会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明专利
    • Scan probe microscope and observation method of sample using the same
    • 扫描探针显微镜和使用其的样品观察方法
    • JP2012058263A
    • 2012-03-22
    • JP2011280709
    • 2011-12-22
    • Hitachi Ltd株式会社日立製作所
    • NAKADA TOSHIHIKOWATANABE MASAHIROINOUE TAKASHIHIDAKA KISHIFUHIROOKA MASAYUKI
    • G01Q60/22G01Q70/12
    • G01Q60/18G01Q60/22
    • PROBLEM TO BE SOLVED: To solve the problem that, in a near-field scan microscope using an aperture probe, aperture formation of several tens of nm is the limit in practical use and, in a near-field scan microscope using a scatter probe, a resolution of several tens of nm is the limit as an external illumination light becomes a background noise; furthermore, measurement reproducibility is extremely reduced by damage or wearing of the probe.SOLUTION: A cylindrical structure of nanometer order and microparticles of nanometer order are combined to configure a plasmon-enhanced near-field probe having an optical resolution of nanometer order, and by repeating approach/turning-out with a low contact force at each measuring point on a sample, optical information and ruggedness information of a sample surface can be measured with a resolution of nanometer order and high reproducibility, without giving damage to both the probe and the sample.
    • 要解决的问题为了解决在使用孔径探针的近场扫描显微镜中,几十nm的孔径形成是实际使用的极限,并且在近场扫描显微镜中使用 散射探头,几十nm的分辨率是外部照明光成为背景噪声的极限; 此外,通过探头的损坏或磨损极大地降低了测量重现性。 解决方案:纳米级的圆柱形结构和纳米级的微粒被组合以配置具有纳米级光学分辨率的等离子体增强近场探针,并且以低接触力重复接近/断开 样品表面的每个测量点,样品表面的光学信息和耐久性信息可以以纳米级分辨率和高重现性测量,而不会对探头和样品造成损害。 版权所有(C)2012,JPO&INPIT
    • 4. 发明专利
    • Scanning probe microscope and sample observation method using same
    • 扫描探针显微镜和使用相同的样品观察方法
    • JP2010197208A
    • 2010-09-09
    • JP2009042242
    • 2009-02-25
    • Hitachi Ltd株式会社日立製作所
    • NAKADA TOSHIHIKOWATANABE MASAHIROINOUE TAKASHIHIDAKA KISHIFUOKAI MAKOTOHIROOKA MASAYUKI
    • G01Q60/22G01Q70/12
    • G01Q60/22G01Q70/12
    • PROBLEM TO BE SOLVED: To provide a scanning probe microscope for measuring optical information on a sample surface and information on the irregularity at a resolution of the order of nanometers, the high reproducibility and a high SN ratio without damaging both of a probe and a sample. SOLUTION: In the scanning probe microscope, a nanotube 1 and metal nano particles 2a, 2b, 2c are combined as the measurement probe having an internally-embedded metal structure, and a plasmon enhancement near field probe is composed so as to have the optical resolution of the order of nanometers. Since the plasmon enhancement near field probe is mounted to an efficient plasmon excitation section and repetitively approaches and backwardly moves at each measurement point on the sample by a low contact force, the optical information on the sample surface and the information on the irregularity are measured at the resolution of the order of nanometers, the high reproducibility and the high SN ratio without damaging both of the probe and the sample. COPYRIGHT: (C)2010,JPO&INPIT
    • 要解决的问题:提供一种扫描探针显微镜,用于测量样品表面上的光学信息和关于不规则性的信息,分辨率为纳米级,高重现性和高SN比,而不损害探针 和一个样本。 解决方案:在扫描探针显微镜中,组合纳米管1和金属纳米颗粒2a,2b,2c作为具有内嵌金属结构的测量探针,并且构成场致发射附近的等离子体激元增强以具有 光学分辨率为纳米级。 由于近场探头附近的等离子体增强装置安装到有效的等离子体激发部分,并且通过低接触力在样品的每个测量点处重复地接近和向后移动,所以样品表面上的光学信息和不规则性的信息在 纳米级的分辨率,高重现性和高SN比,而不损害探针和样品。 版权所有(C)2010,JPO&INPIT
