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1. 发明申请

US20070109003A1 Test Pads, Methods and Systems for Measuring Properties of a Wafer 审中-公开
标题翻译：测试垫，测量硅片性能的方法和系统
公开(公告)号：US20070109003A1
公开(公告)日：2007-05-17
申请号：US11465888
申请日：2006-08-21
申请人： Jianou Shi , Xiafang Zhang , Shiyou Pei , Shu Huang , Dennis Yeh , Jeffrey Rzepiela , Yiping Feng , Ahmad Khan
发明人： Jianou Shi , Xiafang Zhang , Shiyou Pei , Shu Huang , Dennis Yeh , Jeffrey Rzepiela , Yiping Feng , Ahmad Khan
IPC分类号： G01R31/02
CPC分类号： G01R31/2831 , G01R31/2856 , H01L22/34 , H01L2924/0002 , H01L2924/00
摘要： Test pads, methods, and systems for measuring properties of a wafer are provided. One test pad formed on a wafer includes a test structure configured such that one or more electrical properties of the test structure can be measured. The test pad also includes a conductive layer formed between the test structure and the wafer. The conductive layer prevents structures located under the test structure between the conductive layer and the wafer from affecting the one or more electrical properties of the test structure during measurement. One method for assessing plasma damage of a wafer includes measuring one or more electrical properties of a test structure formed on the wafer and determining an index characterizing the plasma damage of the test structure using the one or more electrical properties.
摘要翻译：提供了用于测量晶片性能的测试垫，方法和系统。形成在晶片上的一个测试焊盘包括测试结构，其被配置为使得可以测量测试结构的一个或多个电特性。测试垫还包括在测试结构和晶片之间形成的导电层。导电层防止在测量期间位于导电层和晶片之间的测试结构下方的结构影响测试结构的一个或多个电性能。用于评估晶片的等离子体损伤的一种方法包括测量形成在晶片上的测试结构的一个或多个电特性，并使用一个或多个电性质确定表征测试结构的等离子体损伤的指标。

2. 发明申请

US20070069759A1 Systems and Methods for Controlling Deposition of a Charge on a Wafer for Measurement of One or More Electrical Properties of the Wafer 有权
标题翻译：用于控制在晶片上沉积电荷以测量晶片的一个或多个电性能的系统和方法
公开(公告)号：US20070069759A1
公开(公告)日：2007-03-29
申请号：US11465893
申请日：2006-08-21
申请人： Jeffrey Rzepiela , Yiping Feng , Shiyou Pei , Alexander Kagan , Jianou Shi , Sergio Edelstein
发明人： Jeffrey Rzepiela , Yiping Feng , Shiyou Pei , Alexander Kagan , Jianou Shi , Sergio Edelstein
IPC分类号： G01R31/26
CPC分类号： G01R31/2831 , G01R31/2856 , H01L22/34 , H01L2924/0002 , H01L2924/00
摘要： Systems and methods for controlling deposition of a charge on a wafer for measurement of one or more electrical properties of the wafer are provided. One system includes a corona source configured to deposit the charge on the wafer and a sensor configured to measure one or more conditions within the corona source. This system also includes a control subsystem configured to alter one or more parameters of the corona source based on the one or more conditions. Another system includes a corona source configured to deposit the charge on the wafer and a mixture of gases disposed within a discharge chamber of the corona source during the deposition of the charge. The mixture of gases alters one or more parameters of the charge deposited on the wafer.
摘要翻译：提供了用于控制晶片上的电荷沉积以测量晶片的一个或多个电性能的系统和方法。一个系统包括配置成将电荷沉积在晶片上的电晕源和配置成测量电晕源内的一个或多个条件的传感器。该系统还包括配置为基于一个或多个条件来改变电晕源的一个或多个参数的控制子系统。另一种系统包括电晕源，其被配置为在电荷沉积期间将电荷沉积在晶片上以及布置在电晕源的放电室内的气体混合物。气体混合物改变沉积在晶片上的电荷的一个或多个参数。

