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    • 2. 发明申请
    • SCANNING PROBE NANOLITHOGRAPHY SYSTEM AND METHOD
    • 扫描探针纳米尺度系统及方法
    • WO2015036605A1
    • 2015-03-19
    • PCT/EP2014/069667
    • 2014-09-16
    • SWISSLITHO AGINTERNATIONAL BUSINESS MACHINES CORPORATION
    • HOLZNER, FelixPAUL, PhilipZIENTEK, MichalKNOLL, ArminRAWLINGS, Colin
    • G03F7/00
    • G03F7/70775G03F7/0002
    • A scanning probe nanolithography system comprising a probe to create nanostructures line (60) by line through writing said nanostructures (74) pixel by pixel along lines (61) on a sample. A positioning system is adapted to provide a positioning of the probe at a sequence of predetermined positions to the sample and its surface towards the probe and a control unit (50) is provided to control the positioning system for positioning the probe for a pixel-wise writing of said lines (61) through a writing unit. It further comprises a sensor unit adapted to detect a predetermined property of the written nanostructure (74), the sensor unit being connected to the control unit to adapt the control signals to be provided to the writing unit for writing the following line (61; 62) based on the measured signals (65; 66) of the predetermined property.
    • 一种扫描探针纳米光刻系统,其包括通过在样品上沿线(61)逐像素地写入所述纳米结构(74)而通过线形成纳米结构线(60)的探针。 定位系统适于提供探针在预定位置的序列上的位置,使得样品及其表面朝向探针,并且提供控制单元(50)以控制定位系统以将探针定位成像素方向 通过写入单元写入所述线(61)。 它还包括适于检测书写的纳米结构(74)的预定特性的传感器单元,所述传感器单元连接到所述控制单元,以使得要提供给所述写入单元的控制信号用于写入以下行(61; 62 )基于预定特性的测量信号(65; 66)。