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1. 发明授权

US06447322B1 Test socket for an electronic assembly which reduces damage to the electronic assembly 失效
标题翻译：用于电子组件的测试插座，可减少对电子组件的损坏
公开(公告)号：US06447322B1
公开(公告)日：2002-09-10
申请号：US09643577
申请日：2000-08-22
申请人： Hongfei Yan , Michael S. Carrol
发明人： Hongfei Yan , Michael S. Carrol
IPC分类号： H01R1362
CPC分类号： H05K7/1053 , G01R1/0458
摘要： A test socket for an electronic assembly comprising a holder, a plurality of electric terminals, a heat sink, a compliant and thermally conductive thermal interface component, and a heat sink biasing device is provided. The holder has a formation to receive the electronic assembly. The electric terminals are located on the holder, each for making contact with a respective electric contact and the electronic assembly to test an integrated circuit of the electronic assembly. The heat sink is secured to the holder. The thermal interface component is attached to a surface of the heat sink. The heat sink biasing device has a first portion connected to the holder and a second portion connected to the heat sink, the second portion being biased relative to the first portion to move the heat sink from a loading position wherein the electronic assembly is insertable into the holder, to a testing position wherein the heat sink is located next to the electronic assembly with the thermal interface component between the surface of the heat sink and the electronic assembly and contacting the electronic assembly.
摘要翻译：提供了一种用于电子组件的测试插座，其包括保持器，多个电端子，散热器，柔性和导热热接口部件以及散热器偏置装置。支架具有接收电子组件的形式。电气端子位于保持器上，每个用于与相应的电触头和电子组件接触以测试电子组件的集成电路。散热片固定在支架上。热界面部件连接到散热器的表面。散热器偏置装置具有连接到保持器的第一部分和连接到散热器的第二部分，第二部分相对于第一部分被偏置，以将散热器从装载位置移动，其中电子组件可插入到保持器到测试位置，其中散热器位于电子组件旁边，其中热接口部件在散热器的表面和电子组件之间并且接触电子组件。

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