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1. 发明授权

US07676908B2 Pressing member and electronic device handling apparatus 失效
标题翻译：按压构件和电子装置处理装置
公开(公告)号：US07676908B2
公开(公告)日：2010-03-16
申请号：US11631419
申请日：2004-07-09
申请人： Hisao Hayama , Noboru Saito , Makoto Sagawa
发明人： Hisao Hayama , Noboru Saito , Makoto Sagawa
IPC分类号： H01R43/00
CPC分类号： G01R31/2887 , G01R31/2891 , Y10T29/49218 , Y10T29/53209 , Y10T29/53213
摘要： A pusher 30 is composed of a pusher base 31 and a pressing body 32 attached to the pusher base 31 in a removable way. Specifically, a base portion of the pressing body 32 is provided with a flange portion 321, and the pusher base 31 is provided with a plate 33 having a U-shape when seen two-dimensionally. By sliding the pressing body 32 with respect to the pusher base 31 with the flange portion 321 of the pressing body 32 supported by the plate 33, the pressing body 32 can be attached to and removed from the pusher 30 without using any tools.
摘要翻译：推动器30由推动器基座31和以可移除的方式附接到推动器基座31的按压体32组成。具体地，按压体32的基部设有凸缘部321，并且推动器基座31在二维地设置有具有U形的板33。通过由按压体32的由板33支撑的凸缘部321相对于推动器基座31滑动按压体32，可以在不使用任何工具的情况下将按压体32安装到推动器30上并从其移除。

2. 发明申请

US20080048158A1 Pressing Member and Electronic Device Handling Apparatus 失效
标题翻译：压件和电子装置处理装置
公开(公告)号：US20080048158A1
公开(公告)日：2008-02-28
申请号：US11631419
申请日：2004-07-09
申请人： Hisao Hayama , Noboru Saito , Makoto Sagawa
发明人： Hisao Hayama , Noboru Saito , Makoto Sagawa
IPC分类号： G01R31/26 , B66F13/00
CPC分类号： G01R31/2887 , G01R31/2891 , Y10T29/49218 , Y10T29/53209 , Y10T29/53213
摘要： A pusher 30 is composed of a pusher base 31 and a pressing body 32 attached to the pusher base 31 in a removable way. Specifically, a base portion of the pressing body 32 is provided with a flange portion 321, and the pusher base 31 is provided with a plate 33 having a U-shape when seen two-dimensionally. By sliding the pressing body 32 with respect to the pusher base 31 with the flange portion 321 of the pressing body 32 supported by the plate 33, the pressing body 32 can be attached to and removed from the pusher 30 without using any tools.
摘要翻译：推动器30由推动器基座31和以可移除的方式附接到推动器基座31的按压体32组成。具体地，按压体32的基部设有凸缘部321，并且推动器基座31在二维地设置有具有U形的板33。通过由按压体32的由板33支撑的凸缘部321相对于推动器基座31滑动按压体32，可以在不使用任何工具的情况下将按压体32安装到推动器30上并从其移除。

3. 发明授权

US06522125B2 Tray transfer arm, electronic component testing apparatus and tray transfer method 有权
标题翻译：托盘传送臂，电子元件测试仪和托盘传送方式
公开(公告)号：US06522125B2
公开(公告)日：2003-02-18
申请号：US09309306
申请日：1999-05-11
申请人： Makoto Sagawa
发明人： Makoto Sagawa
IPC分类号： G01R3102
CPC分类号： G01R31/2887
摘要： A tray transfer arm which is widely used regardless of kinds of customer trays and capable of maintaining the stability of holding ICs to be tested. The tray transfer arm for transferring customer trays KST loaded with a plurality of ICs to be tested comprises a cover plate for covering the opening surface of a pocket of the tray.
摘要翻译：托盘传送臂，无论客户托盘有多种，都能广泛使用，能够保持待测IC的稳定性。用于传送客户托盘的托盘传送臂装载有待测试的多个IC的KST包括用于覆盖托盘的口袋的开口表面的盖板。

4. 发明授权

US5625287A Test tray positioning stopper mechanism for automatic handler 失效
标题翻译：测试盘定位止动机构，用于自动处理
公开(公告)号：US5625287A
公开(公告)日：1997-04-29
申请号：US410821
申请日：1995-03-27
申请人： Hiroto Nakamura , Makoto Sagawa , Yoshihito Kobayashi
发明人： Hiroto Nakamura , Makoto Sagawa , Yoshihito Kobayashi
IPC分类号： G01R31/26 , B23Q7/14 , B23Q16/00 , B65G47/88 , G01R31/02 , G01R31/28
CPC分类号： B23Q7/1447 , B23Q16/001 , G01R31/2851 , G01R31/2893
摘要： An automatic handler for an IC test system is disclosed which is capable of reducing a time for transferring IC devices to be tested from a supply area to a test head area and from the test head area to a discharge area. The automatic handler includes a test tray for loading the IC devices to be tested in which the IC devices to be tested are aligned in the test tray with a shorter distance with one another than a distance between test contactors in the test head area, a pair of positioning stoppers provided in the test head area along a moving direction of the test tray in which the positioning stoppers are spaced by the distance equal to the distance of the IC devices to be tested in the test tray. In the automatic handler, the distance of the contactors is adjusted to an integer multiple of the distance of the IC devices to be tested in the test tray. One of the positioning stoppers contacts the test tray to determine a first position for testing the IC devices in a first line in the test tray, and then the test tray is transferred until other positioning stoppers contacts the test tray in a second position for testing the IC devices in a second line in the test tray. The test tray is then transferred to the discharge area. Another aspect of the automatic handler is provided with a groove on the test tray to increase a number of test position for the test tray. The groove includes an end surface which engages with the positioning stoppers.
摘要翻译：公开了一种用于IC测试系统的自动处理器，其能够减少从供应区域到测试头区域以及从测试头区域到放电区域传送要测试的IC设备的时间。自动处理机包括用于加载要测试的IC器件的测试托盘，其中待测试的IC器件在测试托架中彼此相距距离短于测试头区域中的测试接触器之间的距离，一对沿着测试盘的移动方向设置在测试头区域中的定位止动件，其中定位止动件间隔距离等于待测试的IC器件在测试托盘中的距离。在自动处理机中，将接触器的距离调整为测试盘中要测试的IC器件的距离的整数倍。其中一个定位止动器接触测试托盘，以确定测试托盘中第一行中IC器件的第一位置，然后传输测试托盘，直到其他定位止动器在第二个位置接触测试托盘，以便测试 IC器件位于测试托盘的第二行。然后将测试托盘转移到排放区域。自动处理机的另一方面在测试托盘上设置有凹槽以增加测试托盘的测试位置的数量。凹槽包括与定位止动件接合的端面。

