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1. 发明授权

US06977379B2 T-ray Microscope 有权
标题翻译： T型显微镜
公开(公告)号：US06977379B2
公开(公告)日：2005-12-20
申请号：US10434329
申请日：2003-05-08
申请人： Xi-Cheng Zhang , Jingzhou Xu , Tao Yuan
发明人： Xi-Cheng Zhang , Jingzhou Xu , Tao Yuan
IPC分类号： G01N21/35 , G02B21/00
CPC分类号： G01N21/3581 , G01N21/3563 , G02B21/00
摘要： A microscope for producing an image of a target using THz radiation. The microscope comprises a source for providing an optical pump pulse and an optical probe pulse; a THz emitter for activation by pump pulse to emit a THz pulse that irradiates the target to form a target-modified THz pulse; a THz detector for modulating the probe pulse with the target-modified THz pulse to create a modulated optical probe pulse characteristic of the target; an optical detection system for modifying and detecting the modulated optical probe pulse and converting the modulated optical probe pulse to electronic information; and a processor for receiving the electronic information and producing an image of the sample using the electronic information. The THz emitter and detector comprise one or more EO crystals. The target is positioned on one of the EO crystals in a near-field of the THz pulse.
摘要翻译：用于使用太赫兹辐射产生目标图像的显微镜。显微镜包括用于提供光泵浦脉冲和光探针脉冲的源; 用于通过泵浦脉冲激活的THz发射器发射照射目标以形成目标修正的THz脉冲的THz脉冲; THz检测器，用于用目标修正的THz脉冲调制探针脉冲，以产生目标的调制光探针脉冲特性; 光学检测系统，用于修改和检测调制的光探针脉冲并将调制的光探针脉冲转换成电子信息; 以及处理器，用于接收电子信息并使用电子信息产生样本的图像。太赫兹发射器和检测器包括一个或多个EO晶体。目标位于太赫兹脉冲的近场中的一个EO晶体上。

2. 发明授权

US07557348B2 Method and system for imaging an object using multiple distinguishable electromagnetic waves transmitted by a source array 有权
标题翻译：使用由源阵列传输的多个可分辨的电磁波对物体进行成像的方法和系统
公开(公告)号：US07557348B2
公开(公告)日：2009-07-07
申请号：US11733613
申请日：2007-04-10
申请人： Jingzhou Xu , Xi-Cheng Zhang
发明人： Jingzhou Xu , Xi-Cheng Zhang
IPC分类号： G01J5/02
CPC分类号： G01J3/10 , G01J3/42 , G01N21/3581
摘要： A method and system for imaging an object includes transmitting distinguishable electromagnetic waves from a plurality of radiators of an antenna array, wherein each of the distinguishable electromagnetic waves is distinguishable from others by a detector. Each of the radiators transmits radiation comprising a different distinguishable electromagnetic wave. The method also includes imaging at least a portion of the antenna array onto a targeted object, wherein each image area of a plurality of image areas on the targeted object corresponds to an image of a respective radiator of the antenna array, and detecting a plurality of resultant electromagnetic waves, wherein the resultant electromagnetic waves are transmitted, scattered, or reflected by respective image areas on the targeted object in response to each of the respective image areas being illuminated by the radiation transmitted by the respective radiator of the source array.
摘要翻译：用于成像对象的方法和系统包括从天线阵列的多个辐射器发送可区分的电磁波，其中每个可区分电磁波通过检测器与其他可区别的电磁波区分开。每个辐射器发射包括不同的可分辨电磁波的辐射。该方法还包括将天线阵列的至少一部分成像到目标物体上，其中目标物体上的多个图像区域中的每个图像区域对应于天线阵列的相应散热器的图像，并且检测多个响应于由源阵列的相应散热器发射的辐射照射的每个相应的图像区域，由此产生的电磁波由目标物体上的各个图像区域传播，散射或反射。

