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1. 发明申请

US20100194414A1 ELECTRO OPTICAL DETECTOR 审中-公开
标题翻译：电光学检测器
公开(公告)号：US20100194414A1
公开(公告)日：2010-08-05
申请号：US12443794
申请日：2008-03-07
申请人： Jin Kook Jun , Hyung II Jeon , Young Hoon Kim , Young Shik Park , Young Ryong Yoon , Myung Gi Seo , Dae Joong Yoon
发明人： Jin Kook Jun , Hyung II Jeon , Young Hoon Kim , Young Shik Park , Young Ryong Yoon , Myung Gi Seo , Dae Joong Yoon
IPC分类号： G01R31/308 , G01R31/26
CPC分类号： G02F1/1309 , G01R31/308 , G02F2001/136254 , G09G3/006
摘要： An electro-optical detecting device is disclosed. The electro-optical detecting device includes: an upper substrate and a lower substrate; a nematic liquid crystal layer interposed between the upper substrate and the lower substrate; a transparent electrode interposed between the nematic liquid crystal layer and the upper substrate, the transparent electrode connected to a device under test (DUT) via a power supply; a polarizing plate located over the nematic liquid crystal layer; and a reflecting plate located under the nematic liquid crystal layer. A method using the electro-optical detecting device includes applying a voltage between the transparent electrode and the BUT to generate an electric field across the liquid crystal layer; illuminating the detector and capturing an image of the detector using the light reflected from the detector: and determining the DUT has some defects from the image of the detector by an abnormal electric field generated between the transparent electrode and the DUT.
摘要翻译：公开了一种电光检测装置。电光检测装置包括：上基板和下基板; 插入在上基板和下基板之间的向列型液晶层; 插入在向列液晶层和上基板之间的透明电极，透明电极通过电源连接到被测器件（DUT）; 位于向列液晶层上方的偏振片; 以及位于向列型液晶层下方的反射板。使用电光检测装置的方法包括在透明电极和BUT之间施加电压以在液晶层两端产生电场; 照射检测器并使用从检测器反射的光捕获检测器的图像;并且通过在透明电极和DUT之间产生的异常电场来确定DUT具有来自检测器的图像的一些缺陷。

2. 发明授权

US08378708B2 Inspecting method using an electro optical detector 有权
标题翻译：使用电光检测器的检查方法
公开(公告)号：US08378708B2
公开(公告)日：2013-02-19
申请号：US12443793
申请日：2008-03-07
申请人： Jin Kook Jun , Hyung Il Jeon , Young Hoon Kim , Young Shik Park , Young Ryong Yoon , Myung Gi Seo , Dae Joong Yoon
发明人： Jin Kook Jun , Hyung Il Jeon , Young Hoon Kim , Young Shik Park , Young Ryong Yoon , Myung Gi Seo , Dae Joong Yoon
IPC分类号： G01R31/02
CPC分类号： G02F1/1309 , G01R31/308 , G02F2001/136254 , G09G3/006
摘要： An inspecting method using an electro-optical detecting device is disclosed. The electro-optical detecting device includes: an upper substrate and a lower substrate; a nematic liquid crystal layer interposed between the upper substrate and the lower substrate; a transparent electrode interposed between the nematic liquid crystal layer and the upper substrate, the transparent electrode connected to a device under test (DUT) via a power supply; a polarizing plate located over the nematic liquid crystal layer; and a reflecting plate located under the nematic liquid crystal layer. A method using the electro-optical detecting device includes applying a voltage between the transparent electrode and the DUT to generate an electric field across the liquid crystal layer; illuminating the detector and capturing an image of the detector using the light reflected from the detector; and determining the DUT has some defects from the image of the detector by an abnormal electric field generated between the transparent electrode and the DUT.
摘要翻译：公开了一种使用电光检测装置的检查方法。电光检测装置包括：上基板和下基板; 插入在上基板和下基板之间的向列型液晶层; 插入在向列液晶层和上基板之间的透明电极，透明电极通过电源连接到被测器件（DUT）; 位于向列液晶层上方的偏振片; 以及位于向列型液晶层下方的反射板。使用电光检测装置的方法包括在透明电极和DUT之间施加电压以在液晶层两端产生电场; 照射检测器并使用从检测器反射的光捕获检测器的图像; 并且通过在透明电极和DUT之间产生的异常电场，确定DUT具有来自检测器的图像的一些缺陷。

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