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1. 发明授权

US5570191A Identification of connector terminals 失效
标题翻译：识别连接器端子
公开(公告)号：US5570191A
公开(公告)日：1996-10-29
申请号：US321035
申请日：1994-10-06
申请人： Hitoshi Uesugi , Tsutomu Maki , Kazuyoshi Tomikawa , Tatsuya Maeda , Yoshimi Masuda
发明人： Hitoshi Uesugi , Tsutomu Maki , Kazuyoshi Tomikawa , Tatsuya Maeda , Yoshimi Masuda
IPC分类号： G01J3/02 , G01J3/50 , H01R13/03 , H01R43/00 , H01R43/20 , G01J3/46
CPC分类号： G01J3/02 , G01J3/0218 , G01J3/50 , G01J3/513
摘要： Connector housings having plural kinds of terminals (plated with different materials, e.g.) are mounted at predetermined locations, positioned and secured by a drive means. A sensor probe which receives a light, of a color detection device, is transferred successively to the locations opposite to the terminals. A color sensor senses a level of a specific color component of the light received by the sensor probe. The sensed level is compared with a predetermined reference level and it can be determined based upon whether the sensed level is higher than the reference level, the kind of the terminals in the connector housings.
摘要翻译：具有多种端子（例如电镀不同材料）的连接器壳体安装在预定位置，由驱动装置定位和固定。接收颜色检测装置的光的传感器探头被连续传送到与端子相对的位置。颜色传感器感测由传感器探针接收的光的特定颜色分量的水平。将感测到的电平与预定的参考电平进行比较，并且可以基于感测电平是否高于参考电平来确定连接器壳体中的端子的种类。

2. 发明授权

US06819116B2 Terminal crimped state testing method 有权
标题翻译：端子卷曲状态测试方法
公开(公告)号：US06819116B2
公开(公告)日：2004-11-16
申请号：US10079401
申请日：2002-02-22
申请人： Teruyuki Ishibashi , Kazuyoshi Tomikawa
发明人： Teruyuki Ishibashi , Kazuyoshi Tomikawa
IPC分类号： H01H3104
CPC分类号： H01R43/0488 , G01R31/04 , H01R2201/20 , Y10T29/49181 , Y10T29/53213
摘要： In a terminal crimped state testing method, in step S1, a reference waveform is created on the basis of a load when a terminal in a good crimped state is obtained, and the reference waveform is divided into plural reference waveform segments to set singular points. In step S2, the reference waveform segments containing singular points of the segments are integrated. In step S3, a characteristic waveform is created on the basis of the load when a crimping terminal to be tested is obtained. The characteristic waveform thus created is divided into plural sample waveform segments and the waveform segments corresponding to the reference waveform segments are integrated. In step S4, the integrated values of the reference waveform segments are compared with those of the sample waveform segments, thereby deciding whether the crimped state of the crimping terminal is good or not. In this configuration, the terminal crimped state can be stably tested, the defectiveness is precisely detected, and the time taken for testing can be shortened.
摘要翻译：在端子压接状态测试方法中，在步骤S1中，当获得良好压接状态的端子时，基于负载创建参考波形，并且将参考波形划分成多个参考波形段以设置奇异点。在步骤S2中，包含段的奇异点的参考波形段被积分。在步骤S3中，当获得被测试的压接端子时，基于负载产生特性波形。这样产生的特征波形被分成多个采样波形段，与参考波形段对应的波形段被积分。在步骤S4中，将参考波形段的积分值与采样波形段的积分值进行比较，从而判断压接端子的压接状态是否良好。在这种结构中，可以稳定地测试端子卷曲状态，精确地检测缺陷，并且可以缩短测试所需的时间。

3. 发明授权

US5604440A Method of testing a wire harness using a multicontact connector 失效
标题翻译：使用多触点连接器测试线束的方法
公开(公告)号：US5604440A
公开(公告)日：1997-02-18
申请号：US504790
申请日：1995-07-20
申请人： Kazuyoshi Tomikawa , Toshinori Igura , Takayuki Tsuchiya
发明人： Kazuyoshi Tomikawa , Toshinori Igura , Takayuki Tsuchiya
IPC分类号： B60R16/02 , G01R31/04 , H01R43/00 , G01R27/76
CPC分类号： G01R31/045 , B60R16/0207
摘要： A connector formed with a first portion on the connector positioned differently according to a kind of the connector. The first portion is, for example, the forward end of a terminal or a cutout formed on the housing of the connector. At least one multicontact switch pin is fixedly arranged on a carriage base in a direction such that the probe pin of the multicontact pin extends towards the first portion. The switch pin has at least two contacts and a probe pin projecting outwardly of the multicontact switch pin. Each of the contacts is connected to a corresponding test circuit. The probe pin is adapted to move into and/or out of contact with the contacts when the probe pin is pushed inwardly into the multicontact switch pin. The carriage base is moved by a predetermined distance towards the connector to allow the probe pin to engage the first portion so that the probe pin moves into and/or out of contact with said contacts. Continuity in the test circuits is checked to determine the position of the first portion in a direction in which the probe pin moves towards the first portion.
摘要翻译：一种连接器，其形成有连接器上的第一部分，根据连接器的种类不同地定位。第一部分例如是形成在连接器的壳体上的端子或切口的前端。至少一个多触点开关销固定地布置在滑架基座上，使得多触头销的探针朝向第一部分延伸。开关引脚至少有两个触点和一个探头引脚向外伸出多触点开关引脚。每个触点连接到相应的测试电路。当探头针向内推入多功能开关销时，探针适于移入和/或脱离触点。托架基座朝向连接器移动预定距离，以允许探针与第一部分接合，使得探针与所述触点移动和/或脱离接触。检查测试电路中的连续性以确定第一部分在探针针对第一部分移动的方向上的位置。

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