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    • 3. 发明授权
    • Ice maker and refrigerator having the same
    • 制冰机和冰箱有相同的
    • US08281613B2
    • 2012-10-09
    • US12155318
    • 2008-06-02
    • Jae Koog AnJung Rae KimJong Yeob Kim
    • Jae Koog AnJung Rae KimJong Yeob Kim
    • F25D3/02
    • F25D17/065F25C5/22F25C2400/10F25D2317/061F25D2317/062F25D2317/063F25D2317/0665
    • A refrigerator includes a refrigerator main body having a storage chamber, a door coupled to the refrigerator main body to be opened or closed, a cool air supplying device which generates cool air, an ice maker including an ice making tray having ice making cells to produce ice and a cool air guide member installed in the door, coupled to the ice making tray and having a cool air line that guides the cool air supplied from the cool air supplying device to flow around the ice making tray. The cool air line disposed on the cool air guide member to supply the ice making tray guides the cool air supplied from the cool air supplying device to move along the surrounding of the ice making tray, thereby uniformly cooling down the ice making tray.
    • 冰箱包括具有储藏室的冰箱主体,连接到冰箱主体以打开或关闭的门,产生冷空气的冷空气供应装置,包括具有制冰单元的制冰盘的制冰机以产生 冰和冷却空气引导构件,其安装在门中,联接到制冰托盘并且具有引导从冷空气供应装置供应的冷空气流过制冰托盘的冷空气管线。 设置在冷空气引导构件上以供应制冰盘的冷空气管线引导从冷空气供应装置供应的冷空气沿着制冰盘的周围移动,从而均匀地冷却制冰托盘。
    • 10. 发明授权
    • Device and method for testing semiconductor device
    • 半导体器件测试装置及方法
    • US08621292B2
    • 2013-12-31
    • US13491056
    • 2012-06-07
    • Jung Rae Kim
    • Jung Rae Kim
    • G11C29/10G11C29/54
    • G11C29/56004G11C29/10
    • A device for testing a semiconductor memory device, the device including a code table that is configured to store at least a first received code and a second received code received via a host interface, a pattern generation engine that is configured to determine a third code based on at least one of the first and the second received codes stored in the code table and to output the third code, in response to a request to perform a test operation, received via the host interface, and a signal generation unit that is configured to generate control signals for testing the semiconductor memory device, based on the third code received from the pattern generation engine.
    • 一种用于测试半导体存储器件的器件,该器件包括被配置为存储经由主机接口接收的至少第一接收代码和第二接收代码的代码表,被配置为确定第三代码的模式生成引擎 在存储在代码表中的第一和第二接收代码中的至少一个,并且响应于经由主机接口接收到的执行测试操作的请求而输出第三代码;以及信号生成单元,被配置为 基于从图案生成引擎接收的第三代码生成用于测试半导体存储器件的控制信号。