    • 5. 发明专利
    • Scanning probe microscope and method of observing sample using the same
    • 扫描探针显微镜及其使用方法观察样品
    • JP2009236895A
    • 2009-10-15
    • JP2008252097
    • 2008-09-30
    • Hitachi Ltd株式会社日立製作所
    • NAKADA TOSHIHIKOWATANABE MASAHIROINOUE TAKASHIHIDAKA KISHIOOKAI MAKOTOMORITA TOSHIAKIHIROOKA MASAYUKI
    • G01Q60/06G01Q60/18G01Q60/22
    • G01Q60/06G01N21/648G01Q60/22G01Q70/12
    • PROBLEM TO BE SOLVED: To solve the problem of being a limit of resolution in several ten nanometer, and the problem of being remarkably low in measurement reproducibility by damage and abrasion of a probe, since the opening formation of several ten nm is practically a limit in a near-field scanning microscope using an opening probe and the external illuminating light becomes background noise in the near-field scanning microscope using a scattering probe. SOLUTION: A plasmon-increased near-field probe having the optical separation function of a nanometer-order is constituted by combining a cylindrical structure of the nanometer- order and a microscopic structure of the nanometer-order, and optical information and recess-projection information on a sample surface are measured with nanometer-order resolution and high reproducibility, without damaging both the probe and a sample, by repeating the approach-retreat by low contact force at respective measuring points on the sample. COPYRIGHT: (C)2010,JPO&INPIT
    • 要解决的问题:为了解决几纳米的分辨率极限的问题,以及由于探针的损伤和磨损而导致的测量再现性显着低的问题,由于几十nm的开口形成是 在使用散射探针的近场扫描显微镜中,使用开口探针的近场扫描显微镜实际上是极限,并且外部照明光成为背景噪声。 解决方案:具有纳米级的光学分离功能的等离子体增强的近场探针是通过将纳米级的圆柱形结构和纳米级的微观结构与光学信息和凹部 在样品表面上的投影信息以纳米级分辨率和高重现性测量,而不损害探针和样品,通过在样品的各个测量点处以低接触力重复接近 - 退回。 版权所有(C)2010,JPO&INPIT
    • 6. 发明专利
    • Recording apparatus and recording method
    • 记录装置和记录方法
    • JP2009060610A
    • 2009-03-19
    • JP2008220783
    • 2008-08-29
    • Hitachi Ltd株式会社日立製作所
    • INOUE TAKASHINAGAYAMA KEIJIYATSUGI FUMISHIGE
    • H04N5/91G03B17/18G06F3/048H04N5/225H04N5/93
    • PROBLEM TO BE SOLVED: To improve operationality in small equipment by searching, classifying, and deleting a big volume of recording data at high speed and simply. SOLUTION: A digital video sound recording and reproducing apparatus includes: moving video signal recording and reproducing means; still image signal recording and reproducing means; digital sound signal recording and reproducing means recorded in synchronism with video; display means capable of displaying the moving image video signal and the still image video signal; and recording condition recording means for recording conditions containing data information of recording data for discriminating the moving video and the still image video. In the apparatus, on the display screen of the display means fort displaying the video signal recording conditions composed of at least data information of recoding data and of recording time information are displayed in graphic display or in a character display, and the displayed recording data is selected on the display screen. COPYRIGHT: (C)2009,JPO&INPIT
    • 要解决的问题:通过高速简单地搜索,分类和删除大量记录数据,提高小型设备的运行性能。 解决方案:数字视频声音记录和再现装置包括:移动视频信号记录和再现装置; 静止图像信号记录和再现装置; 与视频同步记录的数字声音信号记录和再现装置; 能够显示运动图像视频信号和静止图像视频信号的显示装置; 以及记录条件记录装置,用于记录包含用于识别运动视频和静止图像视频的记录数据的数据信息的条件。 在该装置中,在图形显示或字符显示中显示用于显示由至少包含记录数据的数据信息和记录时间信息的视频信号记录条件的显示装置的显示屏幕,并且显示的记录数据 在显示屏上选择。 版权所有(C)2009,JPO&INPIT
