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1. 发明申请

WO2017054003A1 BATTERY RELIABILITY ODOMETER 审中-公开
标题翻译：电池可靠性光度计
公开(公告)号：WO2017054003A1
公开(公告)日：2017-03-30
申请号：PCT/US2016/053841
申请日：2016-09-26
申请人： INTEL CORPORATION
发明人： RODRIGUEZ, Jorge , UAN-ZO-LI, Alexander B. , MATSUMURA, Naoki , KEATES, Andy , HERMERDING, James G.
IPC分类号： G06F1/26 , H02J7/00 , G01R31/36
CPC分类号： H01M10/48 , H01M2010/4278 , H02J7/0021 , H02J7/0047 , H02J7/0091 , H02J7/047
摘要： Various embodiments may be generally directed to techniques for using an observed battery stress history to manage operation of a computing system component in a high power performance mode when powered by a battery. Various embodiments include techniques for tracking stresses to a battery. Various embodiments include techniques for comparing the battery stress history to a degradation baseline for the battery. Various embodiments include techniques for developing a degradation baseline for a battery including, for example, a degradation baseline based on expected stress to a battery and/or a degradation baseline based on a battery reliability model. Various embodiments include techniques for determining a battery stress surplus or deficit. Various embodiments include techniques for managing operation of a performance enhancing mode or high power performance mode of a computing system component based on the determined battery stress surplus or deficit.
摘要翻译：各种实施例可以通常涉及当由电池供电时使用观察到的电池应力历史来管理高功率性能模式下的计算系统组件的操作的技术。各种实施例包括用于跟踪电池的应力的技术。各种实施例包括用于将电池应力历史与电池的劣化基准进行比较的技术。各种实施例包括用于开发用于电池的劣化基线的技术，包括例如基于电池的预期应力和/或基于电池可靠性模型的劣化基准的劣化基准。各种实施例包括用于确定电池应力剩余或缺陷的技术。各种实施例包括基于所确定的电池应力剩余或缺陷来管理计算系统组件的性能增强模式或高功率性能模式的操作的技术。

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