3. 发明申请

US20080179526A1 METHOD AND SYSTEM FOR IMAGING AN OBJECT USING MULTIPLE DISTINGUISHABLE ELECTROMAGNETIC WAVES TRANSMITTED BY A SOURCE ARRAY 有权
标题翻译：用源图像传输多个可辨识的电磁波成像对象的方法和系统
公开(公告)号：US20080179526A1
公开(公告)日：2008-07-31
申请号：US11733613
申请日：2007-04-10
申请人： Jingzhou XU , Xi-Cheng Zhang
发明人： Jingzhou XU , Xi-Cheng Zhang
IPC分类号： G01J1/42
CPC分类号： G01J3/10 , G01J3/42 , G01N21/3581
摘要： A method and system for imaging an object includes transmitting distinguishable electromagnetic waves from a plurality of radiators of an antenna array, wherein each of the distinguishable electromagnetic waves is distinguishable from others by a detector. Each of the radiators transmits radiation comprising a different distinguishable electromagnetic wave. The method also includes imaging at least a portion of the antenna array onto a targeted object, wherein each image area of a plurality of image areas on the targeted object corresponds to an image of a respective radiator of the antenna array, and detecting a plurality of resultant electromagnetic waves, wherein the resultant electromagnetic waves are transmitted, scattered, or reflected by respective image areas on the targeted object in response to each of the respective image areas being illuminated by the radiation transmitted by the respective radiator of the source array.
摘要翻译：用于成像对象的方法和系统包括从天线阵列的多个辐射器发送可区分的电磁波，其中每个可区分电磁波通过检测器与其他可区别的电磁波区分开。每个辐射器发射包括不同的可分辨电磁波的辐射。该方法还包括将天线阵列的至少一部分成像到目标物体上，其中目标物体上的多个图像区域中的每个图像区域对应于天线阵列的相应散热器的图像，并且检测多个响应于由源阵列的相应散热器发射的辐射照射的每个相应的图像区域，由此产生的电磁波由目标物体上的各个图像区域传播，散射或反射。

4. 发明申请

US20070009207A1 High repetition rate, linear, true time optical delay line 审中-公开
公开(公告)号：US20070009207A1
公开(公告)日：2007-01-11
申请号：US10537626
申请日：2005-03-08
申请人： Jingzhou Xu , Xi-Cheng Zhang
发明人： Jingzhou Xu , Xi-Cheng Zhang
IPC分类号： G02B6/26
CPC分类号： G02B5/10 , G02B6/2861 , G02B6/424 , G02B6/4244
摘要： An optical delay line for use with an optical source including input/output optics optically coupled to the optical source and a curved mirror with a reflective surface that is centered about an evolute curve of the delay line to retro-reflect light traveling along a delay line beam path tangent to the edge of the evolute curve. The input/output optics direct light from the optical source along the delay line beam path and direct delayed light from the delay line beam path out of the optical delay line along an output beam path. The input/output optics and/or the curved mirror rotate about the evolute curve at a selected angular speed. The reflective surface has a curvature based on a parametric curve that is calculated from the evolute curve such that the delay of the delay line varies according to a predetermined function as the input/output optics and/or the curved mirror rotate.

5. 发明授权

US07091506B2 Semiconductor surface-field emitter for T-ray generation 有权
标题翻译：用于T射线产生的半导体表面场发射器
公开(公告)号：US07091506B2
公开(公告)日：2006-08-15
申请号：US10828654
申请日：2004-04-21
申请人： Xi-Cheng Zhang , Jingzhou Xu , Kai Liu
发明人： Xi-Cheng Zhang , Jingzhou Xu , Kai Liu
IPC分类号： G01J5/00
CPC分类号： G01J3/10 , G02F2203/13
摘要： An apparatus and a method for the generation of high-energy terahertz radiation. The apparatus and method function by impinging optical radiation on the surface of a semiconductor substrate, creating a photo-generated dipole emitting terahertz radiation. Because it is desirable to orient the dipole perpendicular to the radiation direction to maximize the power of the terahertz radiation, the surface of the semiconductor is modified to achieve this desirable result. More specifically, three embodiments of the surface modification are disclosed: (1) a grating is created in the top surface of a GaAs semiconductor substrate, (2) an InAs film is formed on a Teflon base to create a grating structure on the semiconductor substrate, and (3) a grating is disposed in the surface of the semiconductor substrate such that the optical radiation engages the substrate at Brewster's angle.
摘要翻译：用于产生高能太赫兹辐射的装置和方法。该装置和方法通过将光辐射照射在半导体衬底的表面上，产生光产生的偶极发射太赫兹辐射。因为期望使偶极子垂直于辐射方向定向以使太赫兹辐射的功率最大化，所以修改半导体的表面以实现该期望的结果。更具体地，公开了表面改性的三个实施例：（1）在GaAs半导体衬底的顶表面中形成光栅，（2）在特氟隆基底上形成InAs膜，以在半导体衬底上形成光栅结构，和（3）在半导体衬底的表面中设置光栅，使得光辐射以布鲁斯特角接合衬底。

