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    • 3. 发明申请
    • Case erector apparatus
    • 案例矫正器
    • US20070072757A1
    • 2007-03-29
    • US11526851
    • 2006-09-25
    • James Goodman
    • James Goodman
    • B31B1/80
    • B31B50/802B31B2100/00B31B2100/0024B31B2120/30
    • A case erector is provided which is easily adaptable to different sizes and shaped of R.S.C. cases and the like. The case erector includes a case erector system including a pair of vacuum heads, the range and motion of each being actuated by linear servos. A first vacuum head travels in a longitudinal direction relative to the flow of cases through the case erector. A second vacuum head travels in a direction transverse to the flow of cases through the case erector. The action of the pair of vacuum heads and the motion thereof erects or expands the cases.
    • 提供了一种易于适应不同尺寸和形状的R.S.C的壳体矫正器。 案例等。 壳体矫正器包括一个包括一对真空头的壳体矫正器系统,每个真空头的范围和运动由线性伺服器致动。 第一真空头相对于通过壳体竖立件的壳体的流动方向在纵向方向上行进。 第二个真空头沿横向于通过壳体竖立件的壳体流动的方向行进。 一对真空头的作用及其运动直立或扩大了情况。
    • 5. 发明授权
    • Method and apparatus for selecting an encryption integrated circuit operating mode
    • 用于选择加密集成电路操作模式的方法和装置
    • US06664803B2
    • 2003-12-16
    • US10176704
    • 2002-06-20
    • James Goodman
    • James Goodman
    • H03K1900
    • G06F21/74G01R31/31704G01R31/31719G01R31/318558G01R31/318588
    • A method and circuit for preventing external access to secure data of an integrated circuit while supporting DFT is disclosed. In accordance with the method the integrated circuit is automatically placed into the test mode at integrated circuit power-up from a power-down state. At power up, secure data is other than present within a secure data-path of the integrated circuit. Access is provided to the secure data path via a second data path coupled with the first secure data-path. Via the access path, data other than secure data is provided to the integrated circuit, the data for performing test functions of the integrated circuit operating in the test mode. Once data other than secure data is provided to first secure data path, the test mode is terminated and access via other than the secure ports is disabled. The test mode is only re-entered by powering down the integrated circuit and re-initialising it.
    • 公开了一种用于在支持DFT的同时防止外部访问集成电路的安全数据的方法和电路。 根据该方法,集成电路在从掉电状态的集成电路上电时自动进入测试模式。 在上电时,安全数据不同于存在于集成电路的安全数据路径内。 经由与第一安全数据路径耦合的第二数据路径向安全数据路径提供访问。 通过访问路径,除了安全数据之外的数据被提供给集成电路,用于执行在测试模式下操作的集成电路的测试功能的数据。 一旦将安全数据以外的数据提供给第一安全数据路径,则终止测试模式,并且禁用除安全端口之外的访问。 测试模式只能通过关闭集成电路并重新初始化来重新输入。