3. 发明授权

US07893703B2 Systems and methods for controlling deposition of a charge on a wafer for measurement of one or more electrical properties of the wafer 有权
标题翻译：用于控制在晶片上沉积电荷以测量晶片的一个或多个电性能的系统和方法
公开(公告)号：US07893703B2
公开(公告)日：2011-02-22
申请号：US11465893
申请日：2006-08-21
申请人： Jeffrey A. Rzepiela , Yiping Feng , Shiyou Pei , Alexander Kagan , Jianou Shi , Sergio Edelstein
发明人： Jeffrey A. Rzepiela , Yiping Feng , Shiyou Pei , Alexander Kagan , Jianou Shi , Sergio Edelstein
IPC分类号： G01R31/308
CPC分类号： G01R31/2831 , G01R31/2856 , H01L22/34 , H01L2924/0002 , H01L2924/00
摘要： Systems and methods for controlling deposition of a charge on a wafer for measurement of one or more electrical properties of the wafer are provided. One system includes a corona source configured to deposit the charge on the wafer and a sensor configured to measure one or more conditions within the corona source. This system also includes a control subsystem configured to alter one or more parameters of the corona source based on the one or more conditions. Another system includes a corona source configured to deposit the charge on the wafer and a mixture of gases disposed within a discharge chamber of the corona source during the deposition of the charge. The mixture of gases alters one or more parameters of the charge deposited on the wafer.
摘要翻译：提供了用于控制晶片上的电荷沉积以测量晶片的一个或多个电性能的系统和方法。一个系统包括配置成将电荷沉积在晶片上的电晕源和配置成测量电晕源内的一个或多个条件的传感器。该系统还包括配置为基于一个或多个条件来改变电晕源的一个或多个参数的控制子系统。另一种系统包括电晕源，其被配置为在电荷沉积期间将电荷沉积在晶片上以及布置在电晕源的放电室内的气体混合物。气体混合物改变沉积在晶片上的电荷的一个或多个参数。

4. 发明授权

US07525304B1 Measurement of effective capacitance 失效
标题翻译：有效电容的测量
公开(公告)号：US07525304B1
公开(公告)日：2009-04-28
申请号：US11748207
申请日：2007-05-14
申请人： Yiping Feng , Jianou Shi , Xiafang Zhang
发明人： Yiping Feng , Jianou Shi , Xiafang Zhang
IPC分类号： G01R31/28 , G01R31/26
CPC分类号： G01R27/2605 , G01R31/2648
摘要： A method for determining an effective capacitance of a dielectric material, by forming first and second asymmetrical electrodes entirely within a field of the dielectric material, where the first electrode, the second electrode, and the field of the dielectric material are co-planar, neither the first electrode nor the second electrode are either electrically connected to ground or to each other, applying a first charge Q on the first electrode, measuring a first voltage change V1 on the first electrode, measuring a second voltage change V2 on the second electrode, depositing a second charge Q′ on the second electrode, measuring a third voltage change V3 on the first electrode, measuring a fourth voltage change V4 on the second electrode, calculating a first ground capacitance Cg1 by Cg1=(V2Q′−V4Q)/(V2V3−V1V4), calculating a second ground capacitance Cg2 by Cg2=(V3Q−V1Q′)/(V2V3−V1V4), and calculating an inter-electrode capacitance Cie by Cie=V3Cg1/(V4−V3)=V2Cg2/(V1−V2).
摘要翻译：一种用于确定介电材料的有效电容的方法，通过在电介质材料的场内完全形成第一和第二不对称电极，其中第一电极，第二电极和电介质材料的场是共面的，第一电极或第二电极或者电连接到地或彼此之间，在第一电极上施加第一电荷Q，测量第一电极上的第一电压变化V1，测量第二电极上的第二电压变化V2，在第二电极上沉积第二电荷Q'，测量第一电极上的第三电压变化V3，测量第二电极上的第四电压变化V4，将第一接地电容Cg1计算为Cg1 =（V2Q'-V4Q）/（ V2V3-V1V4），通过Cg2 =（V3Q-V1Q'）/（V2V3-V1V4）计算第二接地电容Cg2，并且通过Cie = V3Cg1 /（V4-V3）= V2Cg2 /（V1 -V2）。

5. 发明授权

US08004290B1 Method and apparatus for determining dielectric layer properties 有权
标题翻译：用于确定介电层性质的方法和装置
公开(公告)号：US08004290B1
公开(公告)日：2011-08-23
申请号：US12061447
申请日：2008-04-02
申请人： Xiafang Zhang , Nanchang Zhu , Yiping Feng , Min Xiang , Jianou Shi
发明人： Xiafang Zhang , Nanchang Zhu , Yiping Feng , Min Xiang , Jianou Shi
IPC分类号： G01R27/26 , G01R31/26
CPC分类号： G01R31/129 , H01L22/14 , H01L2924/0002 , H01L2924/00
摘要： A method and apparatus for determining dielectric layer properties are disclosed. Dielectric layer properties such as dielectric thickness, dielectric leakage or other electrical information may be determined for a multilayer film stack on a semiconducting or conducting substrate. The film stack may comprise a first dielectric layer between the substrate and an intermediate layer of semiconducting or conducting material, and a second dielectric layer disposed such that the intermediate layer is between the first and second dielectric layers. The dielectric layer properties may be determined by a) depositing electrical charge at one or more localized regions on an exposed surface of the second dielectric layer; b) performing a measurement of an electrical quantity at the one or more localized regions; and c) determining a property of the second dielectric layer from the one or more measurements.
摘要翻译：公开了一种用于确定介电层性质的方法和装置。绝缘层厚度，电介质泄漏或其他电信息等介质层性质可以针对半导体或导电基片上的多层膜堆叠来确定。薄膜叠层可以包括在基底和半导体或导电材料的中间层之间的第一介电层，以及布置成中间层位于第一和第二介电层之间的第二介电层。电介质层的性质可以通过以下步骤来确定：a）在第二介电层的暴露表面上的一个或多个局部区域沉积电荷; b）执行所述一个或多个局部区域处的电量的测量; 以及c）从所述一个或多个测量确定所述第二电介质层的特性。