6. 发明授权

US08796653B2 Terahertz radiation source mounting arrangements and methods of mounting a terahertz source 有权
标题翻译：太赫兹辐射源安装布置和安装太赫兹源的方法
公开(公告)号：US08796653B2
公开(公告)日：2014-08-05
申请号：US12886131
申请日：2010-09-20
申请人： Brian Schulkin , Xi-Cheng Zhang , Thomas Tongue , Jingzhou Xu , Jian Chen
发明人： Brian Schulkin , Xi-Cheng Zhang , Thomas Tongue , Jingzhou Xu , Jian Chen
IPC分类号： H01J29/02 , H01S5/022
CPC分类号： G21K5/00 , B33Y80/00 , G01J4/00 , G01N21/211 , G01N21/3581 , H01S5/02236 , H01S2302/02
摘要： Methods and apparatus for detecting variations in electromagnetic fields, in particular, terahertz (THz) electromagnetic fields, are provided. The methods and apparatus employ polarization detection devices and controllers to maintain or vary the polarization of modulated signals as desired. The methods and apparatus are provided to characterize electromagnetic fields by directing the electromagnetic field and a probe beam upon an electro-crystal and detecting the modulation of the resulting probe beam. Detection of the modulation of the probe beam is practiced by detecting and comparing the polarization components of the modulated probe beam. Aspects of the invention may be used to analyze or detect explosives, explosive related compounds, and pharmaceuticals, among other substances. A compact apparatus, modular optical devices for use with the apparatus, sample holders, and radiation source mounts are also disclosed.
摘要翻译：提供了用于检测电磁场，特别是太赫兹（THz）电磁场的变化的方法和装置。所述方法和装置使用偏振检测装置和控制器来根据需要维持或改变调制信号的极化。提供的方法和装置用于通过将电磁场和探针光束引导到电晶体上并检测所得到的探针光束的调制来表征电磁场。通过检测和比较调制探测光束的偏振分量来实现探测光束的调制的检测。本发明的方面可用于分析或检测爆炸物，爆炸性相关化合物和药物等物质。还公开了一种紧凑的装置，用于装置，样品架和辐射源底座的模块化光学装置。

7. 发明授权

US07808636B2 Systems, methods, and devices for handling terahertz radiation 有权
标题翻译：用于处理太赫兹辐射的系统，方法和装置
公开(公告)号：US07808636B2
公开(公告)日：2010-10-05
申请号：US12013167
申请日：2008-01-11
申请人： Brian Schulkin , Xi-Cheng Zhang , Thomas Tongue , Jingzhou Xu , Jian Chen
发明人： Brian Schulkin , Xi-Cheng Zhang , Thomas Tongue , Jingzhou Xu , Jian Chen
IPC分类号： G01J4/00
CPC分类号： G21K5/00 , B33Y80/00 , G01J4/00 , G01N21/211 , G01N21/3581 , H01S5/02236 , H01S2302/02
摘要： Methods and apparatus for detecting variations in electromagnetic fields, in particular, terahertz (THz) electromagnetic fields, are provided. The methods and apparatus employ polarization detection devices and controllers to maintain or vary the polarization of modulated signals as desired. The methods and apparatus are provided to characterize electromagnetic fields by directing the electromagnetic field and a probe beam upon an electro-crystal and detecting the modulation of the resulting probe beam. Detection of the modulation of the probe beam is practiced by detecting and comparing the polarization components of the modulated probe beam. Aspects of the invention may be used to analyze or detect explosives, explosive related compounds, and pharmaceuticals, among other substances. A compact apparatus, modular optical devices for use with the apparatus, sample holders, and radiation source mounts are also disclosed.
摘要翻译：提供了用于检测电磁场，特别是太赫兹（THz）电磁场的变化的方法和装置。所述方法和装置使用偏振检测装置和控制器来根据需要维持或改变调制信号的极化。提供的方法和装置用于通过将电磁场和探针光束引导到电晶体上并检测所得到的探针光束的调制来表征电磁场。通过检测和比较调制探测光束的偏振分量来实现探测光束的调制的检测。本发明的方面可用于分析或检测爆炸物，爆炸性相关化合物和药物等物质。还公开了一种紧凑的装置，用于装置，样品架和辐射源底座的模块化光学装置。

