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    • 8. 发明申请
    • PHOTOLITHOGRAPHY MASK WITH PROTECTIVE SILICIDE CAPPING LAYER
    • 具有保护性硅胶覆盖层的光刻胶面板
    • US20080261121A1
    • 2008-10-23
    • US11738004
    • 2007-04-20
    • Jeffrey Peter GambinoRobert Kenneth LeidyKirk David PetersonJed Hickory RankinEdmund Juris Sprogis
    • Jeffrey Peter GambinoRobert Kenneth LeidyKirk David PetersonJed Hickory RankinEdmund Juris Sprogis
    • G03C5/00G03F1/00
    • G03F1/30G03F1/48G03F1/54
    • A photomask and a method of fabricating the photomask. The photomask including: a substrate transparent to a selected wavelength or wavelengths of radiation, the substrate having a top surface and an opposite bottom surface, the substrate having a printable region and a non-printable region; the printable region having first opaque regions raised above the top surface of the substrate adjacent to clear regions, each opaque region of the first opaque regions having sidewalls and opposite top and bottom surfaces, the first opaque regions including a metal; the non-printable region including metal second opaque region raised above the top surface of the substrate, the second opaque region having sidewalls and opposite top and bottom surface, the second opaque regions including the metal; and a conformal protective metal oxide capping layer on top surfaces and sidewalls of the first and second opaque regions. The conformal layer is formed by oxidation.
    • 光掩模和制造光掩模的方法。 所述光掩模包括:对所选择的波长或辐射波长透明的衬底,所述衬底具有顶表面和相对的底表面,所述衬底具有可打印区域和不可打印区域; 所述可印刷区域具有在所述基板的与所述透明区域相邻的顶表面上方的第一不透明区域,所述第一不透明区域的每个不透明区域具有侧壁和相对的顶表面和底表面,所述第一不透明区域包括金属; 所述不可打印区域包括在所述基板的顶表面上方升高的金属第二不透明区域,所述第二不透明区域具有侧壁和相对的顶部和底部表面,所述第二不透明区域包括所述金属; 以及在第一和第二不透明区域的顶表面和侧壁上的共形保护性金属氧化物覆盖层。 保形层通过氧化形成。
    • 9. 发明申请
    • PHOTOLITHOGRAPHY MASK WITH INTEGRALLY FORMED PROTECTIVE CAPPING LAYER
    • 具有整体形成的保护层的光刻胶面板
    • US20080261120A1
    • 2008-10-23
    • US11737956
    • 2007-04-20
    • Jeffrey Peter GambinoRobert Kenneth LeidyKirk David PetersonJed Hickory RankinEdmund Juris Sprogis
    • Jeffrey Peter GambinoRobert Kenneth LeidyKirk David PetersonJed Hickory RankinEdmund Juris Sprogis
    • G03C5/00G03F1/00
    • G03F1/30G03F1/48G03F1/54
    • A photomask and a method of fabricating the photomask. The photomask including: a substrate transparent to a selected wavelength or wavelengths of radiation, the substrate having a top surface and an opposite bottom surface, the substrate having a printable region and a non-printable region; the printable region having first opaque regions raised above the top surface of the substrate adjacent to clear regions, each opaque region of the first opaque regions having sidewalls and opposite top and bottom surfaces, the first opaque regions including a metal; the non-printable region including metal second opaque region raised above the top surface of the substrate, the second opaque region having sidewalls and opposite top and bottom surface, the second opaque regions including the metal; and a conformal protective metal oxide capping layer on top surfaces and sidewalls of the first and second opaque regions. The conformal layer is formed by oxidation.
    • 光掩模和制造光掩模的方法。 所述光掩模包括:对所选择的波长或辐射波长透明的衬底,所述衬底具有顶表面和相对的底表面,所述衬底具有可打印区域和不可打印区域; 所述可印刷区域具有在所述基板的与所述透明区域相邻的顶表面上方的第一不透明区域,所述第一不透明区域的每个不透明区域具有侧壁和相对的顶表面和底表面,所述第一不透明区域包括金属; 所述不可打印区域包括在所述基板的顶表面上方升高的金属第二不透明区域,所述第二不透明区域具有侧壁和相对的顶部和底部表面,所述第二不透明区域包括所述金属; 以及在第一和第二不透明区域的顶表面和侧壁上的共形保护性金属氧化物覆盖层。 保形层通过氧化形成。