6. 发明授权

US06358505B1 G-CSF receptor agonists 失效
标题翻译： G-CSF受体激动剂
公开(公告)号：US06358505B1
公开(公告)日：2002-03-19
申请号：US09344837
申请日：1999-06-25
申请人： Linda Zurfluh , Barbara Klein , Charles McWherter , Yiping Feng , John McKearn , Sarah Braford-Goldberg
发明人： Linda Zurfluh , Barbara Klein , Charles McWherter , Yiping Feng , John McKearn , Sarah Braford-Goldberg
IPC分类号： A61K3800
CPC分类号： C07K14/535 , A61C7/06 , A61K38/00 , C07K14/53
摘要： Disclosed are novel G-CSF receptor agonist proteins, DNAs which encode the multi-functional hematopoietic receptor agonists proteins, methods of making the multi-functional hematopoietic receptor agonists proteins and methods of using the multi-functional hematopoietic receptor agonists proteins.
摘要翻译：公开了新型G-CSF受体激动剂蛋白质，编码多功能造血受体激动剂蛋白质的DNA，制备多功能造血受体激动剂蛋白质的方法和使用多功能造血受体激动剂蛋白质的方法。

7. 发明授权

US08611959B2 Low cost, active antenna arrays 有权
标题翻译：低成本，有源天线阵列
公开(公告)号：US08611959B2
公开(公告)日：2013-12-17
申请号：US13173300
申请日：2011-06-30
申请人： Mihai Banu , Yiping Feng , Vladimir I. Prodanov
发明人： Mihai Banu , Yiping Feng , Vladimir I. Prodanov
IPC分类号： H04M1/00 , H04B1/04
CPC分类号： H04B7/0682 , H01Q3/26
摘要： A transmitter system including: a bidirectional signaling (BDS) network having first and second networks for carrying first and second carrier signals, and having a set of n phase synchronous location pairs (ai, bi); and also including tunable transmitter circuits for driving an antenna array, each tunable transmitter circuit having an output line for carrying an output signal and first and second input lines electrically connected to the first and second networks of the BDS network at locations of a corresponding one of the set of phase synchronous location pairs, and including a multiplier having a first input electrically connected to the first input line of that tunable transmitter circuit; a phase setting circuit electrically connected to the multiplier for controlling the phase of the output signal of that tunable transmitter circuit; and an amplitude setting circuit for controlling the amplitude of the output signal of that tunable transmitter circuit.
摘要翻译：一种发射机系统，包括：双向信令（BDS）网络，具有用于承载第一和第二载波信号的第一和第二网络，并且具有一组n相同步位置对（ai，bi）; 并且还包括用于驱动天线阵列的可调谐发射机电路，每个可调谐发射机电路具有用于承载输出信号的输出线，以及电连接到BDS网络的第一和第二网络的位置处的相应一个所述相位同步位置对的集合，并且包括具有电连接到所述可调谐发射器电路的第一输入线的第一输入的乘法器; 电连接到乘法器的相位设置电路，用于控制可调谐发射器电路的输出信号的相位; 以及用于控制该可调谐发射机电路的输出信号的振幅的幅度设定电路。