    • 9. 发明专利
    • Scanning probe microscope and method of observing sample using the same
    • 扫描探针显微镜及其使用方法观察样品
    • JP2008256672A
    • 2008-10-23
    • JP2007322722
    • 2007-12-14
    • Hitachi Ltd株式会社日立製作所
    • NAKADA TOSHIHIKOWATANABE MASAHIROINOUE TAKASHIHIDAKA KISHIFUHIROOKA MASAYUKI
    • G01Q60/22G01Q70/12
    • G01Q60/18G01Q60/22
    • PROBLEM TO BE SOLVED: To solve the problems, wherein in a near-field scanning microscope that uses an aperture probe, the upper limit of the aperture formation is at most several tens of nms in practice, in a near-field scanning microscope that uses a scatter probe, the resolution ability is limited to at most several tens of nms, because of the external illuminating light serving as background noises, and moreover, the measurement reproducibility is markedly lower due to damages or abrasion of a probe. SOLUTION: Optical data and unevenness data of the surface of a sample can be measured at a nm-order resolution ability and a high reproducibility, while damaging neither the probe nor the sample by fabricating a plasmon-enhanced near-field probe having a nm-order optical resolution ability, by combining a nm-order cylindrical structure with nm-order microparticles, and repeatedly moving the probe toward the sample and away therefrom with a small contact force at individual measurement points on the sample. COPYRIGHT: (C)2009,JPO&INPIT
    • 要解决的问题为了解决在使用孔径探针的近场扫描显微镜中,实际上在近场扫描中孔径形成的上限为几十nms的问题, 使用散射探针的显微镜,由于外部照明光作为背景噪声,分辨能力被限制在至多几十nms,此外,由于探针的损伤或磨损,测量再现性显着降低。 解决方案:可以以nm级分辨能力和高再现性测量样品表面的光学数据和不均匀性数据,同时通过制造等离子体增强近场探针而不损害探针和样品,具有 通过将nm级圆柱形结构与nm级微粒组合,并将探针重复地移动到样品并在样品上的各个测量点处以较小的接触力将其远离,从而获得nm级光学分辨能力。 版权所有(C)2009,JPO&INPIT
    • 10. 发明专利
    • Recording reservation/reproducing device
    • 记录预约/复制设备
    • JP2006203483A
    • 2006-08-03
    • JP2005012231
    • 2005-01-20
    • Hitachi Ltd株式会社日立製作所
    • FURUI MAKIINOUE TAKASHIKAWAI NAOYUKIYOSHIMARU TAKUSHIKOBAYASHI HIROTAKA
    • H04N5/76G11B27/00G11B27/10H04N5/44
    • PROBLEM TO BE SOLVED: To provide a recording reservation/reproducing device with which a folder of a content can easily be edited.
      SOLUTION: The recording reservation/reproducing device 1 is provided with a recording/reproducing device 109, a display device 200, a controller 101 and a remote operation device 300. Recording information of the content having program data is called from the recording/reproducing device 109 and is list-displayed on the display device 200. A retrieval condition on the content is received, recording information of the content matched with the retrieval condition is extracted from the recording/reproducing device 109 and is list-displayed on the display device 200. Generation of the folder of the content which is list-displayed is received, the folder is generated and reservation information on the content included in the generated folder is retrieved. When reservation information does not exist, recording reservation of the content is set.
      COPYRIGHT: (C)2006,JPO&NCIPI
    • 要解决的问题:提供一种可以容易地编辑内容的文件夹的记录预约/再现装置。 解决方案:记录预约/再现设备1设置有记录/再现设备109,显示设备200,控制器101和远程操作设备300.从录制中调用具有节目数据的内容的记录信息 /再现装置109并被列表显示在显示装置200上。接收到关于内容的检索条件,从记录/再现装置109提取与检索条件匹配的内容的记录信息,并将其列表显示在 显示设备200.接收到列表显示的内容的文件夹的生成,生成该文件夹,并且检索关于生成的文件夹中包含的内容的预约信息。 当不存在预约信息时,设定内容的记录预约。 版权所有(C)2006,JPO&NCIPI