5. 发明授权

US06237783B1 Apparatus for storing customer trays 有权
标题翻译：用于存储客户托盘的设备
公开(公告)号：US06237783B1
公开(公告)日：2001-05-29
申请号：US09277529
申请日：1999-03-26
申请人： Makoto Sagawa
发明人： Makoto Sagawa
IPC分类号： A47F4900
CPC分类号： G01R31/01
摘要： A customer tray storing apparatus which is capable of storing customer trays in a stocker by moving them in the horizontal direction as well as removing them from the stocker in the horizontal direction. The customer tray storing apparatus comprises a generally rectangular bottom frame for resting thereon customer trays, guide pins attached to the bottom frame adjacent the opposite ends of one of the minor sides of the frame, a pair of door posts attached to the bottom frame adjacent the opposite ends of the other minor side of the bottom frame, a pair of guide rails attached to the bottom frame along the opposed major sides of the bottom frame, and a door pivotally supported by the pair of door posts at their lower ends. The door comprises a generally square or rectangular door member and a pair of reinforcing beams supporting the door member along the opposite lateral side portions thereof. The reinforcing beams are provided at their lower ends with pivot shafts. The door is pivotally supported by the pivot shafts fitted in corresponding bearings provided in the pair of door posts adjacent their lower ends.
摘要翻译：一种客户托盘存储装置，其能够通过沿着水平方向移动储存器而将客户托盘存储在储存器中，并且在水平方向上将其从储盘器移除。客户托盘存放装置包括大致矩形的底框架，用于搁置顾客托盘，与框架的一个小边相对的端部附接到底部框架的导向销，邻近底板的一对门柱底框架的另一个较小侧的相对端，沿着底框架的相对主侧面附接到底框架的一对导轨，以及在其下端由一对门柱枢转地支撑的门。门包括大致正方形或矩形的门构件和一对沿其相对的侧向部分支撑门构件的加强梁。加强梁在其下端设有枢轴。门被枢转轴枢转地支撑，该枢转轴装配在邻近其下端的一对门柱中提供的相应的轴承中。

6. 发明授权

US5973493A Test tray positioning stopper mechanism for automatic handler 失效
标题翻译：测试盘定位止动机构，用于自动处理
公开(公告)号：US5973493A
公开(公告)日：1999-10-26
申请号：US725377
申请日：1996-10-03
申请人： Hiroto Nakamura , Makoto Sagawa , Yoshihito Kobayashi
发明人： Hiroto Nakamura , Makoto Sagawa , Yoshihito Kobayashi
IPC分类号： G01R31/26 , B23Q7/14 , B23Q16/00 , B65G47/88 , G01R31/02 , G01R31/28
CPC分类号： B23Q7/1447 , B23Q16/001 , G01R31/2851 , G01R31/2893
摘要： A mechanism for positioning IC devices to be tested aligned in a test tray of an automatic handler for an IC test system capable of reducing a time for transferring the test tray from a supply area to a test head area which has a plurality of test contactors and from a test head area to a discharge area is disclosed. The mechanism includes a stopper which determines the first stop position of the test tray when said test tray contacts with the outer surface of the test tray and the second stop position of the test tray when said stopper contacts with the end surface of a groove being provided with on its side portion of the test tray to receive and engage with the projection of the stopper. The distance between the adjacent test contactors is adjusted to be equal to two times or integer multiple of the distance between the adjacent IC devices to be tested aligned in the test tray and the distance between the first position and the second position is adjusted to be equal to the distance between the adjacent IC devices to be tested so that minimizing the index time for transferring the test tray becomes possible.
摘要翻译：一种用于将待测试的IC器件定位在用于IC测试系统的自动处理器的测试盘中的机构，其能够减少用于将测试托盘从供应区域传送到具有多个测试接触器的测试头区域的时间，以及从测试头区域到放电区域被公开。所述机构包括：当所述止动件与所述槽的端面接触时，所述止动件确定所述测试托盘与所述测试托盘的外表面和所述测试托盘的第二停止位置接触时所述测试托盘的第一停止位置其在其测试托盘的侧部接收并接合止动器的突起。将相邻的测试接触器之间的距离调整为等于测试托盘中待测试的相邻IC器件之间距离的两倍或整数倍，并将第一位置与第二位置之间的距离调整为相等到待测试的相邻IC器件之间的距离，使得最小化传送测试托盘的索引时间成为可能。

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