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    • 9. 发明授权
    • Accessing phase change memories
    • 访问相变存储器
    • US06990017B1
    • 2006-01-24
    • US10882860
    • 2004-06-30
    • Ward D. ParkinsonCharles H. DennisonStephen Hudgens
    • Ward D. ParkinsonCharles H. DennisonStephen Hudgens
    • H01L21/336
    • G11C13/003G11C13/0004G11C2213/74G11C2213/76
    • A memory may include a phase change memory element and series connected first and second selection devices. The second selection device may have a higher resistance and a larger threshold voltage than the first selection device. In one embodiment, the first selection device may have a threshold voltage substantially equal to its holding voltage. In some embodiments, the selection devices and the memory element may be made of chalcogenide. In some embodiments, the selection devices may be made of non-programmable chalcogenide. The selection device with the higher threshold voltage may contribute lower leakage to the combination, but may also exhibit increased snapback. This increased snapback may be counteracted by the selection device with the lower threshold voltage, resulting in a combination with low leakage and high performance in some embodiments.
    • 存储器可以包括相变存储器元件和串联连接的第一和第二选择器件。 第二选择装置可以具有比第一选择装置更高的电阻和更大的阈值电压。 在一个实施例中,第一选择装置可以具有基本上等于其保持电压的阈值电压。 在一些实施例中,选择装置和存储元件可以由硫族化物制成。 在一些实施例中,选择装置可以由不可编程的硫族化物制成。 具有较高阈值电压的选择装置可能会对组合造成较低的泄漏,但也可能表现出增加的快速恢复。 这种增加的快速恢复可以被具有较低阈值电压的选择装置抵消,导致在一些实施例中与低泄漏和高性能的组合。