专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

US20070113950A1 METHOD AND APPARATUS FOR PROVIDING UNIAXIAL LOAD DISTRIBUTION FOR LAMINATE LAYERS OF MULTILAYER CERAMIC CHIP CARRIERS 审中-公开
标题翻译：用于提供多层陶瓷芯片载体层压板分散载荷分配的方法和装置
公开(公告)号：US20070113950A1
公开(公告)日：2007-05-24
申请号：US11164437
申请日：2005-11-22
申请人： Jay Bunt , Donald Diangelo , Cristian Docu , Thomas Foley , Melvin Gottschalk , Lisa Hamilton , Thomas Kline , Mark LaPlante , Hsichang Liu , Sebastian Loscerbo , Govindarajan Natarajan , Olga Otieno , Renee Weisman
发明人： Jay Bunt , Donald Diangelo , Cristian Docu , Thomas Foley , Melvin Gottschalk , Lisa Hamilton , Thomas Kline , Mark LaPlante , Hsichang Liu , Sebastian Loscerbo , Govindarajan Natarajan , Olga Otieno , Renee Weisman
IPC分类号： C03B29/00 , B32B37/00 , B29C65/00
CPC分类号： B32B37/0007 , B32B37/26 , B32B2315/02 , H05K1/0306 , H05K3/0052 , H05K3/4611 , H05K3/4629 , H05K2201/09781 , H05K2203/0169 , H05K2203/068 , Y10T156/1052 , Y10T156/108
摘要： An apparatus for providing uniform axial load distribution for laminate layers of multilayer ceramic chip carriers includes a base plate configured to support a plurality of green sheet layers thereon, the base plate having at least one resiliently mounted load support bar disposed adjacent outer edges of the base plate. The load support bar is mounted on one or more biasing members such that the top surface of the support bar extends above the top surface of the base plate by a selected distance.
摘要翻译：一种用于为多层陶瓷芯片载体层压层提供均匀的轴向载荷分布的装置，包括：底板，其被配置为在其上支撑多个生片层，所述底板具有至少一个弹性安装的负载支撑杆，其邻近所述底座的外边缘设置盘子。负载支撑杆安装在一个或多个偏压构件上，使得支撑杆的顶表面在基板的顶表面上延伸选定的距离。

2. 发明授权

US07117060B2 Method of improving production through cost of yield measurement 失效
标题翻译：通过产量测量成本提高生产的方法
公开(公告)号：US07117060B2
公开(公告)日：2006-10-03
申请号：US09770355
申请日：2001-01-26
申请人： Thomas A. McPhee , Michael E. Cropp , Donald Diangelo , Alberto H. Gay , Carmella Pemberton , Joseph Saltarelli , Nicholas L. Volkringer , John J. DeMarco
发明人： Thomas A. McPhee , Michael E. Cropp , Donald Diangelo , Alberto H. Gay , Carmella Pemberton , Joseph Saltarelli , Nicholas L. Volkringer , John J. DeMarco
IPC分类号： G06F19/00
CPC分类号： G06Q10/06 , G06Q30/0283
摘要： The present invention provides a method for controlling production or manufacturing costs by obtaining yield measurements of unit manufacturing for a multiplicity of products or production lines having a plurality of processes which includes determining a started units number for the plurality of processes. The method further includes determining a cost per unit for each unit of the plurality of processes, and calculating an expected approved units number for the plurality of processes. The expected approved units number is calculated by multiplying the started units number by an expected yield measurement. The method next includes calculating an actual approved units number for each of the plurality of processes by multiplying the started units number by an actual yield measurement, and calculating an unapproved units number for each of the plurality of processes by subtracting the expected approved units number from the actual approved units number. The method then includes calculating cost of yield measurements for the plurality of processes by multiplying the unapproved units number by the cost per unit, and providing a comparison of the cost of yield measurements for the plurality of processes.
摘要翻译：本发明提供了一种用于通过对具有多个处理的多个产品或生产线获得单元制造的产量测量值来控制生产或制造成本的方法，所述多个处理包括确定多个处理的开始单元号。该方法还包括确定多个进程中的每个单元的每单位的成本，以及计算多个进程的预期批准的单位编号。通过将开始的单位数乘以期望的产量测量来计算预期的批准单位数。该方法接下来包括通过将开始的单位数乘以实际产量测量来计算多个处理中的每一个的实际批准的单元编号，并且通过从多个处理中减去预期的批准单元数来计算多个处理中的每一个的未经批准的单元编号实际批准的单位编号。该方法然后包括通过将未经批准的单位数乘以每单位的成本来计算多个处理的产量测量的成本，并且提供对于多个处理的产量测量的成本的比较。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式