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    • 3. 发明授权
    • Recessed gate for an image sensor
    • 嵌入式门用于图像传感器
    • US07217968B2
    • 2007-05-15
    • US10905097
    • 2004-12-15
    • James W. AdkissonJohn Ellis-MonaghanMark D. JaffeJerome B. Lasky
    • James W. AdkissonJohn Ellis-MonaghanMark D. JaffeJerome B. Lasky
    • H01L31/062
    • H01L27/14603H01L27/14601H01L27/14689H01L29/66621
    • A novel image sensor cell structure and method of manufacture. The imaging sensor comprises a substrate, a gate comprising a dielectric layer and gate conductor formed on the dielectric layer, a collection well layer of a first conductivity type formed below a surface of the substrate adjacent a first side of the gate conductor, a pinning layer of a second conductivity type formed atop the collection well at the substrate surface, and a diffusion region of a first conductivity type formed adjacent a second side of the gate conductor, the gate conductor forming a channel region between the collection well layer and the diffusion region. Part of the gate conductor bottom is recessed below the surface of the substrate. Preferably, a portion of the gate conductor is recessed at or below a bottom surface of the pinning layer to a depth such that the collection well intersects the channel region.
    • 一种新颖的图像传感器单元结构及其制造方法。 成像传感器包括基板,包括电介质层和形成在电介质层上的栅极导体的栅极,形成在与栅极导体的第一侧相邻的基板的表面下面的第一导电类型的收集阱层,钉扎层 在基板表面上形成在集合阱顶部的第二导电类型的第一导电类型的扩散区和在栅极导体的第二侧附近形成的第一导电类型的扩散区,栅极导体在集电阱层和扩散区之间形成沟道区 。 栅极导体底部的一部分凹陷在基板的表面下方。 优选地,栅极导体的一部分在钉扎层的底表面处或下方凹陷到使得收集阱与沟道区相交的深度。
    • 4. 发明授权
    • Recessed gate for a CMOS image sensor
    • CMOS图像传感器的嵌入式门
    • US07572701B2
    • 2009-08-11
    • US11735223
    • 2007-04-13
    • James W. AdkissonJohn Ellis-MonaghanMark D. JaffeJerome B. Lasky
    • James W. AdkissonJohn Ellis-MonaghanMark D. JaffeJerome B. Lasky
    • H01L21/02H01L31/113
    • H01L27/14603H01L27/14601H01L27/14689H01L29/66621
    • A novel CMOS image sensor cell structure and method of manufacture. The imaging sensor comprises a substrate having an upper surface, a gate comprising a dielectric layer formed on the substrate and a gate conductor formed on the gate dielectric layer, a collection well layer of a first conductivity type formed below a surface of the substrate adjacent a first side of the gate conductor, a pinning layer of a second conductivity type formed atop the collection well at the substrate surface, and a diffusion region of a first conductivity type formed adjacent a second side of the gate conductor, the gate conductor forming a channel region between the collection well layer and the diffusion region. A portion of the bottom of the gate conductor is recessed below the surface of the substrate. Preferably, a portion of the gate conductor is recessed at or below a bottom surface of the pinning layer to a depth such that the collection well intersects the channel region thereby eliminating any potential barrier interference caused by the pinning layer.
    • 一种新颖的CMOS图像传感器单元结构及其制造方法。 成像传感器包括具有上表面的基板,包括形成在基板上的电介质层的栅极和形成在栅极电介质层上的栅极导体,形成在基板表面附近的第一导电类型的集合阱层 栅极导体的第一侧,形成在基板表面上的集电阱顶部的第二导电类型的钉扎层,以及邻近栅极导体的第二侧形成的第一导电类型的扩散区域,栅极导体形成沟道 收集阱层和扩散区域之间的区域。 栅极导体的底部的一部分在衬底的表面下方凹进。 优选地,栅极导体的一部分在钉扎层的底表面处或下方凹陷到深度,使得收集阱与沟道区相交,从而消除由钉扎层引起的任何潜在的屏障干扰。
    • 7. 发明授权
    • Damascene copper wiring optical image sensor
    • 大马士革铜线接线光学图像传感器
    • US07655495B2
    • 2010-02-02
    • US11623977
    • 2007-01-17
    • James W. AdkissonJeffrey P. GambinoMark D. JaffeRobert K. LeidyAnthony K. Stamper
    • James W. AdkissonJeffrey P. GambinoMark D. JaffeRobert K. LeidyAnthony K. Stamper
    • H01L21/00
    • H01L27/14685H01L21/76819H01L21/76834H01L21/76838H01L27/14621H01L27/14627H01L27/14636H01L27/14687
    • A CMOS image sensor array and method of fabrication wherein the sensor includes Copper (Cu) metallization levels allowing for incorporation of a thinner interlevel dielectric stack with improved thickness uniformity to result in a pixel array exhibiting increased light sensitivity. In the sensor array, each Cu metallization level includes a Cu metal wire structure formed at locations between each array pixel and, a barrier material layer is formed on top each Cu metal wire structure that traverses the pixel optical path. By implementing a single mask or self-aligned mask methodology, a single etch is conducted to completely remove the interlevel dielectric and barrier layers that traverse the optical path. The etched opening is then refilled with dielectric material. Prior to depositing the refill dielectric, a layer of either reflective or absorptive material is formed along the sidewalls of the etched opening to improve sensitivity of the pixels by either reflecting light to the underlying photodiode or by eliminating light reflections.
    • CMOS图像传感器阵列和制造方法,其中传感器包括铜(Cu)金属化水平,允许结合更薄的层间电介质叠层,具有改进的厚度均匀性,以产生呈现增加的光敏度的像素阵列。 在传感器阵列中,每个Cu金属化层包括在每个阵列像素之间的位置处形成的Cu金属线结构,并且阻挡材料层形成在穿过像素光路的每个Cu金属线结构上。 通过实现单掩模或自对准掩模方法,进行单次蚀刻以完全去除穿过光路的层间电介质层和阻挡层。 然后将蚀刻的开口用电介质材料重新填充。 在沉积再充填电介质之前,沿蚀刻开口的侧壁形成反射或吸收材料层,以通过将光反射到下面的光电二极管或通过消除光反射来提高像素的灵敏度。