表面轮廓的结构光传感器系统包括成像透镜系统，图像捕获装置，第一组微机电系统（MEMS）镜和控制模块。成像透镜系统对从表面反射的光进行聚焦，其中成像透镜系统具有对应的透镜平面。图像捕获装置捕获聚焦的光并产生与所捕获的光对应的数据，其中，图像捕获装置具有不与透镜平面平行的对应的图像平面。第一组MEMS镜将聚焦光引导到图像捕获装置。控制模块接收数据，基于接收到的数据确定捕获光的焦点质量，并且基于聚焦质量来控制第一组MEMS反射镜，以保持透镜平面和图像平面之间的Scheimpflug倾斜状态。

4. 发明授权

US09013711B2 Contour sensor incorporating MEMS mirrors 有权
标题翻译：轮廓传感器结合MEMS镜
公开(公告)号：US09013711B2
公开(公告)日：2015-04-21
申请号：US13205160
申请日：2011-08-08
申请人： Shyam P. Keshavmurthy , Chengchih Lin , Alfred A. Pease , Richard A. Krakowski
发明人： Shyam P. Keshavmurthy , Chengchih Lin , Alfred A. Pease , Richard A. Krakowski
IPC分类号： G01B11/02 , G01B11/25
CPC分类号： G01B11/2509 , G01B11/2513 , G01B11/2518
摘要： A structured light sensor system for measuring contour of a surface includes a control module that coordinates control of both a projection system and an imaging system to operate the structured light sensor system in three different modes. The imaging system is configured to selectively capture an image of light reflected off of the surface. In point mode, the imaging system is on for a first period during which the projection system projects a point of light onto the surface. In line mode, the imaging system is on for a second period during which the projection system projects onto the surface a first plurality of points of light forming a line of light. In area mode, the imaging system is on for a third period during which the projection system projects onto the surface a second plurality of points of light forming a plurality of lines of light.
摘要翻译：用于测量表面轮廓的结构化光传感器系统包括控制模块，该控制模块协调投影系统和成像系统的控制，以以三种不同的模式操作结构化光传感器系统。成像系统被配置为选择性地捕获从表面反射的光的图像。在点模式下，成像系统打开第一时段，在此期间投影系统将光点投射到表面上。在线模式下，成像系统打开第二时段，在此期间投影系统将形成一条光线的第一组多个光点投射到表面上。在区域模式中，成像系统打开第三时段，在此期间投影系统将形成多条光线的第二组多个点投射到表面上。

5. 发明申请

US20110313721A1 CONTOUR SENSOR INCORPORATING MEMS MIRRORS 有权
标题翻译： CONTOUR传感器并入MEMS镜
公开(公告)号：US20110313721A1
公开(公告)日：2011-12-22
申请号：US13205160
申请日：2011-08-08
申请人： Shyam P. Keshavmurthy , Chengchih Lin , Alfred A. Pease , Richard A. Krakowski
发明人： Shyam P. Keshavmurthy , Chengchih Lin , Alfred A. Pease , Richard A. Krakowski
IPC分类号： G01B11/24 , G01B11/28
CPC分类号： G01B11/2509 , G01B11/2513 , G01B11/2518
摘要： A structured light sensor system for measuring contour of a surface includes a control module that coordinates control of both a projection system and an imaging system to operate the structured light sensor system in three different modes. The imaging system is configured to selectively capture an image of light reflected off of the surface. In point mode, the imaging system is on for a first period during which the projection system projects a point of light onto the surface. In line mode, the imaging system is on for a second period during which the projection system projects onto the surface a first plurality of points of light forming a line of light. In area mode, the imaging system is on for a third period during which the projection system projects onto the surface a second plurality of points of light forming a plurality of lines of light.
摘要翻译：用于测量表面轮廓的结构化光传感器系统包括控制模块，该控制模块协调投影系统和成像系统的控制，以以三种不同的模式操作结构化光传感器系统。成像系统被配置为选择性地捕获从表面反射的光的图像。在点模式下，成像系统打开第一时段，在此期间投影系统将光点投射到表面上。在线模式下，成像系统打开第二时段，在此期间投影系统将形成一条光线的第一组多个光点投射到表面上。在区域模式中，成像系统打开第三时段，在此期间投影系统将形成多条光线的第二组多个点投射到表面上。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式