8. 发明申请

US20120258754A1 TECHNIQUES FOR ACHIEVING HIGH AVERAGE SPECTRUM EFFICIENCY IN A WIRELESS SYSTEM 有权
标题翻译：在无线系统中实现高平均频谱效率的技术
公开(公告)号：US20120258754A1
公开(公告)日：2012-10-11
申请号：US13442561
申请日：2012-04-09
申请人： Mihai Banu , Yiping Feng , David Poticny
发明人： Mihai Banu , Yiping Feng , David Poticny
IPC分类号： H04W72/06
CPC分类号： H04W72/046 , H04B7/0413 , H04B7/0691 , H04B7/0695 , H04W8/186 , H04W16/14 , H04W16/28
摘要： Techniques for achieving high average spectrum efficiency in a wireless system are disclosed. In one particular embodiment, the techniques may be realized as a method of communicating with a wireless station comprising defining a plurality of beams to be generated by a beam-forming device, defining a set of beam groups wherein each beam group is a different subset of beams of the plurality of beams; repeatedly cycling through the set of beam groups by sequentially generating each group of beams among the set of beam groups; identifying a beam group among the set of beam groups which yields a best communication link with a wireless station; and scheduling communications with the wireless station to occur via the identified beam group when the identified beam group is being generated.
摘要翻译：公开了在无线系统中实现高平均频谱效率的技术。在一个具体实施例中，技术可以被实现为与无线站通信的方法，包括定义要由波束形成设备生成的多个波束，定义一组波束组，其中每个波束组是不同的子集多个梁的梁; 通过在所述一组光束组中顺序地产生每组光束来反复循环通过所述一组光束组; 识别在与无线站之间产生最佳通信链路的一组波束组中的波束组; 并且当所生成的所识别的波束组时，通过经识别的波束组来调度与无线站的通信。

9. 发明授权

US09154244B2 Systems and methods for controlling the second order intercept point of receivers 有权
标题翻译：用于控制接收机二阶截点的系统和方法
公开(公告)号：US09154244B2
公开(公告)日：2015-10-06
申请号：US14473370
申请日：2014-08-29
申请人： Yiping Feng , Peter Kinget
发明人： Yiping Feng , Peter Kinget
IPC分类号： H04B17/21 , H04B17/00
CPC分类号： H04B17/21 , H04B17/0085
摘要： In accordance with some embodiments, methods for controlling the second order intercept point in a receiver are provided, the methods comprising: generating an amplitude modulated test tone; causing the test tone to be received by a receiver; determining a characteristic of a second order intercept point of the receiver based on the received test tone; and based on the characteristic, adjusting a parameter of the receiver. In accordance with some embodiments, systems for controlling the second order intercept point in as receiver are provided, the systems comprising: a test tone generator that generates an amplitude modulated test tone; a receiver that receives the test tone; a correlator that determines a characteristic of a second order intercept point of the receiver based on the received test tone; and digital logic that, based on the characteristic, adjusts a parameter of the receiver.
摘要翻译：根据一些实施例，提供了用于在接收机中控制二阶截取点的方法，所述方法包括：产生振幅调制测试音; 使接收机接收测试音; 基于所接收的测试音调确定接收机的二阶截取点的特性; 并根据特性调整接收机的参数。根据一些实施例，提供用于控制作为接收机的二阶截取点的系统，所述系统包括：测试音产生器，其产生幅度调制测试音; 接收测试音的接收机; 相关器，其基于接收到的测试音调确定接收机的二阶截取点的特性; 以及基于特性的数字逻辑调整接收机的参数。

10. 发明申请

US20150056937A1 SYSTEMS AND METHODS FOR CONTROLLING THE SECOND ORDER INTERCEPT POINT OF RECEIVERS 有权
标题翻译：用于控制接收方的第二订单中断点的系统和方法
公开(公告)号：US20150056937A1
公开(公告)日：2015-02-26
申请号：US14473370
申请日：2014-08-29
申请人： Yiping Feng , Peter Kinget
发明人： Yiping Feng , Peter Kinget
IPC分类号： H04B17/00
CPC分类号： H04B17/21 , H04B17/0085
摘要： In accordance with some embodiments, methods for controlling the second order intercept point in a receiver are provided, the methods comprising: generating an amplitude modulated test tone; causing the test tone to be received by a receiver; determining a characteristic of a second order intercept point of the receiver based on the received test tone; and based on the characteristic, adjusting a parameter of the receiver. In accordance with some embodiments, systems for controlling the second order intercept point in as receiver are provided, the systems comprising: a test tone generator that generates an amplitude modulated test tone; a receiver that receives the test tone; a correlator that determines a characteristic of a second order intercept point of the receiver based on the received test tone; and digital logic that, based on the characteristic, adjusts a parameter of the receiver.
摘要翻译：根据一些实施例，提供了用于在接收机中控制二阶截取点的方法，所述方法包括：产生振幅调制测试音; 使接收机接收测试音; 基于所接收的测试音调确定接收机的二阶截取点的特性; 并根据特性调整接收机的参数。根据一些实施例，提供用于控制作为接收机的二阶截取点的系统，所述系统包括：测试音产生器，其产生幅度调制测试音; 接收测试音的接收机; 相关器，其基于接收到的测试音调确定接收机的二阶截取点的特性; 以及基于特性的数字逻辑调整接收机的参数。

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