专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US08718975B2 Surface profile evaluation 有权
标题翻译：表面轮廓评估
公开(公告)号：US08718975B2
公开(公告)日：2014-05-06
申请号：US13202358
申请日：2010-02-24
申请人： Hugo M P Lobato , Ian R Gower , Christopher A Powell , Nicholas B Orchard
发明人： Hugo M P Lobato , Ian R Gower , Christopher A Powell , Nicholas B Orchard
IPC分类号： G06F15/00
CPC分类号： G01B21/04
摘要： A method and system for accepting or rejecting a curved surface of a body under evaluation involves conducting a comparison between the curvature of a surface profile for the surface under evaluation and higher and lower curvature tolerance boundaries. The higher and lower curvature tolerance boundaries are determined from a desired surface profile. The curvature at a plurality of locations on the curve profile under evaluation may be defined with reference to a geometric variable for said curved surface and may be plotted on a graph. The higher and lower curvature tolerance boundaries may also be plotted on the graph so as to determine whether the plot of curvature for the surface under evaluation falls within the bounds of the higher and lower tolerance boundaries.
摘要翻译：用于接受或拒绝正在评价的身体的曲面的方法和系统包括进行被评估表面的曲率曲率与较高和较低曲率公差边界之间的比较。根据期望的表面轮廓确定较高和较低的曲率公差边界。在评估曲线轮廓上的多个位置处的曲率可以参考所述弯曲表面的几何变量来定义并且可以绘制在图上。也可以在曲线图上绘制较高和较低的曲率公差边界，以便确定被评估表面的曲率曲线是否落在较高和较低公差边界的范围内。

2. 发明申请

US20090178482A1 Apparatus for Measuring Wall Thicknesses of Objects 有权
标题翻译：用于测量物体壁厚的装置
公开(公告)号：US20090178482A1
公开(公告)日：2009-07-16
申请号：US11990123
申请日：2006-08-08
申请人： Gerald W Hough , Nicholas B Orchard , Dean S R Whiteside
发明人： Gerald W Hough , Nicholas B Orchard , Dean S R Whiteside
IPC分类号： G01N29/24 , G01B5/008
CPC分类号： G01B17/02 , G01B21/04
摘要： An apparatus for measuring wall thicknesses of objects, comprises: a coordinate measuring machine comprising a probe holder and an object support, the coordinate measuring machine being configured to provide relative movement between the probe holder and the object support in three dimensions; and an ultrasonic test probe which is held by the probe holder. The coordinate measuring machine brings the transducer of the ultrasonic test probe into contact with a position on a surface of an object at the object support so that the probe can measure an object wall thickness at the probe contact position.
摘要翻译：一种用于测量物体的壁厚的装置，包括：坐标测量机，包括探针支架和物体支撑件，所述坐标测量机被配置为在三维空间中提供所述探针支架和所述物体支撑件之间的相对运动; 以及由探针架保持的超声波探伤。坐标测量机使超声波测试探针的换能器与物体支撑物上的物体表面上的位置接触，以便探头能够在探针接触位置测量物体壁厚。

3. 发明授权

US08175842B2 Method and system for measuring a component 有权
标题翻译：测量组件的方法和系统
公开(公告)号：US08175842B2
公开(公告)日：2012-05-08
申请号：US12227972
申请日：2007-06-14
申请人： Mitchel Cameron , Hang W Lung , Nicholas B Orchard , Michael J S Gooder
发明人： Mitchel Cameron , Hang W Lung , Nicholas B Orchard , Michael J S Gooder
IPC分类号： G01B21/20 , G01B5/20
CPC分类号： G01B21/20 , F01D5/141 , F05D2230/80 , F05D2240/121 , F05D2240/303 , F05D2250/71 , F05D2250/74 , G05B19/401 , G05B2219/32228 , G05B2219/37064 , G05B2219/45147 , Y02T50/673
摘要： A method for measuring the profile of a component in the region of an edge of the component comprises the following steps: determining the position of an edge point of the component; defining a center line for the component in the region of the edge; and measuring at least one dimension of the component with reference to the center line.
摘要翻译：用于测量部件边缘区域中的部件轮廓的方法包括以下步骤：确定部件的边缘点的位置; 在边缘的区域中定义组件的中心线; 并参照中心线测量部件的至少一个维度。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式