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1. 发明专利

JP2008170290A Optical device for inspection, and inspection device 审中-公开
标题翻译：用于检查和检查设备的光学设备
公开(公告)号：JP2008170290A
公开(公告)日：2008-07-24
申请号：JP2007004058
申请日：2007-01-12
申请人： Inter Action Corp , 株式会社インターアクション
发明人： TSUTSUMI DAIKI , MURAKAMI KENTARO , NISHIZAWA MITSUAKI
IPC分类号： G01M11/02
摘要： PROBLEM TO BE SOLVED: To provide an optical device for inspection capable of projecting a pattern on a plurality of positions in a visual field with a small chart.
SOLUTION: This optical device 3 for inspection for allowing a light flux forming a pattern 13b image to enter a camera module 101 of an inspection object has the chart 13 for emitting light fluxes forming the pattern 13b image, allowing a light flux emitted in a direction of an optical axis LA among the emitted original light fluxes to enter the camera module 101 at an incident angle of 0°, and forming an actual image of the pattern 13b; and a mirror box 17 for reflecting a light flux emitted in a direction tilted to the optical axis LA among the original light fluxes, allowing it to enter the camera module 101 at a larger incident angle of than 0°, and forming a reflection image RF of the pattern 13b.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：提供一种用于检查的光学装置，其能够以小图在视野中的多个位置上投影图案。解决方案：用于允许形成图案13b图像的光束进入检查对象的照相机模块101的用于检查的光学装置3具有用于发射形成图案13b图像的光束的图13，允许发射的光通量在发射的原始光束中的光轴LA的方向上以0°的入射角进入照相机模块101，并形成图案13b的实际图像; 以及反射镜盒17，用于反射在原始光束中沿着与光轴LA倾斜的方向发射的光束，使其以比0°更大的入射角进入相机模块101，并形成反射图像RF 的图案13b。版权所有（C）2008，JPO＆INPIT

2. 发明专利

JP2005198103A Apparatus and method for assembling camera module 审中-公开
标题翻译：装配摄像机模块的装置和方法
公开(公告)号：JP2005198103A
公开(公告)日：2005-07-21
申请号：JP2004003272
申请日：2004-01-08
申请人： Inter Action Corp , 株式会社インターアクション
发明人： HIRATA YOSHIMI , MURAKAMI KENTARO
IPC分类号： H04N5/232 , H04N5/225
摘要： PROBLEM TO BE SOLVED: To provide a cameral module assembling apparatus which is improved in yield, highly efficient in adjustment, inspection and assembling, and less in the variation of an image property after assembling.
SOLUTION: The assembing apparatus has a traveling mechanism 70 and a turn table 86 which changeably hold the relative position of an optical block 11 to an imaging block 16 before joining and place the optical block 11 at a specified position to the imaging block 16, a light source 2 for irradiating a solid state imaging device 18 with specified measuring light through an optical system, and an optical system adjuster 52 and a controller 54 for controlling to adjust the location of the optical system relative to the solid state imaging device 18 before joining so as to meet specified conditions on the basis of image information obtained from the solid state imaging device 18 irradiated with the measuring light through the optical system.
COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：提供一种提高产量，高效调节，检查和组装以及组装后图像特性变化较少的摄像模块组装装置。解决方案：组装装置具有移动机构70和转台86，它们在连接之前将光学块11相对于成像块16的相对位置可变地保持，并将光学块11放置在成像块如图16所示，用于通过光学系统照射具有特定测量光的固态成像装置18的光源2和用于控制光学系统相对于固态成像装置的位置的光学系统调节器52和控制器54 18，以便根据从通过光学系统照射测量光的固态成像装置18获得的图像信息来满足规定的条件。版权所有（C）2005，JPO＆NCIPI

3. 发明专利

JP2008175684A Chart for inspection and inspection device 审中-公开
标题翻译：检查和检验设备图
公开(公告)号：JP2008175684A
公开(公告)日：2008-07-31
申请号：JP2007009266
申请日：2007-01-18
申请人： Inter Action Corp , 株式会社インターアクション
发明人： MURAKAMI KENTARO , NISHIZAWA MITSUAKI
IPC分类号： G01M11/02
摘要： PROBLEM TO BE SOLVED: To provide a chart for inspection capable of proper inspection with a simple constitution, concerning the chart for inspection and an inspection device for performing inspection on a plurality of subject distances.
SOLUTION: The chart 12 for inspecting a lens module 100 includes a transparent substrate 51, the first pattern section 53 provided on the first surface 51a of the transparent substrate 51, and the second pattern section 54 provided on the second surface 61b of the transparent substrate 51.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：提供能够以简单的结构进行适当检查的图表，涉及检查图表和用于对多个被摄体距离进行检查的检查装置。
解决方案：用于检查透镜模块100的图表12包括透明基板51，设置在透明基板51的第一表面51a上的第一图案部分53和设置在透明基板51的第二表面61b上的第二图案部分54 透明基板51.版权所有（C）2008，JPO＆INPIT

