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1. 发明授权

US09410929B2 Inspection device and inspection method 有权
标题翻译：检验装置及检验方法
公开(公告)号：US09410929B2
公开(公告)日：2016-08-09
申请号：US14177965
申请日：2014-02-11
申请人： Hitachi, Ltd.
发明人： Hisashi Endo , Soshi Narishige , Mitsuteru Inoue , Hiroyuki Takagi
IPC分类号： G01N27/82 , G01N27/72 , H01J37/26 , G01N21/21 , G01R33/032 , G01N21/88
CPC分类号： G01N27/82 , G01N21/21 , G01N21/8806 , G01N27/72 , G01R33/032 , G01R33/0322
摘要： Provided are an inspection device and an inspection method capable of achieving improved magnetic field sensitivity by using a magnetic thin film of a small film thickness. A light-emitting unit 1 emits light of a first wavelength for acquiring magnetic field inspection information and a second wavelength for acquiring inspection object surface information. A selection unit 6 selects information from an inspection object 4 and information from a magnetophotonic crystal film 3 acquired by light irradiation performed by an irradiation unit 2. An image generation unit 9 generates image data based on the magnetic field inspection information acquired with the first wavelength and the inspection object surface information acquired with the second wavelength selected by the selection unit. Each of the generated image data is displayed on a display unit 10.
摘要翻译：提供能够通过使用薄膜厚度的磁性薄膜来实现提高的磁场灵敏度的检查装置和检查方法。发光单元1发射用于获取磁场检查信息的第一波长的光和用于获取检查对象表面信息的第二波长。选择单元6从检查对象4中选择信息和通过照射单元2进行的光照射而获得的来自磁光子晶体膜3的信息。图像生成单元9基于以第一波长获取的磁场检查信息来生成图像数据以及由选择单元选择的用第二波长获取的检查对象面信息。所生成的图像数据中的每一个显示在显示单元10上。

2. 发明授权

US09274085B2 Eddy current inspection device, eddy current inspection probe, and eddy current inspection method 有权
标题翻译：涡流检测装置，涡流检测探头和涡流检测方法
公开(公告)号：US09274085B2
公开(公告)日：2016-03-01
申请号：US13787953
申请日：2013-03-07
申请人： Hitachi, Ltd.
发明人： Hisashi Endo , Akira Nishimizu , Noriyuki Sadaoka
IPC分类号： G01N27/87 , G01N27/90 , G01R33/385
CPC分类号： G01N27/87 , G01N27/902 , G01R33/385
摘要： Provided is an eddy current inspection device, an eddy current inspection probe and an eddy current inspection method that make it possible to detect defects existing in deeper parts of test objects. Three or more odd number of excitation coils are arranged at even intervals in a circumferential direction on a postulated circumference. Excitation currents applied to the excitation coils are controlled so that the phase difference between excitation currents applied to adjacent ones of the excitation coils arranged in the circumferential direction on the postulated circumference equals one cycle divided by the number of excitation coils. A magnetic field generated according to an eddy current occurring in the test object due to a magnetic field caused by the application of the excitation currents to the excitation coils is detected by use of a detector arranged on a postulated plane containing the postulated circumference but inside the postulated circumference.
摘要翻译：提供涡流检查装置，涡流检查探针和涡流检查方法，可以检测测试对象的较深部分中存在的缺陷。三个或更多个奇数个励磁线圈在假定圆周上沿圆周方向以均匀间隔布置。控制施加到激励线圈的励磁电流，使得施加到在假想圆周上沿圆周方向布置的相邻激励线圈的激励电流之间的相位差等于一个周期除以激励线圈的数量。通过使用布置在包含假定圆周的假定平面上的检测器来检测由于通过向激励线圈施加激励电流而引起的由磁场引起的在测试对象中产生的涡流产生的磁场，假定圆周

3. 发明授权

US09810743B2 Deterioration diagnosis system 有权
公开(公告)号：US09810743B2
公开(公告)日：2017-11-07
申请号：US14707245
申请日：2015-05-08
申请人： Hitachi, Ltd.
发明人： Kohji Maki , Shinya Yuda , Hiroaki Kojima , Satoshi Kikuchi , Hisashi Endo
IPC分类号： G01R31/14 , G01R31/00 , G01R31/34 , G01M13/04 , G01R31/12 , G01R31/02
CPC分类号： G01R31/343 , G01M13/04 , G01R31/025 , G01R31/12 , G01R31/34
摘要： Provided is a deterioration diagnosis system which diagnoses deterioration of an N-phase rotational machine (N denotes a natural number). The deterioration diagnosis system includes a first current sensor to be attached individually to at least lead wires of (N-1)-phases in a rotational machine, the first current sensor being able to detect a current amplitude arising from a plurality of deterioration causes, and a second current sensor to be attached collectively to the lead wires of all phases in the rotational machine, the second current sensor being able to detect a current amplitude arising from a plurality of deterioration causes.

4. 发明授权

US11513013B2 Stress distribution measurement device and stress distribution measurement method 有权
公开(公告)号：US11513013B2
公开(公告)日：2022-11-29
申请号：US17008838
申请日：2020-09-01
申请人： Hitachi, Ltd.
发明人： Masanori Kitaoka , Hisashi Endo , Hiroshi Yoshikawa , Toshihiro Yamada , Nobuhiro Kakeno
IPC分类号： G01L1/00 , G01L1/12 , G01L1/22 , G01R33/032
摘要： A stress distribution measurement device includes: a first magnetostrictive sensor and a second magnetostrictive sensor each including an excitation coil that excites AC magnetism in a measurement target using alternating current, and a detection coil to which alternating current is induced due to the AC magnetism flowing in the measurement target; an excitation circuit that applies a first excitation voltage to the excitation coil of the first magnetostrictive sensor and applies a second excitation voltage to the excitation coil of the second magnetostrictive sensor, the second excitation voltage having a phase or a waveform different from the first excitation voltage; and a detection circuit that includes a first detector that performs synchronous detection of current flowing in the detection coil of the first magnetostrictive sensor based on the first excitation voltage and a second detector that performs synchronous detection of current flowing in the detection coil of the second magnetostrictive sensor based on the second excitation voltage.

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