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    • 1. 发明授权
    • AFM for simultaneous recognition of multiple factors
    • AFM同时识别多个因素
    • US07745206B2
    • 2010-06-29
    • US12022072
    • 2008-01-29
    • Hongda WangStuart Lindsay
    • Hongda WangStuart Lindsay
    • C12M1/34C12M3/00
    • G01Q60/42G01Q30/04
    • An atomic force microscope and a method for detecting interactions between a probe and two or more sensed agents on a scanned surface and determining the relative location of two or more sensed agents is provided. The microscope has a scanning probe with a tip that is sensitive to two or more sensed agents on said scanned surface; two or more sensing agents tethered to the tip of the probe; and a device for recording the displacement of said probe tip as a function of time, topographic images, and the spatial location of interactions between said probe and the two or more sensed agents on said surface.
    • 提供了一种原子力显微镜和用于检测探针与扫描表面上的两个或更多个感测到的试剂之间的相互作用并确定两个或更多个感测到的试剂的相对位置的方法。 显微镜具有扫描探针,其具有对所述扫描表面上的两个或更多个感测到的试剂敏感的尖端; 两个或更多个感测剂束缚于探针的尖端; 以及用于根据时间,地形图像以及所述探针与所述表面上的两个或更多个感测到的试剂之间的相互作用的空间位置记录所述探针尖端的位移的装置。
    • 2. 发明申请
    • AFM FOR SIMULTANEOUS RECOGNITION OF MULTIPLE FACTORS
    • AFM同时识别多因素
    • US20080209989A1
    • 2008-09-04
    • US12022072
    • 2008-01-29
    • Hongda WangStuart Lindsay
    • Hongda WangStuart Lindsay
    • G01B5/28
    • G01Q60/42G01Q30/04
    • An atomic force microscope and a method for detecting interactions between a probe and two or more sensed agents on a scanned surface and determining the relative location of two or more sensed agents is provided. The microscope has a scanning probe with a tip that is sensitive to two or more sensed agents on said scanned surface; two or more sensing agents tethered to the tip of the probe; and a device for recording the displacement of said probe tip as a function of time, topographic images, and the spatial location of interactions between said probe and the two or more sensed agents on said surface.
    • 提供了一种原子力显微镜和用于检测探针与扫描表面上的两个或更多个感测到的试剂之间的相互作用并确定两个或更多个感测到的试剂的相对位置的方法。 显微镜具有扫描探针,其具有对所述扫描表面上的两个或更多个感测到的试剂敏感的尖端; 两个或更多个感测剂束缚于探针的尖端; 以及用于根据时间,地形图像以及所述探针与所述表面上的两个或更多个感测到的试剂之间的相互作用的空间位置记录所述探针尖端的位移的装置。
    • 5. 发明申请
    • MOLECULAR TRANSISTOR
    • 分子晶体管
    • US20140162247A1
    • 2014-06-12
    • US14003851
    • 2012-03-09
    • Stuart LindsayPei PangJin He
    • Stuart LindsayPei PangJin He
    • G01N27/414
    • G01N27/4146G01N33/48721
    • Fluidic nanotube devices and methods for their use are provided wherein the flow of charged molecules through a channel is controlled by the voltage potential of a gate electrode. In at least some embodiments, a molecular transistor is provided that includes a channel having a diameter such that only one target molecule at a time may traverse the channel. The channel may be a carbon nanotube that is electrically isolated from, and in communication with, a gate electrode. Methods are provided for controlling the flow of an individual molecule through the channel and for detecting a single chemical reaction.
    • 提供了流动的纳米管装置及其使用方法,其中通过通道的带电分子的流动由栅电极的电压电位来控制。 在至少一些实施例中,提供了一种分子晶体管,其包括具有使得一次只能有一个靶分子可以穿过该通道的直径的通道。 通道可以是与栅电极电隔离并与栅电极连通的碳纳米管。 提供了用于通过通道控制单个分子的流动并用于检测单个化学反应的方法。
    • 10. 发明授权
    • Controlled force microscope for operation in liquids
    • 控制力显微镜在液体中操作
    • US5515719A
    • 1996-05-14
    • US246035
    • 1994-05-19
    • Stuart Lindsay
    • Stuart Lindsay
    • B81B3/00G01B21/30G01Q10/06G01Q30/14G01Q60/24G01Q60/32G01B5/28
    • G01Q30/14G01Q10/06G01Q60/38B82Y35/00Y10S977/863Y10S977/865
    • An atomic force microscope in which the deflection of the force sensing probe owing to surface forces is canceled by an opposing magnetic force applied to a small magnetic particle on a force sensing cantilever. A deflection of the force sensing cantilever is detected by reflecting a laser beam from the cantilever into a position sensitive detector. The voltage signal from the position sensitive detector is used to drive an integrating servo loop which drives a current in a solenoid placed close to the force sensing cantilever, and exerts a force opposing the atomic force of attraction between the force sensing cantilever and the sample surface via a small magnetic particle attached to the cantilever and having its magnetic moment aligned with the axis of the solenoid. In this way, deflection of the force sensing cantilever is prevented for any force within the range of the servo control system. The driving signal for the cantilever is a measure of the operating force of the microscope and can be used to drive a conventional atomic force microscope controller to generate topographical images of the surface. The system works submerged in water and other liquids and can be used for profiling soft surfaces while avoiding the problem of the force sensing cantilever being pulled into the sample surface by attractive interactions between the sample surface and the force sensing cantilever.
    • 原子力显微镜,其中由于表面力的力传感探针的偏转被施加到力感测悬臂上的小磁性颗粒的相反的磁力抵消。 通过将来自悬臂的激光束反射到位置敏感检测器来检测力感测悬臂的偏转。 来自位置敏感检测器的电压信号用于驱动积分伺服回路,其驱动靠近力感测悬臂的螺线管中的电流,并施加与力感测悬臂与样本表面之间的原子吸力相反的力 通过附着在悬臂上的小磁性颗粒并使其磁矩与螺线管的轴线对齐。 以这种方式,可以防止在伺服控制系统的范围内的力的力传感悬臂的偏转。 悬臂的驱动信号是显微镜操作力的量度,可用于驱动常规的原子力显微镜控制器以产生表面的地形图像。 该系统工作在淹没在水和其他液体中,可以用于表面软化表面,同时避免通过样品表面和力感测悬臂之间的有吸引力的相互作用将力感测悬臂拉入样品表面的问题。