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1. 发明申请

US20120025861A1 TEST SOCKET AND TEST DEVICE HAVING THE SAME 审中-公开
标题翻译：测试插座及其测试装置
公开(公告)号：US20120025861A1
公开(公告)日：2012-02-02
申请号：US13196380
申请日：2011-08-02
申请人： Hwan Wook PARK , Woo Seop KIM , Sung Bum CHO
发明人： Hwan Wook PARK , Woo Seop KIM , Sung Bum CHO
IPC分类号： G01R31/00
CPC分类号： G01R1/045 , G01R1/0466
摘要： A test device is provided. The test device includes a first via which transmits a supply voltage, a second via which transmits a ground voltage, a test board including a plurality of test signal vias for transmitting a plurality of test signals, a capacitor disposed on an upper part of the test board and connected between the first via and the second via, and a test socket which electrically connects a device under test (DUT) with the test board. The test socket includes a first region including a flat lower surface bordering the test board, a second region including an uneven lower surface, a plurality of first contactors which are disposed in the first region and which are connected to the plurality of vias, and two second contactors which are disposed in the second region and which are connected to two terminals of the capacitor.
摘要翻译：提供测试设备。测试装置包括发送电源电压的第一通孔，发送接地电压的第二通孔，包括用于发送多个测试信号的多个测试信号通孔的测试板，设置在测试的上部的电容器并连接在第一通孔和第二通孔之间，以及将被测器件（DUT）与测试板电连接的测试插座。测试插座包括：第一区域，包括与测试板邻接的平坦的下表面，包括不平坦的下表面的第二区域;多个第一接触器，其布置在第一区域中并连接到多个通孔;以及两个第二接触器，其布置在第二区域中并且连接到电容器的两个端子。

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