4. 发明专利

JP2006145849A Optical device for inspection and inspecting device equipped with the same 审中-公开
标题翻译：用于检查和检查装置的光学装置
公开(公告)号：JP2006145849A
公开(公告)日：2006-06-08
申请号：JP2004335997
申请日：2004-11-19
申请人： Inter Action Corp , 株式会社インターアクション
发明人： TAMAI SHINGO , MURAKAMI KENTARO , NISHIZAWA MITSUAKI
IPC分类号： G03B43/00 , G01M11/00
CPC分类号： G03B29/00 , H04N5/2257 , H04N17/002
摘要： PROBLEM TO BE SOLVED: To provide a highly versatile optical device for inspection realizing the reduction of space.
SOLUTION: The optical device 1 projecting a prescribed pattern as a subject for inspection arranged at a prescribed position to a lens module 100 is equipped with a chart 12 on which a pattern is formed, a light source 11 irradiating the chart 12 with light from the back side of the chart 12 as seen from the lens module 100, and an object distance conversion lens 3 provided between the chart 12 and an objective 101. The object distance conversion lens 3 radially emits each cognate luminous flux LF from the chart 12 so as to convert the light from the chart 12 to light equivalent to light from a farther place than the chart 12, and also emits each cognate luminous flux LF so as to converge the principal light beam ML of each cognate luminous flux LF each other. The chart 12 is arranged at a position nearer to the lens module 100 than the prescribed position.
COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：提供用于检查的高度通用的光学装置，实现空间的减少。
解决方案：将设置在规定位置的规定图案作为检查对象投影到镜头模块100的光学装置1配备有形成图案的图表12，照射图表12的光源11，从透镜模块100观察的图12的背面的光，以及设置在图表12和物镜101之间的物体距离转换透镜3.物距变换透镜3从图表中径向发射各个关联光通量LF 以将图12中的光转换成与图12相距更远的光的光，并且发射各自的光通量LF，以使每个同源光束LF彼此的主光束ML收敛。图表12布置在比指定位置更靠近透镜模块100的位置。版权所有（C）2006，JPO＆NCIPI

5. 发明专利

JP2005259426A Light irradiation device and image sensor testing device 审中-公开
标题翻译：光照射装置和图像传感器测试装置
公开(公告)号：JP2005259426A
公开(公告)日：2005-09-22
申请号：JP2004067062
申请日：2004-03-10
申请人： Inter Action Corp , 株式会社インターアクション
发明人： MURAKAMI KENTARO
IPC分类号： G01J1/00 , G01M11/00 , H05B37/02
摘要： PROBLEM TO BE SOLVED: To provide a light irradiation device capable of setting the nature of light irradiating to an image sensor of a testing target without using a mechanical driving mechanism, and to provide an image sensor testing device. SOLUTION: A plurality of light sources 20 contain the light source irradiating light having several different colors, and intensity of the light of each color is controlled according to predetermined testing contents. The plurality of light sources 20 correspond to a plurality of bundles at an input end 31 of an optical fiber bundle 30 by one to one, and the irradiated light from the light source 20 is incident on the bundle corresponding to he input end 31. In the optical fiber bundle 30, since the optical fibers of each bundle of the input end 31 are dispersed at an output end 32, light from the plurality of light sources 20 incident on the input end 31 is emitted in a mixed state at the output end 31 of the optical fiber bundle 30. Light from the output end 32 is irradiated to the image sensor of the testing target through an optical system 40. COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：提供一种能够在不使用机械驱动机构的情况下设置照射到测试对象的图像传感器的光的性质的光照射装置，并且提供图像传感器测试装置。解决方案：多个光源20包含照射具有几种不同颜色的光的光源，并且根据预定的测试内容来控制每种颜色的光的强度。多个光源20在光纤束30的输入端31处一对一地对应于多个光束，并且来自光源20的照射光入射到与其输入端31对应的束上。在光纤束30，由于输入端31的各束的光纤分散在输出端32，入射到输入端31的多个光源20的光在输出端以混合状态发射光纤束30.来自输出端32的光通过光学系统40照射到测试对象的图像传感器。版权所有（C）2005，JPO＆NCIPI

6. 发明专利

JP2005249946A Defect inspecting apparatus for display device 审中-公开
标题翻译：用于显示设备的缺陷检查装置
公开(公告)号：JP2005249946A
公开(公告)日：2005-09-15
申请号：JP2004057693
申请日：2004-03-02
申请人： Inter Action Corp , 株式会社インターアクション
发明人： MURAKAMI KENTARO
IPC分类号： G01B11/30 , G01M11/00 , G02F1/13 , G09F9/00 , G09G3/20 , G09G3/36
摘要： PROBLEM TO BE SOLVED: To provide a defect inspecting apparatus for a display device capable of imaging display of the display device such as a liquid crystal panel and specifying an absolute position of a point defect precisely from an acquired imaged data.
SOLUTION: The apparatus is equipped with CCD cameras 5A and 5B using a solid state imaging device for imaging display of a display area and a controller 20 which is for performing display for defect inspection on the display area by driving a liquid crystal panel 10, and for performing display of a reference position pattern whose position on the display area is known and which detects an existence of the defect on each pixel of the display area and a position in the display area of the pixel having the defect based on image information which is imaged by the CCD cameras 5A and 5B.
COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：提供一种用于能够对诸如液晶面板的显示装置进行成像显示的显示装置的缺陷检查装置，并且从所获取的成像数据精确地指定点缺陷的绝对位置。
解决方案：该装置配备有使用用于成像显示区域显示的固态成像装置的CCD照相机5A和5B以及用于通过驱动液晶面板在显示区域上进行缺陷检查的显示的控制器20 10，并且用于执行在显示区域上的位置已知的参考位置图案的显示，并且其基于图像检测在显示区域的每个像素上的缺陷的存在以及具有缺陷的像素的显示区域中的位置由CCD照相机5A和5B成像的信息。版权所有（C）2005，JPO＆NCIPI

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