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1. 发明专利

JP2008039522A Analyzer 有权
标题翻译：分析仪
公开(公告)号：JP2008039522A
公开(公告)日：2008-02-21
申请号：JP2006212403
申请日：2006-08-03
申请人： Horiba Ltd , Toyota Motor Corp , トヨタ自動車株式会社 , 株式会社堀場製作所
发明人： HIRAMATSU TAKAYO , SAGAMI HIROO , MIZOE HIDEAKI , KOMATANI SHINTARO , OHORI KENICHI , FUJIMOTO TORU , NISHIKATA YASUHIRO
IPC分类号： G01N23/223 , G01N21/35 , G01N21/3563
摘要： PROBLEM TO BE SOLVED: To provide an analyzer capable of preventing the shift of an analyzing position and the loss of an object to be irradiated when X-ray analysis and infrared analysis are respectively performed to perform X-ray analysis with high precision. SOLUTION: The analyzer is equipped with a sample stage 10 having a mount part 12 on which the sample 20 is mounted, an X-ray analyzing unit having a fluorescent X-ray detector provided with a first polycapillary lens 48 for emitting X rays and a second polycapillary lens for detecting secondary X rays, an infrared irradiation unit 30 for emitting infrared rays, an infrared ray detection unit 34 for detecting infrared rays, a moving device for moving the sample stage 10 to a position where the mount part 12 is irradiated with X rays from the X-ray analyzing unit or moving the sample stage 10 to a position where the mount part 12 is irradiated is irradiated with infrared rays from the infrared irradiation unit 30 and a pressure rod 22 for pressing the sample 20 to the mount part 12 in the state that the sample stage 10 is moved to the position where the mount part 12 is irradiated with the infrared rays from the infrared irradiation unit 30. COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：为了提供能够防止分析位置的偏移和当分别进行X射线分析和红外分析时要照射的物体的损失的分析仪以高精度进行X射线分析。解决方案：分析仪配备有具有安装部件12的样品台10，样品20安装在其上的X射线分析单元，具有荧光X射线检测器，该荧光X射线检测器设置有用于发射X的第一多毛细透镜48 用于检测次X射线的第二多毛细透镜，用于发射红外线的红外线照射单元30，用于检测红外线的红外线检测单元34，用于将样品台10移动到安装部12的位置的移动装置用X射线分析装置的X射线照射或将样品台10移动到照射了安装部分12的位置，红外线照射单元30和用于将样品20按压的压力杆22照射到红外线在安装部分12处于样品台10移动到安装部分12被来自红外辐射单元30的红外线照射的位置的状态。（C）2008，JPO和INPIT

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