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    • 10. 发明授权
    • Method and system for applying testing voltage signal
    • 应用测试电压信号的方法和系统
    • US07073104B1
    • 2006-07-04
    • US10384856
    • 2003-03-10
    • Jiang LiRichard FastowSteve Tam
    • Jiang LiRichard FastowSteve Tam
    • G11C29/00
    • G11C29/12G11C16/04G11C29/12005G11C29/50004G11C2029/1202
    • In a method and system for applying a testing voltage signal, a voltage source generates the testing voltage signal that ramps from an initial voltage to an intermediate voltage with a first ramping rate. In addition, the testing voltage then ramps from the intermediate voltage to an end voltage with a second ramping rate, with the first ramping rate being greater than the second ramping rate. The present invention may be applied to particular advantage when the testing voltage signal is applied on a control gate of a flash memory cell for channel erasure of the flash memory cell. In this manner, the testing voltage signal ramps to the end voltage with reduced time for minimizing testing time.
    • 在用于施加测试电压信号的方法和系统中,电压源产生以初始电压向第一斜坡率的中间电压斜坡的测试电压信号。 此外,测试电压然后以第二斜坡率从中间电压斜坡到终止电压,其中第一斜坡率大于第二斜坡率。 当测试电压信号被施加在闪速存储器单元的控制栅上用于闪存单元的通道擦除时,本发明可以被应用于特别的优点。 以这种方式,测试电压信号以缩短的时间斜坡到终端电压,以最小化测试时间。