8. 发明授权

US07230245B2 Field induced THz wave emission microscope 有权
标题翻译：场诱发太赫兹波发射显微镜
公开(公告)号：US07230245B2
公开(公告)日：2007-06-12
申请号：US11121385
申请日：2005-05-04
申请人： Xi-Cheng Zhang , Tao Yuan , Jingzhou Xu , Haewook Han
发明人： Xi-Cheng Zhang , Tao Yuan , Jingzhou Xu , Haewook Han
IPC分类号： G01J5/02
CPC分类号： G01Q60/12 , G01N21/3563 , G01N21/3581
摘要： A device for use with a source of radiation to provide a THz emission image representing a sample. The device comprises a substrate, a metallic probe having a tip adjacent to the substrate surface and a source of AC bias coupled between the probe tip and substrate. Radiation generated by the source of radiation is incident on the substrate surface in the vicinity of the probe tip and generates THz emission based at least on the AC bias coupled between the probe tip and substrate. A method for providing a THz emission image representing a sample is also provided.
摘要翻译：一种与辐射源一起使用以提供表示样品的THz发射图像的装置。该器件包括衬底，具有与衬底表面相邻的尖端的金属探针和耦合在探针尖端和衬底之间的AC偏压源。由辐射源产生的辐射入射到探针尖端附近的衬底表面上，并且至少基于耦合在探针尖端和衬底之间的AC偏压产生THz发射。还提供了一种用于提供表示样本的THz发射图像的方法。

9. 发明申请

US20060022141A1 Field induced THz wave emission microscope 有权
标题翻译：场诱发太赫兹波发射显微镜
公开(公告)号：US20060022141A1
公开(公告)日：2006-02-02
申请号：US11121385
申请日：2005-05-04
申请人： Xi-Cheng Zhang , Tao Yuan , Jingzhou Xu , Haewook Han
发明人： Xi-Cheng Zhang , Tao Yuan , Jingzhou Xu , Haewook Han
IPC分类号： G01J5/02
CPC分类号： G01Q60/12 , G01N21/3563 , G01N21/3581
摘要： A device for use with a source of radiation to provide a THz emission image representing a sample. The device comprises a substrate, a metallic probe having a tip adjacent to the substrate surface and a source of AC bias coupled between the probe tip and substrate. Radiation generated by the source of radiation is incident on the substrate surface in the vicinity of the probe tip and generates THz emission based at least on the AC bias coupled between the probe tip and substrate. A method for providing a THz emission image representing a sample is also provided.
摘要翻译：一种与辐射源一起使用以提供表示样品的THz发射图像的装置。该器件包括衬底，具有与衬底表面相邻的尖端的金属探针和耦合在探针尖端和衬底之间的AC偏压源。由辐射源产生的辐射入射到探针尖端附近的衬底表面上，并且至少基于耦合在探针尖端和衬底之间的AC偏压产生THz发射。还提供了一种用于提供表示样本的THz发射图像的方法。

10. 发明授权

US07242010B2 GaSe crystals for broadband terahertz wave detection 有权
标题翻译： GaSe晶体用于宽带太赫兹波检测
公开(公告)号：US07242010B2
公开(公告)日：2007-07-10
申请号：US11086623
申请日：2005-03-22
申请人： Kai Liu , Xi-Cheng Zhang , Jingzhou Xu
发明人： Kai Liu , Xi-Cheng Zhang , Jingzhou Xu
IPC分类号： G01J5/58
CPC分类号： G01J3/42 , G01N21/21 , G01N21/3581
摘要： A broad bandwidth detector to measure intensity information of terahertz (THz) frequency pulses. The detector includes: coupling optics coupled to a coherent optical source; a GaSe substrate aligned such that the probe beam path intersects a first surface at a phase-matching angle; a polarization detector aligned in the probe beam path; and calculation means coupled to the polarization detector. The coupling optics direct the probe optical beam along a beam path that is substantially collinear with the pulse beam path of the THz frequency pulses. The polarization of the probe optical beam is varied based on interactions between the probe optical beam and the THz frequency pulses within the GaSe substrate. The polarization detector detects the varied polarization of the probe optical beam. The calculation means determine the intensity information of the THz frequency pulses based on the detected probe polarization of the probe optical beam.
摘要翻译：用于测量太赫兹（THz）频率脉冲的强度信息的宽带宽检测器。检测器包括：耦合到相干光源的耦合光学器件; GaSe衬底对准，使得探针光束路径以相位匹配角度与第一表面相交; 在探测光束路径中对准的偏振检测器; 以及耦合到偏振检测器的计算装置。耦合光学器件沿着与THz频率脉冲的脉冲光束路径基本共线的光束路径来引导探测光束。基于探针光束和GaSe衬底内的THz频率脉冲之间的相互作用，探针光束的极化发生变化。偏振检测器检测探针光束的变化极化。计算装置根据探测光束的检测探头偏振来确定THz频率脉冲的强度信息。

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